{"id":"https://openalex.org/W2133162007","doi":"https://doi.org/10.1109/test.2012.6401559","title":"Low power programmable PRPG with enhanced fault coverage gradient","display_name":"Low power programmable PRPG with enhanced fault coverage gradient","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2133162007","doi":"https://doi.org/10.1109/test.2012.6401559","mag":"2133162007"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002725206","display_name":"J\u0119drzej Solecki","orcid":null},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"J. Solecki","raw_affiliation_strings":["Pozna\u0144 University of Technology, Pozna\u0144, Poland","Pozna\u0144 University of Technology, 60-965 Poznan, Poland"],"affiliations":[{"raw_affiliation_string":"Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]},{"raw_affiliation_string":"Pozna\u0144 University of Technology, 60-965 Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Tyszer","raw_affiliation_strings":["Pozna\u0144 University of Technology, Pozna\u0144, Poland","Pozna\u0144 University of Technology, 60-965 Poznan, Poland"],"affiliations":[{"raw_affiliation_string":"Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]},{"raw_affiliation_string":"Pozna\u0144 University of Technology, 60-965 Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046691899","display_name":"Grzegorz Mrugalski","orcid":"https://orcid.org/0000-0001-9378-127X"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"G. Mrugalski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075158519","display_name":"Nilanjan Mukherjee","orcid":"https://orcid.org/0000-0001-6689-7525"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"N. Mukherjee","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"J. Rajski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5002725206"],"corresponding_institution_ids":["https://openalex.org/I46597724"],"apc_list":null,"apc_paid":null,"fwci":1.4503,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.82555743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.712087869644165},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.7070772647857666},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.682165265083313},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6801885962486267},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6717515587806702},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6682727336883545},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6401962041854858},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5143636465072632},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.45471808314323425},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4341674745082855},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4177859127521515},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33149242401123047},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3059569001197815},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.288046658039093},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19852083921432495},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12927868962287903},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10433483123779297},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08625984191894531},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.059447795152664185}],"concepts":[{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.712087869644165},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.7070772647857666},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.682165265083313},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6801885962486267},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6717515587806702},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6682727336883545},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6401962041854858},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5143636465072632},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.45471808314323425},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4341674745082855},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4177859127521515},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33149242401123047},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3059569001197815},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.288046658039093},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19852083921432495},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12927868962287903},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10433483123779297},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08625984191894531},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.059447795152664185},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2012.6401559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1612128692","https://openalex.org/W1917155881","https://openalex.org/W1987514371","https://openalex.org/W2024212907","https://openalex.org/W2034294653","https://openalex.org/W2069493778","https://openalex.org/W2074480570","https://openalex.org/W2096667381","https://openalex.org/W2097270518","https://openalex.org/W2100671080","https://openalex.org/W2103810183","https://openalex.org/W2108471909","https://openalex.org/W2109043970","https://openalex.org/W2109761157","https://openalex.org/W2111045021","https://openalex.org/W2111531873","https://openalex.org/W2114980975","https://openalex.org/W2126641963","https://openalex.org/W2127343408","https://openalex.org/W2131943868","https://openalex.org/W2133288230","https://openalex.org/W2133640956","https://openalex.org/W2135615172","https://openalex.org/W2137549092","https://openalex.org/W2139356796","https://openalex.org/W2149690470","https://openalex.org/W2150996498","https://openalex.org/W2157986239","https://openalex.org/W2427394675","https://openalex.org/W2888824071","https://openalex.org/W4246972245","https://openalex.org/W6640251397","https://openalex.org/W6675003167","https://openalex.org/W6676417426","https://openalex.org/W6682450435","https://openalex.org/W6683134281"],"related_works":["https://openalex.org/W1600807921","https://openalex.org/W1540713932","https://openalex.org/W2119351822","https://openalex.org/W4288754393","https://openalex.org/W2392756575","https://openalex.org/W2188176208","https://openalex.org/W2118970729","https://openalex.org/W608533082","https://openalex.org/W2157122227","https://openalex.org/W1867728662"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,30],"low":[4],"power":[5],"programmable":[6],"generator":[7,39,55],"capable":[8],"of":[9,37,71],"producing":[10],"pseudorandom":[11],"test":[12,57,74],"patterns":[13],"with":[14,59],"desired":[15],"toggling":[16],"levels":[17],"and":[18,42,76],"enhanced":[19],"fault":[20],"coverage":[21],"gradient":[22],"compared":[23],"to":[24,32,51],"best-to-date":[25],"BIST-based":[26],"PRPGs.":[27],"We":[28],"introduce":[29],"method":[31],"automatically":[33],"select":[34],"several":[35],"controls":[36],"the":[38,54,72],"allowing":[40],"easy":[41],"precise":[43],"tuning.":[44],"The":[45],"same":[46],"technique":[47],"is":[48],"subsequently":[49],"employed":[50],"deterministically":[52],"guide":[53],"toward":[56],"sequences":[58],"improved":[60],"fault-coverage-to-pattern-count":[61],"ratios.":[62],"Experimental":[63],"results":[64],"obtained":[65],"for":[66],"industrial":[67],"designs":[68],"illustrate":[69],"feasibility":[70],"proposed":[73],"scheme":[75],"are":[77],"reported":[78],"herein.":[79]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}