{"id":"https://openalex.org/W2134236236","doi":"https://doi.org/10.1109/test.2012.6401548","title":"On pinpoint capture power management in at-speed scan test generation","display_name":"On pinpoint capture power management in at-speed scan test generation","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2134236236","doi":"https://doi.org/10.1109/test.2012.6401548","mag":"2134236236"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401548","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://kyutech.repo.nii.ac.jp/records/6388","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"X. Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Fukuoka, Japan","Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047627364","display_name":"Yuya Nishida","orcid":"https://orcid.org/0000-0002-8396-423X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Nishida","raw_affiliation_strings":["Kyushu Institute of Technology, Fukuoka, Japan","Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079877073","display_name":"Kohei Miyase","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Miyase","raw_affiliation_strings":["Kyushu Institute of Technology, Fukuoka, Japan","Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kajihara","raw_affiliation_strings":["Kyushu Institute of Technology, Fukuoka, Japan","Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan,","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["LIRMM, Montpellier, France","LIRMM, 161 rue Ada, 34095 Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, 161 rue Ada, 34095 Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073054890","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0000-0003-4699-3231"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Tehranipoor","raw_affiliation_strings":["University of Connecticut, CT, USA","University of Connecticut, Storrs, CT 06296, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"University of Connecticut, CT, USA","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"University of Connecticut, Storrs, CT 06296, USA#TAB#","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029839617","display_name":"L.-T. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.-T. Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, CA, USA","SynTest Technologies, Inc., Sunnyvale, CA 94086, USA"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA 94086, USA","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5084697545"],"corresponding_institution_ids":["https://openalex.org/I207014233"],"apc_list":null,"apc_paid":null,"fwci":2.3422,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.8878437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6597074866294861},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6346766352653503},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.6223809123039246},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5911909341812134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5780583620071411},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4944303035736084},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4565730392932892},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42862409353256226},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.37329399585723877},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3693557381629944},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3241618871688843},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26110804080963135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17141211032867432},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.10763296484947205},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1005399227142334}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6597074866294861},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6346766352653503},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.6223809123039246},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5911909341812134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5780583620071411},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4944303035736084},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4565730392932892},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42862409353256226},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.37329399585723877},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3693557381629944},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3241618871688843},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26110804080963135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17141211032867432},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.10763296484947205},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1005399227142334},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/test.2012.6401548","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401548","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349209","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6388","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"journal article"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:00006388","is_oa":false,"landing_page_url":"http://hdl.handle.net/10228/00007598","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"AM"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349209","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6388","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"journal article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6899999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1600468096","https://openalex.org/W1900996732","https://openalex.org/W1966348745","https://openalex.org/W2077380902","https://openalex.org/W2088545523","https://openalex.org/W2103252557","https://openalex.org/W2112856691","https://openalex.org/W2117791241","https://openalex.org/W2120117419","https://openalex.org/W2120349980","https://openalex.org/W2125715320","https://openalex.org/W2126872604","https://openalex.org/W2128426877","https://openalex.org/W2135615172","https://openalex.org/W2139234345","https://openalex.org/W2147986372","https://openalex.org/W2152683841","https://openalex.org/W2154471868","https://openalex.org/W2154695555","https://openalex.org/W2156340730","https://openalex.org/W2161338410","https://openalex.org/W2161795503","https://openalex.org/W2464594873","https://openalex.org/W3147331103","https://openalex.org/W3147350862","https://openalex.org/W4232226371","https://openalex.org/W6639759450","https://openalex.org/W6650828817","https://openalex.org/W6678897769","https://openalex.org/W6682699350","https://openalex.org/W6776283966"],"related_works":["https://openalex.org/W2144004661","https://openalex.org/W2001352955","https://openalex.org/W3109020709","https://openalex.org/W1588361197","https://openalex.org/W1968374692","https://openalex.org/W2151556234","https://openalex.org/W2044021627","https://openalex.org/W2074895070","https://openalex.org/W2561083275","https://openalex.org/W1558377319"],"abstract_inverted_index":{"This":[0,150],"paper":[1],"proposes":[2],"a":[3,11,43,91,95],"novel":[4,151],"scheme":[5],"to":[6,48,77,89,107,111,137],"manage":[7],"capture":[8,17,125,155],"power":[9,18,126,156],"in":[10,29],"pinpoint":[12,154],"manner":[13],"for":[14,144],"achieving":[15,123],"guaranteed":[16,124],"safety,":[19],"improved":[20],"small-delay":[21,147],"test":[22,26,32,44,75,104,115,135,148],"capability,":[23],"and":[24,175],"minimal":[25],"cost":[27],"impact":[28],"at-speed":[30],"scan":[31],"generation.":[33],"First,":[34],"switching":[35,55,60,66,79,139],"activity":[36,80,140],"around":[37,81,141],"each":[38],"long":[39],"path":[40,93,177],"sensitized":[41],"by":[42,167],"vector":[45,76,136],"is":[46,71,87,99,131],"checked":[47],"characterize":[49],"it":[50],"as":[51,165],"hot":[52,82,92,120],"(with":[53,58,64],"excessively-high":[54],"activity),":[56,61],"warm":[57,96],"normal/functional":[59],"or":[62],"cold":[63,142],"excessively-low":[65],"activity).":[67],"Then,":[68],"X-restoration/X-filling-based":[69,129],"rescue":[70,86],"conducted":[72,101,132],"on":[73,102,133,170],"the":[74,85,109,113,119,134,162],"reduce":[78],"paths.":[83],"If":[84],"insufficient":[88],"turn":[90],"into":[94],"path,":[97,121],"mask":[98],"then":[100],"expected":[103],"response":[105,116],"data":[106],"instruct":[108],"tester":[110],"ignore":[112],"potentially-false":[114],"value":[117],"from":[118],"thus":[122],"safety.":[127],"Finally,":[128],"warm-up":[130],"increase":[138],"paths":[143],"improving":[145],"their":[146],"capability.":[149],"approach":[152],"of":[153],"management":[157],"has":[158],"significant":[159],"advantages":[160],"over":[161],"conventionalapproachofglobalcapturepower":[163],"management,":[164],"demonstrated":[166],"evaluation":[168],"results":[169],"large":[171],"ITC'99":[172],"benchmark":[173],"circuits":[174],"detailed":[176],"delay":[178],"analysis.":[179]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":12},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}