{"id":"https://openalex.org/W2081567185","doi":"https://doi.org/10.1109/test.2012.6401524","title":"Real-time testing method for 16 Gbps 4-PAM signal interface","display_name":"Real-time testing method for 16 Gbps 4-PAM signal interface","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2081567185","doi":"https://doi.org/10.1109/test.2012.6401524","mag":"2081567185"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401524","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401524","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":"https://orcid.org/0009-0000-7712-4966"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":true,"raw_author_name":"Masahiro Ishida","raw_affiliation_strings":["Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034107129","display_name":"Kiyotaka Ichiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Kiyotaka Ichiyama","raw_affiliation_strings":["Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045598104","display_name":"Daisuke Watanabe","orcid":"https://orcid.org/0000-0001-6817-3993"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Daisuke Watanabe","raw_affiliation_strings":["Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111580405","display_name":"Masayuki Kawabata","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Masayuki Kawabata","raw_affiliation_strings":["Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056204368","display_name":"T. Okayasu","orcid":null},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Toshiyuki Okayasu","raw_affiliation_strings":["Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Ora-gun, Gunma, 370-0718, Japan#TAB#","institution_ids":["https://openalex.org/I177844149"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5109203606"],"corresponding_institution_ids":["https://openalex.org/I177844149","https://openalex.org/I4210103901"],"apc_list":null,"apc_paid":null,"fwci":1.4503,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.81974892,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7714248895645142},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7010369300842285},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6707913279533386},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5301429033279419},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5271025896072388},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.5248834490776062},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4974351227283478},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.48924970626831055},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.4282990097999573},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4192935824394226},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1948513686656952},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18111634254455566},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11199310421943665},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0672667920589447}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7714248895645142},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7010369300842285},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6707913279533386},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5301429033279419},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5271025896072388},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.5248834490776062},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4974351227283478},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.48924970626831055},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.4282990097999573},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4192935824394226},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1948513686656952},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18111634254455566},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11199310421943665},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0672667920589447},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C107038049","wikidata":"https://www.wikidata.org/wiki/Q35986","display_name":"Aesthetics","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2012.6401524","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401524","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2003312501","https://openalex.org/W2099936205","https://openalex.org/W2108301848","https://openalex.org/W2161472729","https://openalex.org/W2544653351"],"related_works":["https://openalex.org/W2055105357","https://openalex.org/W2153819599","https://openalex.org/W2255426644","https://openalex.org/W2072124641","https://openalex.org/W2167093538","https://openalex.org/W2018956713","https://openalex.org/W2081479354","https://openalex.org/W2034349229","https://openalex.org/W2113107605","https://openalex.org/W3204693335"],"abstract_inverted_index":{"This":[0,13,89,104],"paper":[1],"proposes":[2],"a":[3,7,29,42,57,67,85,97,100,133,161,171],"method":[4,14,105,181],"for":[5,96,109],"testing":[6,55,99,131,143],"device":[8,44],"with":[9,45,60,126,160],"multi-level":[10,16,20,23,33,46,50,58,102],"signal":[11,47,59,86,134,148],"interfaces.":[12,48],"utilizes":[15],"drivers":[17,34],"that":[18,25,164],"generate":[19],"signals":[21],"and":[22,121,141],"comparators":[24,51,65],"are":[26,158,182],"based":[27],"on":[28],"new":[30],"concept.":[31],"The":[32,49],"can":[35,138,153],"test":[36,69],"the":[37,61,73,81,113,127,130,145,166,179],"voltage":[38,75,116],"noise":[39],"tolerance":[40],"of":[41,56,64,84,115,132,144,178],"receiver":[43],"realize":[52],"real-time":[53],"functional":[54],"same":[62],"number":[63,114],"as":[66,119,150],"conventional":[68],"system,":[70],"by":[71,151],"changing":[72],"threshold":[74,91],"levels":[76,117],"dynamically":[77],"in":[78,112],"response":[79],"to":[80,170],"expected":[82],"values":[83],"under":[87],"test.":[88],"dynamic":[90],"comparator":[92],"concept":[93,168],"is":[94,106],"suitable":[95],"system":[98],"high-speed":[101],"signal.":[103],"also":[107,183],"scalable":[108],"an":[110],"increase":[111],"such":[118,149],"8-PAM":[120],"16-PAM":[122],"signals.":[123],"In":[124],"addition,":[125],"proposed":[128,167,180],"method,":[129],"having":[135],"emphasis/":[136],"de-emphasis":[137],"be":[139,154],"realized,":[140],"improved":[142],"digital":[146],"modulation":[147],"QAM":[152],"expected.":[155],"Experimental":[156],"results":[157],"discussed":[159],"prototype":[162],"circuit":[163],"demonstrates":[165],"applied":[169],"16":[172],"Gbps":[173],"4-PAM":[174],"Test":[175],"System.":[176],"Applications":[177],"discussed.":[184]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}