{"id":"https://openalex.org/W2045682534","doi":"https://doi.org/10.1109/test.2011.6139190","title":"A systems perspective on the R&D of industrial technology","display_name":"A systems perspective on the R&D of industrial technology","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2045682534","doi":"https://doi.org/10.1109/test.2011.6139190","mag":"2045682534"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139190","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113661239","display_name":"Jyuo-Min Shyu","orcid":null},"institutions":[{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW","US"],"is_corresponding":true,"raw_author_name":"Jyuo-Min Shyu","raw_affiliation_strings":["Industrial Technology and Research Institute, Taiwan","President, Industrial Technology Research Institute (ITRI), Taiwan"],"affiliations":[{"raw_affiliation_string":"Industrial Technology and Research Institute, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"President, Industrial Technology Research Institute (ITRI), Taiwan","institution_ids":["https://openalex.org/I142066694"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5113661239"],"corresponding_institution_ids":["https://openalex.org/I142066694","https://openalex.org/I4210148468"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12848264,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"13","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.6575000286102295,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.6575000286102295,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.6133999824523926,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6816056966781616},{"id":"https://openalex.org/keywords/perspective","display_name":"Perspective (graphical)","score":0.6445028781890869},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6282098293304443},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5460432171821594},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.5279668569564819},{"id":"https://openalex.org/keywords/emerging-technologies","display_name":"Emerging technologies","score":0.5075269937515259},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5058095455169678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4355859160423279},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.40914425253868103},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3751286566257477},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2974093556404114},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.2578223943710327}],"concepts":[{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6816056966781616},{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.6445028781890869},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6282098293304443},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5460432171821594},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.5279668569564819},{"id":"https://openalex.org/C207267971","wikidata":"https://www.wikidata.org/wiki/Q120208","display_name":"Emerging technologies","level":2,"score":0.5075269937515259},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5058095455169678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4355859160423279},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.40914425253868103},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3751286566257477},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2974093556404114},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.2578223943710327},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139190","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2770234245","https://openalex.org/W96612179","https://openalex.org/W4229499248","https://openalex.org/W2566006169","https://openalex.org/W1567818861","https://openalex.org/W2987774938","https://openalex.org/W4256492088","https://openalex.org/W632915154","https://openalex.org/W2089167710"],"abstract_inverted_index":{"Scientific":[0],"discoveries":[1,22],"open":[2],"up":[3],"new":[4,135],"horizons,":[5],"and":[6,82,98,124,141],"technologies":[7,24,136],"based":[8],"on":[9,95],"them":[10],"can":[11],"create":[12],"or":[13,61],"transform":[14],"markets.":[15],"However,":[16],"the":[17,44,65,85,89,99,118,122],"process":[18,66],"of":[19,28,46,59,77,107,134],"translating":[20],"scientific":[21,80],"into":[23],"involves":[25],"a":[26,112],"series":[27],"risk":[29],"steps,":[30],"resulting":[31],"in":[32,71],"low":[33],"success":[34],"rates.":[35],"In":[36,103],"industrial":[37,108],"technology":[38,109],"research":[39,110],"institutes":[40],"such":[41,47,137],"as":[42,138],"ITRI,":[43],"planning":[45],"projects":[48],"typically":[49],"starts":[50],"with":[51,74,117,121],"conceptualizing":[52],"innovative":[53],"applications":[54],"that":[55],"meet":[56],"certain":[57],"needs":[58],"consumers":[60],"society.":[62],"Once":[63],"initiated,":[64],"is":[67,88],"forced":[68],"to":[69,131],"be":[70],"constant":[72],"touch":[73],"both":[75],"ends":[76],"its":[78],"range:":[79],"discovery":[81],"market":[83],"needs;":[84],"utmost":[86],"consideration":[87],"large":[90],"impact":[91],"it":[92],"will":[93],"have":[94],"industries,":[96],"economy":[97],"society":[100],"at":[101],"large.":[102],"this":[104],"talk,":[105],"examples":[106],"from":[111],"semiconductor":[113],"application":[114],"perspective,":[115],"along":[116],"collaboration":[119],"model":[120],"industry":[123],"academia,":[125],"are":[126,143],"presented.":[127],"Crucial":[128],"factors":[129],"leading":[130],"successful":[132],"deployment":[133],"cost,":[139],"quality,":[140],"reliability":[142],"also":[144],"addressed.":[145]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}