{"id":"https://openalex.org/W2074014702","doi":"https://doi.org/10.1109/test.2011.6139178","title":"Adaptive multidimensional outlier analysis for analog and mixed signal circuits","display_name":"Adaptive multidimensional outlier analysis for analog and mixed signal circuits","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2074014702","doi":"https://doi.org/10.1109/test.2011.6139178","mag":"2074014702"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139178","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108524932","display_name":"Ender Y\u0131lmaz","orcid":"https://orcid.org/0009-0004-0254-5845"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ender Yilmaz","raw_affiliation_strings":["Arizona State University, USA","Arizona State University"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Arizona State University, USA","Arizona State University"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Arizona State University","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110130179","display_name":"Kenneth M. Butler","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth M. Butler","raw_affiliation_strings":["Texas Instrumenits, Inc., USA","Texas Instruments"],"affiliations":[{"raw_affiliation_string":"Texas Instrumenits, Inc., USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108524932"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":1.3248,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.82576589,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.8128654360771179},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7736219763755798},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.7015633583068848},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6645913124084473},{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.5861416459083557},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5713843107223511},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5489299297332764},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.4707758128643036},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4621608257293701},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46187543869018555},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4139106273651123},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.41174501180648804},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.28878647089004517},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2308269739151001},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12569695711135864},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.102304607629776},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08885297179222107}],"concepts":[{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.8128654360771179},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7736219763755798},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.7015633583068848},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6645913124084473},{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.5861416459083557},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5713843107223511},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5489299297332764},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.4707758128643036},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4621608257293701},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46187543869018555},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4139106273651123},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.41174501180648804},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28878647089004517},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2308269739151001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12569695711135864},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.102304607629776},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08885297179222107},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139178","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139178","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2047468602","https://openalex.org/W2059659103","https://openalex.org/W2064029323","https://openalex.org/W2086465016","https://openalex.org/W2099992850","https://openalex.org/W2104486691","https://openalex.org/W2110784166","https://openalex.org/W2116996377","https://openalex.org/W2119919209","https://openalex.org/W2129905273","https://openalex.org/W2131610230","https://openalex.org/W2136007135","https://openalex.org/W2137926373","https://openalex.org/W2139497890","https://openalex.org/W2147018104","https://openalex.org/W2147198689","https://openalex.org/W2147770921","https://openalex.org/W2147930497","https://openalex.org/W2154605514","https://openalex.org/W2158695520","https://openalex.org/W2162433349","https://openalex.org/W2168792500","https://openalex.org/W2585209422","https://openalex.org/W4233014035","https://openalex.org/W4247409213","https://openalex.org/W6733396966"],"related_works":["https://openalex.org/W17155033","https://openalex.org/W3207760230","https://openalex.org/W1496222301","https://openalex.org/W4312814274","https://openalex.org/W2499612753","https://openalex.org/W3111802945","https://openalex.org/W2946096271","https://openalex.org/W2295423552","https://openalex.org/W1598471830","https://openalex.org/W3107369729"],"abstract_inverted_index":{"Outlier":[0],"devices":[1,9],"behave":[2],"differently":[3],"from":[4],"the":[5,8,69,87,100,141],"majority":[6],"of":[7,71],"and":[10,30,75,138],"are":[11],"considered":[12],"to":[13,82,92,96,99,114],"be":[14,107],"potentially":[15],"defective.":[16],"Identifying":[17],"outliers":[18,40],"has":[19],"many":[20],"applications":[21],"in":[22],"test,":[23,29],"including":[24],"defect":[25],"filters":[26],"for":[27,34],"alternate":[28],"setting":[31],"pass/fail":[32],"limits":[33],"automotive":[35],"domain.":[36],"In":[37,56,126],"previous":[38],"work,":[39,58],"have":[41],"been":[42],"identified":[43],"using":[44],"single":[45],"dimensional":[46],"and/or":[47],"static":[48],"methods":[49],"which":[50],"does":[51],"not":[52],"exploit":[53],"information":[54,70,79],"efficiently.":[55],"this":[57,127],"we":[59,129],"propose":[60],"an":[61,110,134],"adaptive":[62,135],"multidimensional":[63],"outlier":[64],"analysis":[65],"method":[66,89,105,142],"that":[67,140],"combines":[68],"multiple":[72],"measurement":[73],"parameters":[74,81],"judiciously":[76],"selects":[77],"only":[78],"rich":[80],"maximize":[83],"detection":[84],"probability.":[85],"Furthermore,":[86],"proposed":[88,104],"continously":[90],"updates":[91],"track":[93],"process":[94],"shift":[95],"enable":[97],"adaptation":[98],"evolving":[101],"processes.":[102],"The":[103],"can":[106],"integrated":[108],"within":[109],"existing":[111],"test":[112,116,123,136,145],"framework":[113,137],"improve":[115],"quality":[117],"with":[118,133],"little":[119],"or":[120],"no":[121],"additional":[122],"time":[124],"cost.":[125],"context,":[128],"integrate":[130],"our":[131],"technique":[132],"show":[139],"enables":[143],"improved":[144],"quality.":[146]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}