{"id":"https://openalex.org/W2104746340","doi":"https://doi.org/10.1109/test.2011.6139162","title":"A novel scan segmentation design method for avoiding shift timing failure in scan testing","display_name":"A novel scan segmentation design method for avoiding shift timing failure in scan testing","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2104746340","doi":"https://doi.org/10.1109/test.2011.6139162","mag":"2104746340"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://naist.repo.nii.ac.jp/records/4908","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113798957","display_name":"Yuta Yamato","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097531","display_name":"Kitakyushu Foundation for the Advancement of Industry, Science and Technology","ror":"https://ror.org/00wse9j86","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210097531"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Yamato","raw_affiliation_strings":["Fukuoka Industry Science Technology Foundation, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fukuoka Industry Science Technology Foundation, Fukuoka, Japan","institution_ids":["https://openalex.org/I4210097531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058173647","display_name":"Michael A. Kochte","orcid":"https://orcid.org/0000-0002-1228-3402"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["DE","JP"],"is_corresponding":false,"raw_author_name":"Michael A. Kochte","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan","University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079877073","display_name":"Kohei Miyase","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohei Miyase","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seiji Kajihara","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109249989","display_name":"Laung\u2010Terng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laung-Terng Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5458,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.84186303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.7450063228607178},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6713466644287109},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6492596864700317},{"id":"https://openalex.org/keywords/timing-failure","display_name":"Timing failure","score":0.6108776926994324},{"id":"https://openalex.org/keywords/clock-skew","display_name":"Clock skew","score":0.6105124354362488},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.6016970872879028},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6009743809700012},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.46136894822120667},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.44899600744247437},{"id":"https://openalex.org/keywords/clock-gating","display_name":"Clock gating","score":0.4296044111251831},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.40455615520477295},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29526644945144653},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2700579762458801},{"id":"https://openalex.org/keywords/clock-signal","display_name":"Clock signal","score":0.224321186542511},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21046710014343262},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1338023841381073},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.08523312211036682}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.7450063228607178},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6713466644287109},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6492596864700317},{"id":"https://openalex.org/C104654189","wikidata":"https://www.wikidata.org/wiki/Q7806740","display_name":"Timing failure","level":5,"score":0.6108776926994324},{"id":"https://openalex.org/C60501442","wikidata":"https://www.wikidata.org/wiki/Q4382014","display_name":"Clock skew","level":4,"score":0.6105124354362488},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.6016970872879028},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6009743809700012},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.46136894822120667},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.44899600744247437},{"id":"https://openalex.org/C22716491","wikidata":"https://www.wikidata.org/wiki/Q590170","display_name":"Clock gating","level":5,"score":0.4296044111251831},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40455615520477295},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29526644945144653},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2700579762458801},{"id":"https://openalex.org/C137059387","wikidata":"https://www.wikidata.org/wiki/Q426882","display_name":"Clock signal","level":3,"score":0.224321186542511},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21046710014343262},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1338023841381073},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.08523312211036682},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/test.2011.6139162","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139162","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01146:0005783359","is_oa":true,"landing_page_url":"https://naist.repo.nii.ac.jp/records/4908","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349205","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6384","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"journal article"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:00006384","is_oa":false,"landing_page_url":"http://hdl.handle.net/10228/00007594","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"AM"},{"id":"pmh:oai:library.naist.jp:10061/11177","is_oa":true,"landing_page_url":"http://hdl.handle.net/10061/11177","pdf_url":null,"source":{"id":"https://openalex.org/S4377196843","display_name":"NAIST Digital Library (Nara Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I75917431","host_organization_name":"Nara Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I75917431"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01146:0005783359","is_oa":true,"landing_page_url":"https://naist.repo.nii.ac.jp/records/4908","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"},"sustainable_development_goals":[{"score":0.8600000143051147,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G4600680082","display_name":null,"funder_award_id":"22300017","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320320875","display_name":"Deutscher Akademischer Austauschdienst","ror":"https://ror.org/039djdh30"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1487528602","https://openalex.org/W1491971472","https://openalex.org/W1528223898","https://openalex.org/W1568407911","https://openalex.org/W1581327216","https://openalex.org/W1835662651","https://openalex.org/W1849928240","https://openalex.org/W1900996732","https://openalex.org/W1966348745","https://openalex.org/W2080510479","https://openalex.org/W2088545523","https://openalex.org/W2103252557","https://openalex.org/W2112856691","https://openalex.org/W2115700624","https://openalex.org/W2119691242","https://openalex.org/W2126641963","https://openalex.org/W2130785299","https://openalex.org/W2137807823","https://openalex.org/W2139234345","https://openalex.org/W2139356796","https://openalex.org/W2145554447","https://openalex.org/W2146893269","https://openalex.org/W2149681958","https://openalex.org/W2149690470","https://openalex.org/W2158196014","https://openalex.org/W2164936233","https://openalex.org/W2166163625","https://openalex.org/W2464594873","https://openalex.org/W2888824071","https://openalex.org/W3149373195","https://openalex.org/W3210820645","https://openalex.org/W6638713964","https://openalex.org/W6639759450","https://openalex.org/W6641769569","https://openalex.org/W6677328418","https://openalex.org/W6682052381"],"related_works":["https://openalex.org/W2088914741","https://openalex.org/W4247180033","https://openalex.org/W2559451387","https://openalex.org/W2040807843","https://openalex.org/W1999924508","https://openalex.org/W2556166322","https://openalex.org/W4249038728","https://openalex.org/W2174922170","https://openalex.org/W2116259070","https://openalex.org/W1490763633"],"abstract_inverted_index":{"High":[0],"power":[1,113],"consumption":[2],"in":[3,39,101],"scan":[4,77,89,118],"testing":[5],"can":[6],"cause":[7],"undue":[8],"yield":[9],"loss":[10],"which":[11,31],"has":[12],"increasingly":[13],"become":[14],"a":[15,71],"serious":[16],"problem":[17,26],"for":[18,93],"deep-submicron":[19],"VLSI":[20],"circuits.":[21],"Growing":[22],"evidence":[23],"attributes":[24],"this":[25,67],"to":[27,47,53,65],"shift":[28],"timing":[29],"failures,":[30],"are":[32],"primarily":[33],"caused":[34],"by":[35],"excessive":[36],"switching":[37,99],"activity":[38,100],"the":[40,60,98,102,111,129,132],"proximities":[41,103],"of":[42,62,88,104,131],"clock":[43,50,105],"paths":[44],"that":[45,97],"tends":[46],"introduce":[48],"severe":[49],"skew":[51],"due":[52],"IR-drop-induced":[54],"delay":[55],"increase.":[56],"This":[57],"paper":[58],"is":[59,91,107],"first":[61],"its":[63],"kind":[64],"address":[66],"critical":[68],"issue":[69],"with":[70],"novel":[72],"layout-aware":[73],"scheme":[74],"based":[75],"on":[76,116,122],"segmentation":[78],"design,":[79],"called":[80],"LCTI-SS":[81,133],"(Low-Clock-Tree-Impact":[82],"Scan":[83],"Segmentation).":[84],"An":[85],"optimal":[86],"combination":[87],"segments":[90],"identified":[92],"simultaneous":[94],"clocking":[95],"so":[96],"trees":[106],"reduced":[108],"while":[109],"maintaining":[110],"average":[112],"reduction":[114],"effect":[115],"conventional":[117],"segmentation.":[119],"Experimental":[120],"results":[121],"benchmark":[123],"and":[124],"industrial":[125],"circuits":[126],"have":[127],"demonstrated":[128],"advantage":[130],"scheme.":[134]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}