{"id":"https://openalex.org/W3148412157","doi":"https://doi.org/10.1109/test.2011.6139160","title":"Real-time testing method for 16 Gbps 4-PAM signal interface","display_name":"Real-time testing method for 16 Gbps 4-PAM signal interface","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W3148412157","doi":"https://doi.org/10.1109/test.2011.6139160","mag":"3148412157"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139160","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":"https://orcid.org/0009-0000-7712-4966"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masahiro Ishida","raw_affiliation_strings":["Advantest Corporation, Ora-gun, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Ora-gun, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034107129","display_name":"Kiyotaka Ichiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiyotaka Ichiyama","raw_affiliation_strings":["Advantest Corporation, Ora-gun, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Ora-gun, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045598104","display_name":"Daisuke Watanabe","orcid":"https://orcid.org/0000-0001-6817-3993"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Watanabe","raw_affiliation_strings":["Advantest Corporation, Ora-gun, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Ora-gun, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111580405","display_name":"Masayuki Kawabata","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masayuki Kawabata","raw_affiliation_strings":["Advantest Corporation, Ora-gun, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Ora-gun, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056204368","display_name":"T. Okayasu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Okayasu","raw_affiliation_strings":["Advantest Corporation, Ora-gun, Gunma, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Ora-gun, Gunma, Japan","institution_ids":["https://openalex.org/I4210103901"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5109203606"],"corresponding_institution_ids":["https://openalex.org/I4210103901"],"apc_list":null,"apc_paid":null,"fwci":1.0075,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.79870192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1 0","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7909666299819946},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6812721490859985},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6795116662979126},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5417443513870239},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.536927342414856},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.5266126394271851},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5007874965667725},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4664824306964874},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4385733902454376},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.43370670080184937},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2079380452632904},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19657695293426514},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11725890636444092}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7909666299819946},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6812721490859985},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6795116662979126},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5417443513870239},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.536927342414856},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.5266126394271851},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5007874965667725},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4664824306964874},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4385733902454376},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.43370670080184937},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2079380452632904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19657695293426514},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11725890636444092},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C107038049","wikidata":"https://www.wikidata.org/wiki/Q35986","display_name":"Aesthetics","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139160","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139160","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2099936205","https://openalex.org/W2108301848","https://openalex.org/W2161472729","https://openalex.org/W2544653351"],"related_works":["https://openalex.org/W2055105357","https://openalex.org/W2153819599","https://openalex.org/W2255426644","https://openalex.org/W2072124641","https://openalex.org/W2167093538","https://openalex.org/W2018956713","https://openalex.org/W2081479354","https://openalex.org/W2034349229","https://openalex.org/W2113107605","https://openalex.org/W3204693335"],"abstract_inverted_index":{"This":[0,13,89,104],"paper":[1],"proposes":[2],"a":[3,7,29,42,57,67,85,97,100,134,162,172],"method":[4,14,105,182],"for":[5,96,109],"testing":[6,55,99,132,144],"device":[8,44],"with":[9,45,60,127,161],"multi-level":[10,16,20,23,33,46,50,58,102],"signal":[11,47,59,86,135,149],"interfaces.":[12,48],"utilizes":[15],"drivers":[17,34],"that":[18,25,165],"generate":[19],"signals":[21],"and":[22,121,142],"comparators":[24,51,65],"are":[26,159,183],"based":[27],"on":[28],"new":[30],"concept.":[31],"The":[32,49],"can":[35,139,154],"test":[36,69],"the":[37,61,73,81,113,128,131,146,167,180],"voltage":[38,75,116],"noise":[39],"tolerance":[40],"of":[41,56,64,84,115,133,145,179],"receiver":[43],"realize":[52],"real-time":[53],"functional":[54],"same":[62],"number":[63,114],"as":[66,119,151],"conventional":[68],"system,":[70],"by":[71,152],"changing":[72],"threshold":[74,91],"levels":[76,117],"dynamically":[77],"in":[78,112],"response":[79],"to":[80,171],"expected":[82],"values":[83],"under":[87],"test.":[88],"dynamic":[90],"comparator":[92],"concept":[93,169],"is":[94,106],"suitable":[95],"system":[98],"high-speed":[101],"signal.":[103],"also":[107,184],"scalable":[108],"an":[110],"increase":[111],"such":[118,150],"8-PAM":[120],"16-PA":[122],"M":[123],"signals.":[124],"In":[125],"addition,":[126],"proposed":[129,168,181],"method,":[130],"having":[136],"emphasis/":[137],"de-emphasis":[138],"be":[140,155],"realized,":[141],"improved":[143],"digital":[147],"modulation":[148],"QAM":[153],"expected.":[156],"Experimental":[157],"results":[158],"discussed":[160],"prototype":[163],"circuit":[164],"demonstrates":[166],"applied":[170],"16":[173],"Gbps":[174],"4-PAM":[175],"Test":[176],"System.":[177],"Applications":[178],"discussed.":[185]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}