{"id":"https://openalex.org/W2027859410","doi":"https://doi.org/10.1109/test.2011.6139158","title":"Analyzing ATE interconnect performance for serial links of 10 Gbps and above","display_name":"Analyzing ATE interconnect performance for serial links of 10 Gbps and above","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2027859410","doi":"https://doi.org/10.1109/test.2011.6139158","mag":"2027859410"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139158","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139158","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111692539","display_name":"Mitchell Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I1296127346","display_name":"Broadcom (Israel)","ror":"https://ror.org/01jsrac29","country_code":"IL","type":"company","lineage":["https://openalex.org/I1296127346","https://openalex.org/I4210127325"]},{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["IL","US"],"is_corresponding":true,"raw_author_name":"Mitchell Lin","raw_affiliation_strings":["Broadcom Corporation Irvine, CA","Broadcom, Corp. (Irvine, CA)"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation Irvine, CA","institution_ids":["https://openalex.org/I4210127325"]},{"raw_affiliation_string":"Broadcom, Corp. (Irvine, CA)","institution_ids":["https://openalex.org/I1296127346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071725699","display_name":"Tyler Tolman","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]},{"id":"https://openalex.org/I1296127346","display_name":"Broadcom (Israel)","ror":"https://ror.org/01jsrac29","country_code":"IL","type":"company","lineage":["https://openalex.org/I1296127346","https://openalex.org/I4210127325"]}],"countries":["IL","US"],"is_corresponding":false,"raw_author_name":"Tyler Tolman","raw_affiliation_strings":["Broadcom Corporation Irvine, CA","Broadcom, Corp. (Irvine, CA)"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation Irvine, CA","institution_ids":["https://openalex.org/I4210127325"]},{"raw_affiliation_string":"Broadcom, Corp. (Irvine, CA)","institution_ids":["https://openalex.org/I1296127346"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111692539"],"corresponding_institution_ids":["https://openalex.org/I1296127346","https://openalex.org/I4210127325"],"apc_list":null,"apc_paid":null,"fwci":0.2691,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60201145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8288956880569458},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.8256018161773682},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6812299489974976},{"id":"https://openalex.org/keywords/serial-communication","display_name":"Serial communication","score":0.6765508055686951},{"id":"https://openalex.org/keywords/serdes","display_name":"SerDes","score":0.5550362467765808},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5454720258712769},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.527258038520813},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.5166561603546143},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5105201005935669},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5087376236915588},{"id":"https://openalex.org/keywords/serial-port","display_name":"Serial port","score":0.48260700702667236},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.43405431509017944},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.42697247862815857},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3398965001106262},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2594553232192993},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08775120973587036}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8288956880569458},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.8256018161773682},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6812299489974976},{"id":"https://openalex.org/C51707140","wikidata":"https://www.wikidata.org/wiki/Q518280","display_name":"Serial communication","level":2,"score":0.6765508055686951},{"id":"https://openalex.org/C19707634","wikidata":"https://www.wikidata.org/wiki/Q6510662","display_name":"SerDes","level":2,"score":0.5550362467765808},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5454720258712769},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.527258038520813},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.5166561603546143},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5105201005935669},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5087376236915588},{"id":"https://openalex.org/C102349902","wikidata":"https://www.wikidata.org/wiki/Q385390","display_name":"Serial port","level":3,"score":0.48260700702667236},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.43405431509017944},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.42697247862815857},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3398965001106262},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2594553232192993},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08775120973587036},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139158","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139158","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2044055781","https://openalex.org/W2089606495","https://openalex.org/W2125723800","https://openalex.org/W2132713456","https://openalex.org/W2155068431","https://openalex.org/W2172017172","https://openalex.org/W4285719527","https://openalex.org/W6679508768"],"related_works":["https://openalex.org/W2391465108","https://openalex.org/W2365780630","https://openalex.org/W2354040300","https://openalex.org/W2369521450","https://openalex.org/W2288145321","https://openalex.org/W2071855843","https://openalex.org/W2767749057","https://openalex.org/W2349653672","https://openalex.org/W2348306694","https://openalex.org/W2392908833"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3],"method":[4,112],"for":[5,18,95],"analyzing":[6],"the":[7,28,45,55,78,89,92,135,138],"performance":[8,90],"of":[9,49,54,80,91,137],"Automatic":[10],"Test":[11],"Equipment":[12],"(ATE)":[13],"Device":[14],"Interface":[15],"Boards":[16],"(DIB)":[17],"High-Speed":[19],"Serial":[20,99],"Link":[21,100],"interface.":[22],"The":[23,47,110],"procedure":[24],"requires":[25],"using":[26],"only":[27,133],"device":[29],"under":[30],"test":[31],"(DUT)":[32],"to":[33,43,104,125],"generate":[34],"known":[35],"PRBS":[36],"TX":[37],"data":[38,116],"and":[39,51,69,102],"an":[40],"ATE":[41],"digitizer":[42],"capture":[44],"waveform.":[46,65],"information":[48],"impulse":[50],"frequency":[52],"response":[53],"signal":[56,107],"path":[57],"can":[58,72,87,113,122],"then":[59],"be":[60,74,123],"obtained":[61],"by":[62,134],"processing":[63],"this":[64,85],"In":[66],"addition,":[67],"data-dependent":[68],"periodic":[70],"jitter":[71],"also":[73],"calculated.":[75],"Therefore,":[76],"without":[77],"use":[79],"other":[81],"sophisticated":[82],"hardware":[83],"setup,":[84],"approach":[86],"validate":[88],"fixtures":[93],"required":[94],"testing":[96],"10":[97,129],"Gbps":[98],"interfaces":[101],"help":[103],"identify":[105],"any":[106,118],"integrity":[108],"issues.":[109],"proposed":[111],"process":[114],"waveform":[115],"from":[117],"instrument":[119,139],"and,":[120],"therefore,":[121],"exploited":[124],"analyze":[126],"signals":[127],"above":[128],"Gbps,":[130],"being":[131],"limited":[132],"bandwidth":[136],"itself.":[140]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}