{"id":"https://openalex.org/W2042840195","doi":"https://doi.org/10.1109/test.2011.6139146","title":"Partial state monitoring for fault detection estimation","display_name":"Partial state monitoring for fault detection estimation","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2042840195","doi":"https://doi.org/10.1109/test.2011.6139146","mag":"2042840195"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102987027","display_name":"Yiwen Shi","orcid":"https://orcid.org/0000-0003-4152-1470"},"institutions":[{"id":"https://openalex.org/I27804330","display_name":"Brown University","ror":"https://ror.org/05gq02987","country_code":"US","type":"education","lineage":["https://openalex.org/I27804330"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yiwen Shi","raw_affiliation_strings":["Brown University, Providence, RI, USA","Brown University , Providence, Rhode Island, USA"],"affiliations":[{"raw_affiliation_string":"Brown University, Providence, RI, USA","institution_ids":["https://openalex.org/I27804330"]},{"raw_affiliation_string":"Brown University , Providence, Rhode Island, USA","institution_ids":["https://openalex.org/I27804330"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016518623","display_name":"Kantapon Kaewtip","orcid":null},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kantapon Kaewtip","raw_affiliation_strings":["University of California, Los Angeles, CA, USA","University of California-Los Angeles, California, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I161318765"]},{"raw_affiliation_string":"University of California-Los Angeles, California, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057707008","display_name":"Wan-Chan Hu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wan-Chan Hu","raw_affiliation_strings":["MStar Semiconductor, Inc., Taiwan","MStar Semiconductor, Inc. Taiwan"],"affiliations":[{"raw_affiliation_string":"MStar Semiconductor, Inc., Taiwan","institution_ids":[]},{"raw_affiliation_string":"MStar Semiconductor, Inc. Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044465911","display_name":"Jennifer Dworak","orcid":null},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jennifer Dworak","raw_affiliation_strings":["Southern Methodist University, Dallas, TX, USA","Southern Methodist University, Dallas, Texas, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Southern Methodist University, Dallas, TX, USA","institution_ids":["https://openalex.org/I178169726"]},{"raw_affiliation_string":"Southern Methodist University, Dallas, Texas, USA#TAB#","institution_ids":["https://openalex.org/I178169726"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102987027"],"corresponding_institution_ids":["https://openalex.org/I27804330"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.10146034,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"15","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7816903591156006},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6770516633987427},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.6142080426216125},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5508164167404175},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5475131869316101},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.519506573677063},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.510749101638794},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5094028115272522},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.5005226135253906},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4909513294696808},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.45326918363571167},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.45144885778427124},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41008061170578003},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40331941843032837},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.38673269748687744},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.2782568037509918},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2418331801891327},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2166638970375061},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1348235011100769},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12052538990974426},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09267580509185791}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7816903591156006},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6770516633987427},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.6142080426216125},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5508164167404175},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5475131869316101},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.519506573677063},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.510749101638794},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5094028115272522},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.5005226135253906},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4909513294696808},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.45326918363571167},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.45144885778427124},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41008061170578003},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40331941843032837},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.38673269748687744},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.2782568037509918},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2418331801891327},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2166638970375061},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1348235011100769},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12052538990974426},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09267580509185791},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139146","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139146","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1873925915","https://openalex.org/W1920645136","https://openalex.org/W1998316224","https://openalex.org/W2006642784","https://openalex.org/W2032732648","https://openalex.org/W2040907677","https://openalex.org/W2080434551","https://openalex.org/W2088391469","https://openalex.org/W2091507826","https://openalex.org/W2097482433","https://openalex.org/W2101340408","https://openalex.org/W2105201058","https://openalex.org/W2122146819","https://openalex.org/W2127795505","https://openalex.org/W2133505378","https://openalex.org/W2144404543","https://openalex.org/W2153450600","https://openalex.org/W2161285332","https://openalex.org/W2161824088","https://openalex.org/W2162656497","https://openalex.org/W2164529645","https://openalex.org/W2166367975","https://openalex.org/W2166862343","https://openalex.org/W2169659953","https://openalex.org/W2171908682","https://openalex.org/W3147230633","https://openalex.org/W4255276665"],"related_works":["https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2138861322","https://openalex.org/W188714996","https://openalex.org/W2168671684","https://openalex.org/W2121043529","https://openalex.org/W2083209667","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":{"Obtaining":[0],"fault":[1,56],"coverage":[2,73],"information":[3,74],"for":[4,47,75,101,126],"functional":[5,64,76],"input":[6,27],"sequences":[7,78],"is":[8,106],"often":[9],"very":[10],"difficult.":[11],"Although":[12],"many":[13,53],"simulation-based":[14],"techniques":[15],"have":[16,60,83],"been":[17,61,85],"proposed,":[18],"they":[19],"are":[20],"generally":[21],"computationally":[22],"expensive,":[23],"and":[24],"if":[25],"the":[26,48,96,102,113,118],"sequence":[28],"changes,":[29],"new":[30,42,122],"expensive":[31],"simulations":[32],"must":[33],"be":[34,92],"run.":[35],"In":[36,69],"this":[37,115],"paper,":[38],"we":[39],"propose":[40],"a":[41,55,104],"type":[43],"of":[44,51,99],"hardware":[45],"monitor":[46],"probabilistic":[49],"determination":[50],"how":[52],"times":[54],"was":[57],"likely":[58],"to":[59,71,94,120],"covered":[62],"during":[63],"test":[65,77],"or":[66],"program":[67],"execution.":[68],"addition":[70],"providing":[72],"-":[79,87],"even":[80],"those":[81],"that":[82],"never":[84],"simulated":[86],"these":[88],"monitors":[89],"can":[90],"also":[91],"used":[93],"determine":[95],"relative":[97],"criticality":[98],"faults":[100],"applications":[103],"user":[105],"running":[107],"in":[108,112],"real":[109],"time.":[110],"Thus,":[111],"future,":[114],"method":[116],"has":[117],"potential":[119],"provide":[121],"dynamic":[123],"optimization":[124],"capabilities":[125],"on-chip":[127],"field":[128],"testing.":[129]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}