{"id":"https://openalex.org/W2108140528","doi":"https://doi.org/10.1109/test.2011.6139135","title":"Actual implementation of multi domain test: Further reduction of cost of test","display_name":"Actual implementation of multi domain test: Further reduction of cost of test","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2108140528","doi":"https://doi.org/10.1109/test.2011.6139135","mag":"2108140528"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139135","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043735152","display_name":"Yasuhiro Takahashi","orcid":"https://orcid.org/0000-0002-1653-8425"},"institutions":[{"id":"https://openalex.org/I4210098225","display_name":"Accretech (Japan)","ror":"https://ror.org/011p1an89","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210098225"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasuhiro Takahashi","raw_affiliation_strings":["Verigy Japan K. K., Hachioji, Tokyo, Japan","S&S Professional Service, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan"],"affiliations":[{"raw_affiliation_string":"Verigy Japan K. K., Hachioji, Tokyo, Japan","institution_ids":["https://openalex.org/I4210098225"]},{"raw_affiliation_string":"S&S Professional Service, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109226600","display_name":"A. Maeda","orcid":null},"institutions":[{"id":"https://openalex.org/I4210098225","display_name":"Accretech (Japan)","ror":"https://ror.org/011p1an89","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210098225"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akinori Maeda","raw_affiliation_strings":["Verigy Japan K. K., Hachioji, Tokyo, Japan","Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan"],"affiliations":[{"raw_affiliation_string":"Verigy Japan K. K., Hachioji, Tokyo, Japan","institution_ids":["https://openalex.org/I4210098225"]},{"raw_affiliation_string":"Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090370306","display_name":"Mitsuhiro Ogura","orcid":null},"institutions":[{"id":"https://openalex.org/I4210098225","display_name":"Accretech (Japan)","ror":"https://ror.org/011p1an89","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210098225"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Mitsuhiro Ogura","raw_affiliation_strings":["Verigy Japan K. K., Hachioji, Tokyo, Japan","Manager of Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan"],"affiliations":[{"raw_affiliation_string":"Verigy Japan K. K., Hachioji, Tokyo, Japan","institution_ids":["https://openalex.org/I4210098225"]},{"raw_affiliation_string":"Manager of Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043735152"],"corresponding_institution_ids":["https://openalex.org/I4210098225"],"apc_list":null,"apc_paid":null,"fwci":0.2519,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57335115,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6989580988883972},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6873722076416016},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6274869441986084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5999794006347656},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5367340445518494},{"id":"https://openalex.org/keywords/system-under-test","display_name":"System under test","score":0.5118595957756042},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4894208014011383},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.47453033924102783},{"id":"https://openalex.org/keywords/test-site","display_name":"Test site","score":0.47249355912208557},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.44098758697509766},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.4199475944042206},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.41553032398223877},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3703990578651428},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.3563825488090515},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33353567123413086},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2226095199584961},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1271771788597107},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09725838899612427},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.07421571016311646},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06431970000267029}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6989580988883972},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6873722076416016},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6274869441986084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5999794006347656},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5367340445518494},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.5118595957756042},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4894208014011383},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.47453033924102783},{"id":"https://openalex.org/C2983696493","wikidata":"https://www.wikidata.org/wiki/Q7705730","display_name":"Test site","level":2,"score":0.47249355912208557},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.44098758697509766},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.4199475944042206},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.41553032398223877},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3703990578651428},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.3563825488090515},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33353567123413086},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2226095199584961},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1271771788597107},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09725838899612427},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.07421571016311646},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06431970000267029},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C16674752","wikidata":"https://www.wikidata.org/wiki/Q1370637","display_name":"Mining engineering","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139135","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139135","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1516422828","https://openalex.org/W1884658820","https://openalex.org/W2055037451","https://openalex.org/W2122868642","https://openalex.org/W2138645566"],"related_works":["https://openalex.org/W1968006356","https://openalex.org/W3017054977","https://openalex.org/W2375380335","https://openalex.org/W1554975824","https://openalex.org/W3006257721","https://openalex.org/W10867750","https://openalex.org/W2941802027","https://openalex.org/W2080046630","https://openalex.org/W1989136995","https://openalex.org/W2351823887"],"abstract_inverted_index":{"Multi-Sites":[0],"Test":[1,43,73,82,91,104,111,118,133,143],"is":[2,55,105],"the":[3,8,12,15,23,33,49,60,64,69,84,100,127,131,138,141,151],"popular":[4],"way":[5],"to":[6,47,57,121],"reduce":[7,48],"cost-of-test":[9],"(COT)":[10],"at":[11,74],"wafer":[13],"and":[14,32,77,87,92],"final":[16],"test.":[17],"Limitations":[18],"exist,":[19],"however,":[20],"such":[21],"as":[22],"low":[24],"Multi-Site":[25,90,110,128],"Efficiency":[26,129],"of":[27,63,71,89,102,109,130,140,150],"analog":[28],"mixed":[29,123],"signal":[30,124],"tests":[31],"high":[34],"system":[35],"price":[36],"for":[37,112],"large":[38],"pin":[39],"count":[40],"devices.":[41,115],"Concurrent":[42,93],"has":[44],"been":[45],"implemented":[46],"test":[50,53],"time.":[51],"This":[52,116],"strategy":[54],"difficult":[56],"implement":[58],"without":[59],"DFT":[61],"design":[62],"device.":[65],"The":[66,95],"authors":[67,96],"introduced":[68],"concept":[70],"Multi-Domain":[72,81,103,117],"VTS":[75],"2011":[76],"explained":[78],"that":[79,99,108,149],"this":[80],"solves":[83],"aforementioned":[85],"problems":[86],"limitations":[88],"Test.":[94,153],"also":[97],"showed":[98],"COT":[101,139],"lower":[106,147],"than":[107,136,148],"high-end":[113],"SOC":[114],"was":[119,134,144],"applied":[120],"a":[122],"SOC.":[125],"Although":[126],"Dual-Site":[132,152],"more":[135],"97%,":[137],"Dual-Domain":[142],"approximately":[145],"10%":[146]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}