{"id":"https://openalex.org/W2071813173","doi":"https://doi.org/10.1109/test.2011.6139134","title":"Development of an ATE test cell for at-speed characterization and production testing","display_name":"Development of an ATE test cell for at-speed characterization and production testing","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2071813173","doi":"https://doi.org/10.1109/test.2011.6139134","mag":"2071813173"},"language":"en","primary_location":{"id":"doi:10.1109/test.2011.6139134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005298960","display_name":"Jose Moreira","orcid":"https://orcid.org/0000-0003-2574-0665"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jose Moreira","raw_affiliation_strings":["Verigy, Inc., USA","Verigy"],"affiliations":[{"raw_affiliation_string":"Verigy, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Verigy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5005298960"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2519,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.55874773,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9628000259399414,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.7356095314025879},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.7135891318321228},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.6552948951721191},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6221473217010498},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.6169524788856506},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5552550554275513},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4984447956085205},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4739573001861572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4698295295238495},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39194631576538086},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3463878035545349},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14196261763572693},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.12974247336387634},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10019883513450623},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.08864161372184753}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.7356095314025879},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.7135891318321228},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.6552948951721191},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6221473217010498},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.6169524788856506},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5552550554275513},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4984447956085205},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4739573001861572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4698295295238495},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39194631576538086},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3463878035545349},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14196261763572693},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.12974247336387634},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10019883513450623},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.08864161372184753},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2011.6139134","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2011.6139134","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W282702537","https://openalex.org/W1658809881","https://openalex.org/W2109530122","https://openalex.org/W2153680965","https://openalex.org/W2340344720","https://openalex.org/W6610358964","https://openalex.org/W6637141901","https://openalex.org/W6704029279"],"related_works":["https://openalex.org/W2886943583","https://openalex.org/W1993178475","https://openalex.org/W1999617696","https://openalex.org/W1484726954","https://openalex.org/W2119346672","https://openalex.org/W2058431428","https://openalex.org/W4402811721","https://openalex.org/W1635126885","https://openalex.org/W2062747959","https://openalex.org/W4387693526"],"abstract_inverted_index":{"This":[0,59],"paper":[1],"describes":[2],"the":[3,38,47,57,62,65,79],"development":[4],"of":[5,16,23,56],"a":[6,17,29],"test":[7],"cell":[8],"intended":[9],"for":[10,64,77],"thorough":[11,54],"characterization":[12,35,55],"and":[13],"production":[14,40],"testing":[15,36],"complex":[18],"multigigabit":[19],"IC.":[20,58],"The":[21],"objective":[22],"this":[24],"project":[25],"was":[26],"to":[27,32,37,70],"provide":[28],"straightforward":[30],"way":[31],"transition":[33],"from":[34],"early":[39],"ramp":[41],"with":[42],"minimal":[43],"effort":[44],"while":[45],"at":[46],"same":[48],"time":[49],"not":[50],"restricting":[51],"or":[52],"limiting":[53],"included":[60],"providing":[61],"flexibility":[63],"Test":[66],"Engineer":[67],"being":[68],"able":[69],"use":[71],"any":[72],"external":[73],"measurement":[74],"instrument":[75],"required":[76],"characterizing":[78],"DUT.":[80]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}