{"id":"https://openalex.org/W2147930497","doi":"https://doi.org/10.1109/test.2010.5699271","title":"Adaptive test flow for mixed-signal/RF circuits using learned information from device under test","display_name":"Adaptive test flow for mixed-signal/RF circuits using learned information from device under test","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2147930497","doi":"https://doi.org/10.1109/test.2010.5699271","mag":"2147930497"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108524932","display_name":"Ender Y\u0131lmaz","orcid":"https://orcid.org/0009-0004-0254-5845"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ender Yilmaz","raw_affiliation_strings":["Arizona State University, USA"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Arizona State University, USA"],"affiliations":[{"raw_affiliation_string":"Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110130179","display_name":"Kenneth M. Butler","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth M. Butler","raw_affiliation_strings":["Texas Instrumenits, Inc., India"],"affiliations":[{"raw_affiliation_string":"Texas Instrumenits, Inc., India","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5108524932"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":2.7466,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.91182423,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.6865133047103882},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6738730072975159},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6582212448120117},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6174477338790894},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5813794136047363},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5505738258361816},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5061022639274597},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.48461779952049255},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4442857503890991},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.4424522817134857},{"id":"https://openalex.org/keywords/dropout","display_name":"Dropout (neural networks)","score":0.43277353048324585},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.36222225427627563},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.27681422233581543},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18723079562187195},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14588844776153564},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14082443714141846},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13756966590881348},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13438716530799866}],"concepts":[{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.6865133047103882},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6738730072975159},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6582212448120117},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6174477338790894},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5813794136047363},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5505738258361816},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5061022639274597},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48461779952049255},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4442857503890991},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.4424522817134857},{"id":"https://openalex.org/C2776145597","wikidata":"https://www.wikidata.org/wiki/Q25339462","display_name":"Dropout (neural networks)","level":2,"score":0.43277353048324585},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.36222225427627563},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.27681422233581543},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18723079562187195},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14588844776153564},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14082443714141846},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13756966590881348},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13438716530799866},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.46000000834465027,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1723333647","https://openalex.org/W2024465941","https://openalex.org/W2035764712","https://openalex.org/W2104486691","https://openalex.org/W2104972179","https://openalex.org/W2129905273","https://openalex.org/W2131610230","https://openalex.org/W2136007135","https://openalex.org/W2139497890","https://openalex.org/W2147916294","https://openalex.org/W2156227942","https://openalex.org/W2161332022","https://openalex.org/W2162433349","https://openalex.org/W2171440868","https://openalex.org/W2752885492","https://openalex.org/W2946046356","https://openalex.org/W4233014035"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W4234763172","https://openalex.org/W1588361197","https://openalex.org/W2992024382","https://openalex.org/W2125317684","https://openalex.org/W1950483953"],"abstract_inverted_index":{"Despite":[0],"their":[1],"small":[2],"size,":[3],"analog/mixed-signal":[4],"circuits":[5,128],"start":[6],"with":[7,110,162],"an":[8,49,122,193],"extensive":[9],"set":[10,103,135],"of":[11,21,41,56,77,156,205,239],"parameters":[12],"to":[13,61,71,89,112,146,169,185,202],"test":[14,102,124,134,141,175,224,230,233],"for.":[15],"During":[16],"production":[17,203,219],"ramp":[18],"up,":[19],"most":[20],"these":[22,180],"tests":[23],"are":[24,160],"dropped":[25],"using":[26],"statistical":[27,54,115],"analysis":[28],"techniques":[29,201],"based":[30],"on":[31,192,217],"the":[32,39,53,57,92,101,133,154,157,211,215,226],"dropout":[33],"patterns.":[34],"While":[35],"effective":[36],"in":[37,48,91,153,196,237],"reducing":[38],"number":[40,76],"tests,":[42],"this":[43,99,118],"approach":[44],"treats":[45],"each":[46,105],"device":[47,96,106],"identical":[50],"manner.":[51],"As":[52],"diversity":[55],"devices":[58,148,150,173,181],"increases":[59],"due":[60],"increasing":[62],"process":[63,93,158],"variations,":[64],"such":[65],"homogeneous":[66],"testing":[67],"approaches":[68],"may":[69],"prove":[70],"be":[72,108,144],"inefficient.":[73],"After":[74],"a":[75],"initial":[78],"measurements,":[79],"device-specific":[80],"information":[81],"is":[82],"available,":[83],"which":[84],"can":[85,107,143],"provide":[86],"clues":[87],"as":[88,235],"where":[90],"space":[94,159],"that":[95,129,139,151,222],"falls.":[97],"Using":[98],"information,":[100],"for":[104,126],"tailored":[109],"respect":[111],"its":[113],"own":[114],"information.":[116,188],"In":[117],"paper,":[119],"we":[120],"present":[121],"adaptive":[123,223],"flow":[125],"mixed-signal":[127],"aims":[130],"at":[131],"optimizing":[132],"per-device":[136],"basis":[137],"so":[138],"more":[140,177],"resources":[142],"devoted":[145],"marginal":[147],"whereas":[149],"fall":[152],"middle":[155],"passed":[161],"less":[163],"testing.":[164],"We":[165,189],"also":[166],"include":[167],"provisions":[168],"identify":[170],"potentially":[171],"defective":[172,240],"and":[174,198,214,232],"them":[176],"extensively":[178],"since":[179],"do":[182],"not":[183],"conform":[184],"learned":[186],"collective":[187],"conduct":[190],"experiments":[191],"LNA":[194],"circuit":[195],"simulations":[197],"apply":[199],"our":[200],"data":[204,220],"two":[206],"distinct":[207],"industrial":[208],"circuits.":[209],"Both":[210],"simulation":[212],"results":[213,216],"large-scale":[218],"show":[221],"provides":[225],"best":[227],"trade-off":[228],"between":[229],"time":[231],"quality":[234],"measured":[236],"terms":[238],"parts":[241],"per":[242],"million.":[243]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}