{"id":"https://openalex.org/W2155671576","doi":"https://doi.org/10.1109/test.2010.5699268","title":"Leveraging existing power control circuits and power delivery architecture for variability measurement","display_name":"Leveraging existing power control circuits and power delivery architecture for variability measurement","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2155671576","doi":"https://doi.org/10.1109/test.2010.5699268","mag":"2155671576"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039962291","display_name":"Dhruva Acharyya","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dhruva Acharyya","raw_affiliation_strings":["Verigy Limited, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Verigy Limited, Singapore","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113938530","display_name":"Kanak Agarwal","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kanak Agarwal","raw_affiliation_strings":["IBM, Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, Corporation, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029774084","display_name":"Jim Plusquellic","orcid":"https://orcid.org/0000-0002-1876-117X"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jim Plusquellic","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Mexico, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Mexico, USA","institution_ids":["https://openalex.org/I169521973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2943,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66513353,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"18","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5834186673164368},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5774511694908142},{"id":"https://openalex.org/keywords/sleep-mode","display_name":"Sleep mode","score":0.5491750240325928},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5304915904998779},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5102934837341309},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.4522377848625183},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4421968162059784},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43177396059036255},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.41586410999298096},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3827570378780365},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37546271085739136},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3745851516723633},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.35265690088272095},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2891911268234253},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24861416220664978},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.14111927151679993},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1332838237285614},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1142713725566864}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5834186673164368},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5774511694908142},{"id":"https://openalex.org/C57149124","wikidata":"https://www.wikidata.org/wiki/Q587346","display_name":"Sleep mode","level":4,"score":0.5491750240325928},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5304915904998779},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5102934837341309},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.4522377848625183},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4421968162059784},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43177396059036255},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.41586410999298096},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3827570378780365},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37546271085739136},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3745851516723633},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.35265690088272095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2891911268234253},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24861416220664978},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.14111927151679993},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1332838237285614},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1142713725566864},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1964955499","https://openalex.org/W1971532861","https://openalex.org/W2006001247","https://openalex.org/W2024716222","https://openalex.org/W2031804358","https://openalex.org/W2038818352","https://openalex.org/W2059551381","https://openalex.org/W2076329047","https://openalex.org/W2101289126","https://openalex.org/W2112285517","https://openalex.org/W2117648153","https://openalex.org/W2123513671","https://openalex.org/W2129267471","https://openalex.org/W2142290027","https://openalex.org/W2151280516","https://openalex.org/W2155636448","https://openalex.org/W2156694894","https://openalex.org/W2217674281","https://openalex.org/W4252110273","https://openalex.org/W4285719527","https://openalex.org/W6679301951"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2149263014","https://openalex.org/W3208532083","https://openalex.org/W2149429476","https://openalex.org/W1484786756","https://openalex.org/W1505213511","https://openalex.org/W2103886509","https://openalex.org/W2057225056","https://openalex.org/W2077209089"],"abstract_inverted_index":{"Embedded":[0],"test":[1,158,175],"structures":[2],"are":[3],"increasingly":[4],"being":[5],"used":[6],"to":[7,18,53,67,75,104,117,144],"measure":[8,70],"and":[9,12,38,69,136,183],"analyze":[10],"performance":[11],"power":[13,47,56,111],"variations":[14,171],"in":[15,161],"product":[16],"chips":[17,159],"better":[19],"understand":[20],"the":[21,55,76,89,94,133,141,152,193],"impact":[22],"of":[23,58,83,100,157],"process":[24],"variations.":[25],"In":[26,102],"this":[27],"work,":[28],"we":[29,107],"propose":[30,108],"a":[31,97,109,155,173,180],"minimally-invasive,":[32],"low-overhead":[33],"technique":[34,44,116,125],"for":[35,130],"characterizing":[36],"within-die":[37],"die-to-die":[39],"leakage":[40,72,78,86,90,120,169],"variation.":[41],"The":[42,80,165],"proposed":[43],"leverages":[45],"existing":[46],"control":[48],"circuitry":[49],"added":[50],"by":[51],"designers":[52],"reduce":[54],"consumption":[57],"inactive":[59],"functional":[60],"units.":[61],"We":[62,150],"manipulate":[63],"these":[64],"`sleep":[65],"islands'":[66],"isolate":[68],"their":[71],"current":[73,91,121,170],"contribution":[74],"chip-wide":[77],"current.":[79],"measured":[81],"set":[82,156],"sleep":[84,134,194],"island":[85,135,195],"currents":[87],"reflect":[88],"variation":[92],"across":[93,172],"chip":[95],"at":[96],"coarse":[98],"level":[99],"resolution.":[101],"order":[103],"improve":[105],"resolution,":[106],"multiple":[110],"supply":[112],"port":[113],"(MSP)":[114],"measurement":[115],"provide":[118],"`within-island'":[119],"measurements.":[122],"A":[123],"calibration":[124],"is":[126],"described":[127],"that":[128,168,187],"corrects":[129],"differences":[131],"between":[132],"MSP":[137,197],"approaches,":[138],"effectively":[139],"enabling":[140],"same":[142],"information":[143],"be":[145,189],"obtained":[146],"using":[147,192],"either":[148],"technique.":[149],"demonstrate":[151],"techniques":[153],"on":[154],"fabricated":[160],"65-nm":[162],"SOI":[163],"technology.":[164],"results":[166],"show":[167],"small":[174],"structure":[176],"array":[177],"have":[178],"both":[179],"locally":[181],"random":[182],"globally":[184],"deterministic":[185],"component":[186],"can":[188],"accurately":[190],"mapped":[191],"or":[196],"approaches.":[198]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}