{"id":"https://openalex.org/W2142212721","doi":"https://doi.org/10.1109/test.2010.5699263","title":"Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs","display_name":"Practical active compensation techniques for ATE power supply response for testing of mixed signal data storage SOCs","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2142212721","doi":"https://doi.org/10.1109/test.2010.5699263","mag":"2142212721"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699263","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699263","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030893135","display_name":"Suri Basharapandiyan","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Suri Basharapandiyan","raw_affiliation_strings":["LSI, Inc., Allentown, PA, USA","LSI, Inc, 1110 American Parkway NE, Allentown, Pennsylvania 18109, USA"],"affiliations":[{"raw_affiliation_string":"LSI, Inc., Allentown, PA, USA","institution_ids":[]},{"raw_affiliation_string":"LSI, Inc, 1110 American Parkway NE, Allentown, Pennsylvania 18109, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070704493","display_name":"Yi Cai","orcid":"https://orcid.org/0000-0002-0853-2779"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yi Cai","raw_affiliation_strings":["LSI, Inc., Allentown, PA, USA","LSI, Inc, 1110 American Parkway NE, Allentown, Pennsylvania 18109, USA"],"affiliations":[{"raw_affiliation_string":"LSI, Inc., Allentown, PA, USA","institution_ids":[]},{"raw_affiliation_string":"LSI, Inc, 1110 American Parkway NE, Allentown, Pennsylvania 18109, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5030893135"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2886,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65638463,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.6999777555465698},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6411031484603882},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6005535125732422},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.5849080681800842},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5363619923591614},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5198855400085449},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.49433398246765137},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.44635331630706787},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4187714457511902},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35200315713882446},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32459282875061035},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.106484055519104},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08346182107925415}],"concepts":[{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.6999777555465698},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6411031484603882},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6005535125732422},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.5849080681800842},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5363619923591614},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5198855400085449},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.49433398246765137},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.44635331630706787},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4187714457511902},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35200315713882446},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32459282875061035},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.106484055519104},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08346182107925415},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699263","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699263","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1505628012","https://openalex.org/W1976944456","https://openalex.org/W1999775506","https://openalex.org/W2020600727","https://openalex.org/W2108472236","https://openalex.org/W2158760099","https://openalex.org/W6683418103"],"related_works":["https://openalex.org/W4313561376","https://openalex.org/W3103825105","https://openalex.org/W3027880158","https://openalex.org/W1617565119","https://openalex.org/W160381218","https://openalex.org/W2512958550","https://openalex.org/W2004102934","https://openalex.org/W4366455350","https://openalex.org/W2329266651","https://openalex.org/W4321844193"],"abstract_inverted_index":{"We":[0],"will":[1],"demonstrate":[2],"the":[3,32,62],"effectiveness":[4],"of":[5,81],"power":[6,33,83],"supply":[7],"active":[8,51],"compensation":[9,52],"techniques":[10],"in":[11,36],"mixed":[12],"signal":[13],"device":[14,77],"performance":[15],"testing.":[16],"Read":[17],"channel":[18],"speed":[19],"sorting":[20],"for":[21],"data":[22],"storage":[23],"SOCs":[24],"is":[25],"used":[26],"to":[27,64,68],"illustrate":[28],"how":[29],"we":[30,71],"minimize":[31],"transient":[34],"effect":[35],"ATE":[37],"test,":[38],"where":[39],"read-channel":[40],"current":[41],"draw":[42],"varies":[43],"drastically":[44],"between":[45],"different":[46],"mission-modes":[47],"and":[48],"power-saving-modes.":[49],"These":[50],"ideas":[53],"are":[54,72],"critical":[55],"when":[56],"decoupling":[57],"improvement":[58],"alone":[59],"cannot":[60],"reduce":[61],"transients":[63],"acceptable":[65],"levels.":[66],"Compared":[67],"other":[69],"publications,":[70],"focusing":[73],"on":[74],"minimizing":[75],"large":[76],"functionality-induced":[78],"transients;":[79],"instead":[80],"peak":[82],"consumption":[84],"with":[85],"ATPG":[86],"generated":[87],"tests.":[88]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}