{"id":"https://openalex.org/W2105098032","doi":"https://doi.org/10.1109/test.2010.5699260","title":"Surviving state disruptions caused by test: The “Lobotomy Problem”","display_name":"Surviving state disruptions caused by test: The “Lobotomy Problem”","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2105098032","doi":"https://doi.org/10.1109/test.2010.5699260","mag":"2105098032"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074637494","display_name":"Kenneth P. Parker","orcid":null},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kenneth P. Parker","raw_affiliation_strings":["Agilent Technologies, Inc., Loveland, CO, USA","Agilent Technologies, Loveland, Colorado, USA"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Inc., Loveland, CO, USA","institution_ids":["https://openalex.org/I138285227"]},{"raw_affiliation_string":"Agilent Technologies, Loveland, Colorado, USA","institution_ids":["https://openalex.org/I138285227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5074637494"],"corresponding_institution_ids":["https://openalex.org/I138285227"],"apc_list":null,"apc_paid":null,"fwci":0.2497,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.5819601,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/initialization","display_name":"Initialization","score":0.8545097708702087},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5849647521972656},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5382418632507324},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5178842544555664},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.3550454080104828},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32425904273986816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32256370782852173},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12533974647521973}],"concepts":[{"id":"https://openalex.org/C114466953","wikidata":"https://www.wikidata.org/wiki/Q6034165","display_name":"Initialization","level":2,"score":0.8545097708702087},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5849647521972656},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5382418632507324},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5178842544555664},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.3550454080104828},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32425904273986816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32256370782852173},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12533974647521973},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1502837022","https://openalex.org/W2028504835","https://openalex.org/W4231486519","https://openalex.org/W4231732519","https://openalex.org/W4248451031"],"related_works":["https://openalex.org/W3204184292","https://openalex.org/W3176564347","https://openalex.org/W1985458517","https://openalex.org/W2355833770","https://openalex.org/W3031039437","https://openalex.org/W183202219","https://openalex.org/W3095877357","https://openalex.org/W2072565696","https://openalex.org/W2050451745","https://openalex.org/W2378903222"],"abstract_inverted_index":{"The":[0],"practice":[1],"of":[2,31,51,72],"initializing":[3],"a":[4,52,67],"board":[5,53],"or":[6,54],"system":[7],"for":[8,60],"testing":[9,61],"purposes":[10],"is":[11],"not":[12],"an":[13],"exact":[14],"science,":[15],"but":[16],"rather,":[17],"pursued":[18],"empirically":[19],"and":[20,34,48,62],"with":[21],"little":[22],"help":[23],"from":[24],"IC":[25],"designers.":[26],"This":[27],"paper":[28],"examines":[29],"some":[30],"the":[32],"issues":[33],"trends":[35],"that":[36,43],"justify":[37],"adding":[38],"features":[39],"to":[40,56,63],"IEEE":[41],"1149.1":[42],"will":[44],"facilitate":[45],"safe,":[46],"fast":[47],"effective":[49],"initialization":[50],"system,":[55],"get":[57],"it":[58,65],"ready":[59],"leave":[64],"in":[66],"safe":[68],"state":[69],"upon":[70],"completion":[71],"testing.":[73]},"counts_by_year":[{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}