{"id":"https://openalex.org/W2109886555","doi":"https://doi.org/10.1109/test.2010.5699255","title":"Concurrent test planning","display_name":"Concurrent test planning","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2109886555","doi":"https://doi.org/10.1109/test.2010.5699255","mag":"2109886555"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085223324","display_name":"Bethany Van Wagenen","orcid":null},"institutions":[{"id":"https://openalex.org/I22113271","display_name":"Teradyne (United States)","ror":"https://ror.org/02b00gr50","country_code":"US","type":"company","lineage":["https://openalex.org/I22113271"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Bethany Van Wagenen","raw_affiliation_strings":["Teradyne, Inc., North Reading, MA, USA","Teradyne Inc, North Reading, MA. USA"],"affiliations":[{"raw_affiliation_string":"Teradyne, Inc., North Reading, MA, USA","institution_ids":["https://openalex.org/I22113271"]},{"raw_affiliation_string":"Teradyne Inc, North Reading, MA. USA","institution_ids":["https://openalex.org/I22113271"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034071994","display_name":"Edward Seng","orcid":null},"institutions":[{"id":"https://openalex.org/I22113271","display_name":"Teradyne (United States)","ror":"https://ror.org/02b00gr50","country_code":"US","type":"company","lineage":["https://openalex.org/I22113271"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward Seng","raw_affiliation_strings":["Teradyne, Inc., North Reading, MA, USA","Teradyne Inc, North Reading, MA. USA"],"affiliations":[{"raw_affiliation_string":"Teradyne, Inc., North Reading, MA, USA","institution_ids":["https://openalex.org/I22113271"]},{"raw_affiliation_string":"Teradyne Inc, North Reading, MA. USA","institution_ids":["https://openalex.org/I22113271"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5085223324"],"corresponding_institution_ids":["https://openalex.org/I22113271"],"apc_list":null,"apc_paid":null,"fwci":0.2497,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58417654,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.7526121139526367},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7091163396835327},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6693608164787292},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.562586784362793},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5441390872001648},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3899552822113037},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33625805377960205},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.20714157819747925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1408432126045227},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10071590542793274}],"concepts":[{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.7526121139526367},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7091163396835327},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6693608164787292},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.562586784362793},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5441390872001648},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3899552822113037},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33625805377960205},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.20714157819747925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1408432126045227},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10071590542793274},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1884658820","https://openalex.org/W1895504894","https://openalex.org/W2116365156","https://openalex.org/W2514723766","https://openalex.org/W4285719527","https://openalex.org/W6725767521"],"related_works":["https://openalex.org/W2045854775","https://openalex.org/W2134355894","https://openalex.org/W2135461415","https://openalex.org/W1971679472","https://openalex.org/W3012135400","https://openalex.org/W2356632721","https://openalex.org/W4205526386","https://openalex.org/W2795457403","https://openalex.org/W4252376856","https://openalex.org/W2503350312"],"abstract_inverted_index":{"Testing":[0],"multiple":[1],"device":[2],"functions":[3],"in":[4],"parallel":[5],"can":[6],"yield":[7],"significant":[8],"test":[9,14,32],"time":[10],"and":[11,22,29],"cost":[12],"of":[13],"reductions.":[15],"This":[16],"paper":[17],"discusses":[18],"the":[19],"planning":[20],"process":[21],"algorithms":[23],"required":[24],"to":[25],"realize":[26],"an":[27],"efficient":[28],"achievable":[30],"concurrent":[31],"plan.":[33]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}