{"id":"https://openalex.org/W2141844817","doi":"https://doi.org/10.1109/test.2010.5699240","title":"Hard to find, easy to find systematics; just find them","display_name":"Hard to find, easy to find systematics; just find them","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W2141844817","doi":"https://doi.org/10.1109/test.2010.5699240","mag":"2141844817"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699240","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027296030","display_name":"Rao Desineni","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Rao Desineni","raw_affiliation_strings":["300mm Diagnostics Characterization, IBM Systems and Technology Group, Hopewell Junction, NY, USA","300mm Diagnostics Characterization, IBM Systems & Technology Group, Hopewell Junction, NY, USA"],"affiliations":[{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems and Technology Group, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems & Technology Group, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065662691","display_name":"L. Pastel","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leah Pastel","raw_affiliation_strings":["300mm Diagnostics Characterization, IBM Systems and Technology Group, Essex Junction, VT, USA","300mm Diagnostics Characterization, IBM Systems & Technology Group, Essex Junction, VT., USA"],"affiliations":[{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems and Technology Group, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems & Technology Group, Essex Junction, VT., USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017353144","display_name":"Maroun Kassab","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maroun Kassab","raw_affiliation_strings":["300mm Diagnostics Characterization, IBM Systems and Technology Group, Essex Junction, VT, USA","300mm Diagnostics Characterization, IBM Systems & Technology Group, Essex Junction, VT., USA"],"affiliations":[{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems and Technology Group, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"300mm Diagnostics Characterization, IBM Systems & Technology Group, Essex Junction, VT., USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041207707","display_name":"Robert Redburn","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert Redburn","raw_affiliation_strings":["Product Engineering, IBM Systems and Technology Group, Essex Junction, VT, USA","Product Engineering, IBM Systems & Technology Group, Essex Junction, VT., USA"],"affiliations":[{"raw_affiliation_string":"Product Engineering, IBM Systems and Technology Group, Essex Junction, VT, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"Product Engineering, IBM Systems & Technology Group, Essex Junction, VT., USA","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5027296030"],"corresponding_institution_ids":["https://openalex.org/I1341412227"],"apc_list":null,"apc_paid":null,"fwci":3.2483,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.91913925,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.8288079500198364},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.6939738392829895},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.6158739924430847},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5783607363700867},{"id":"https://openalex.org/keywords/profitability-index","display_name":"Profitability index","score":0.5680980682373047},{"id":"https://openalex.org/keywords/yield-management","display_name":"Yield management","score":0.47622281312942505},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.46485602855682373},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.44279414415359497},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.42626726627349854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24604031443595886},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21166113018989563},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.07846793532371521}],"concepts":[{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.8288079500198364},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6939738392829895},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.6158739924430847},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5783607363700867},{"id":"https://openalex.org/C129361004","wikidata":"https://www.wikidata.org/wiki/Q2470236","display_name":"Profitability index","level":2,"score":0.5680980682373047},{"id":"https://openalex.org/C142038384","wikidata":"https://www.wikidata.org/wiki/Q1362536","display_name":"Yield management","level":4,"score":0.47622281312942505},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.46485602855682373},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.44279414415359497},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.42626726627349854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24604031443595886},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21166113018989563},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.07846793532371521},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2781386248","wikidata":"https://www.wikidata.org/wiki/Q11898700","display_name":"Revenue management","level":3,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C195487862","wikidata":"https://www.wikidata.org/wiki/Q850210","display_name":"Revenue","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699240","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699240","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1564266201","https://openalex.org/W1598922540","https://openalex.org/W1986941465","https://openalex.org/W1996239342","https://openalex.org/W2028168567","https://openalex.org/W2098374349","https://openalex.org/W2099792073","https://openalex.org/W2105387942","https://openalex.org/W2107609659","https://openalex.org/W2109210220","https://openalex.org/W2127120190","https://openalex.org/W2129555080","https://openalex.org/W2133909864","https://openalex.org/W2139277736","https://openalex.org/W2151442211","https://openalex.org/W2152489029","https://openalex.org/W2154452124","https://openalex.org/W2156294156","https://openalex.org/W2187663304","https://openalex.org/W4285719527","https://openalex.org/W6675235911","https://openalex.org/W6682063797","https://openalex.org/W6682357834","https://openalex.org/W6686653437"],"related_works":["https://openalex.org/W2314932804","https://openalex.org/W3126131865","https://openalex.org/W4253186488","https://openalex.org/W2044344400","https://openalex.org/W3125099825","https://openalex.org/W1996938127","https://openalex.org/W2083611981","https://openalex.org/W2072507639","https://openalex.org/W25115902","https://openalex.org/W2337755673"],"abstract_inverted_index":{"In":[0,76],"a":[1,52],"manufacturing":[2,19],"organization,":[3],"every":[4],"morning":[5],"starts":[6],"with":[7,115,132],"the":[8,12,28,35,126,133,148],"question:":[9],"what":[10],"is":[11,25,49,65],"yield":[13,24,36,43,63,85,141],"today?":[14],"The":[15],"cost":[16],"of":[17,27,83,104,129,147],"wafer":[18],"being":[20],"fairly":[21],"constant,":[22],"product":[23,47,106],"one":[26],"most":[29],"significant":[30],"variables":[31],"for":[32],"profitability.":[33],"With":[34],"paretos":[37],"increasingly":[38],"dominated":[39],"by":[40],"systematic":[41],"defects,":[42],"learning":[44,64,73,86,142],"based":[45],"on":[46],"test":[48,99],"fast":[50],"becoming":[51],"fundamental":[53],"requirement.":[54],"For":[55],"an":[56,139],"integrated":[57],"device":[58],"manufacturer":[59],"like":[60],"IBM,":[61],"product-based":[62],"even":[66],"more":[67],"critical":[68],"as":[69,74],"this":[70,77],"drives":[71],"technology":[72],"well.":[75],"paper,":[78],"we":[79],"will":[80,124],"present":[81],"some":[82],"IBM's":[84],"techniques":[87,96,135],"and":[88,118,136],"several":[89],"case":[90],"studies":[91],"from":[92,98],"high-volume":[93],"manufacturing.":[94],"These":[95],"extend":[97],"data":[100],"analysis,":[101],"to":[102,109],"analysis":[103,112],"scan-based":[105],"diagnosis":[107,117],"results,":[108],"detailed":[110],"layout":[111],"in":[113],"conjunction":[114],"test,":[116],"inline":[119],"defect":[120],"inspection":[121],"data.":[122],"We":[123],"discuss":[125],"increasing":[127],"levels":[128],"complexity":[130],"associated":[131],"various":[134],"argue":[137],"that":[138],"effective":[140],"strategy":[143],"must":[144],"comprise":[145],"all":[146],"above.":[149]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}