{"id":"https://openalex.org/W1977977548","doi":"https://doi.org/10.1109/test.2010.5699203","title":"The scan-DFT features of AMD's next-generation microprocessor core","display_name":"The scan-DFT features of AMD's next-generation microprocessor core","publication_year":2010,"publication_date":"2010-11-01","ids":{"openalex":"https://openalex.org/W1977977548","doi":"https://doi.org/10.1109/test.2010.5699203","mag":"1977977548"},"language":"en","primary_location":{"id":"doi:10.1109/test.2010.5699203","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699203","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043179142","display_name":"Mahmut Yilmaz","orcid":"https://orcid.org/0000-0002-4522-7028"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Mahmut Yilmaz","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100612196","display_name":"Baosheng Wang","orcid":"https://orcid.org/0000-0002-2272-9623"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Baosheng Wang","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056997219","display_name":"Jayalakshmi Rajaraman","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Jayalakshmi Rajaraman","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111892130","display_name":"Tom Olsen","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Tom Olsen","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041392101","display_name":"Kanwaldeep Sobti","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Kanwaldeep Sobti","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046043166","display_name":"Dwight Elvey","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Dwight Elvey","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065640632","display_name":"Jeff Fitzgerald","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Jeff Fitzgerald","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036948650","display_name":"Grady Giles","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Grady Giles","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100373305","display_name":"Wei-Yu Chen","orcid":"https://orcid.org/0000-0003-2958-8437"},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Wei-Yu Chen","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA","Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Advanced Micro Devices, Inc., 1 AMD Place, Sunnyvale, California, USA","institution_ids":["https://openalex.org/I1311921367"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2651,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80223048,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.8880085945129395},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6117627620697021},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.5655260682106018},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.527804970741272},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.46944305300712585},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.4649658799171448},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.44338151812553406},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41273680329322815},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40489068627357483},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3934592306613922},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.36905035376548767},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.29030412435531616},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13156044483184814},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11916768550872803},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.0934363305568695}],"concepts":[{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.8880085945129395},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6117627620697021},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.5655260682106018},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.527804970741272},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.46944305300712585},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.4649658799171448},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.44338151812553406},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41273680329322815},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40489068627357483},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3934592306613922},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.36905035376548767},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29030412435531616},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13156044483184814},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11916768550872803},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0934363305568695},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2010.5699203","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2010.5699203","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W197391467","https://openalex.org/W1527137186","https://openalex.org/W1903669731","https://openalex.org/W1964173463","https://openalex.org/W1991398325","https://openalex.org/W2019017236","https://openalex.org/W2070731989","https://openalex.org/W2095189874","https://openalex.org/W2095754347","https://openalex.org/W2101900253","https://openalex.org/W2103452085","https://openalex.org/W2108521064","https://openalex.org/W2114578223","https://openalex.org/W2119039525","https://openalex.org/W2119826888","https://openalex.org/W2120349980","https://openalex.org/W2126872604","https://openalex.org/W2131924443","https://openalex.org/W2133040214","https://openalex.org/W2133465946","https://openalex.org/W2138160035","https://openalex.org/W2142168082","https://openalex.org/W2143716962","https://openalex.org/W2146893269","https://openalex.org/W2151628041","https://openalex.org/W2160132089","https://openalex.org/W2161156282","https://openalex.org/W2162139917","https://openalex.org/W2167541841","https://openalex.org/W2170506040","https://openalex.org/W3145262500","https://openalex.org/W3147331103","https://openalex.org/W4234610376","https://openalex.org/W6607990715","https://openalex.org/W6677411990","https://openalex.org/W6678897769","https://openalex.org/W6680098104","https://openalex.org/W6684847144"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W2098026815","https://openalex.org/W2390545901","https://openalex.org/W2622826586","https://openalex.org/W2351709090","https://openalex.org/W2167472940","https://openalex.org/W2735012529","https://openalex.org/W1970479385","https://openalex.org/W3023876411","https://openalex.org/W123152114"],"abstract_inverted_index":{"There":[0],"is":[1],"an":[2],"ever-increasing":[3],"demand":[4,15],"for":[5,65],"higher":[6],"performance":[7],"microprocessors":[8],"within":[9],"a":[10],"given":[11],"power":[12],"budget.":[13],"This":[14],"forces":[16],"design":[17,38],"choices":[18],"-":[19,29],"that":[20],"were":[21],"once":[22],"seen":[23],"only":[24],"in":[25],"high-speed":[26],"custom":[27],"blocks":[28],"to":[30,61],"spread":[31],"throughout":[32],"the":[33,42,75,86],"microprocessor":[34,68,93],"core.":[35,69,94],"These":[36],"unique":[37,62],"structures,":[39],"combined":[40],"with":[41],"nanometer":[43],"technology":[44],"test":[45,63],"challenges":[46,64],"such":[47],"as":[48],"crosstalk,":[49],"process":[50],"variations,":[51],"power-supply":[52],"noise,":[53],"and":[54,57,81],"resistive":[55],"short":[56],"open":[58],"defects,":[59],"lead":[60],"today's":[66],"high-performance":[67,92],"In":[70],"this":[71],"paper,":[72],"we":[73],"present":[74],"scan":[76],"architecture-related":[77],"design-for-test":[78],"(DFT)":[79],"features":[80],"corresponding":[82],"verification":[83],"strategies":[84],"of":[85],"nextgeneration":[87],"Advanced":[88],"Micro":[89],"Devices":[90],"(AMD)":[91]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}