{"id":"https://openalex.org/W2119548404","doi":"https://doi.org/10.1109/test.2009.5355831","title":"Trace signal selection for debugging electrical errors in post-silicon validation","display_name":"Trace signal selection for debugging electrical errors in post-silicon validation","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2119548404","doi":"https://doi.org/10.1109/test.2009.5355831","mag":"2119548404"},"language":"en","primary_location":{"id":"doi:10.1109/test.2009.5355831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004076219","display_name":"Xiao Liu","orcid":"https://orcid.org/0000-0002-2056-0529"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"HK","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Xiao Liu","raw_affiliation_strings":["CUhk REliable computing laboratory CURE Department of Computer Science & Engineering, Chinese University of Hong Kong, New Territories, Hong Kong, China","CUhk REliable computing laboratory (CURE), Department of Computer Science & Engineering The Chinese University of Hong Kong, Shatin, N.T., Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CUhk REliable computing laboratory CURE Department of Computer Science & Engineering, Chinese University of Hong Kong, New Territories, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]},{"raw_affiliation_string":"CUhk REliable computing laboratory (CURE), Department of Computer Science & Engineering The Chinese University of Hong Kong, Shatin, N.T., Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088556682","display_name":"Qiang Xu","orcid":"https://orcid.org/0000-0001-6747-126X"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"HK","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Qiang Xu","raw_affiliation_strings":["CUhk REliable computing laboratory CURE Department of Computer Science & Engineering, Chinese University of Hong Kong, New Territories, Hong Kong, China","CUhk REliable computing laboratory (CURE), Department of Computer Science & Engineering The Chinese University of Hong Kong, Shatin, N.T., Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CUhk REliable computing laboratory CURE Department of Computer Science & Engineering, Chinese University of Hong Kong, New Territories, Hong Kong, China","institution_ids":["https://openalex.org/I177725633"]},{"raw_affiliation_string":"CUhk REliable computing laboratory (CURE), Department of Computer Science & Engineering The Chinese University of Hong Kong, Shatin, N.T., Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I177725633"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.14204115,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.9636017084121704},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.8749830722808838},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7585852146148682},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6741570830345154},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5925588607788086},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5217060446739197},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5199626684188843},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.4371767044067383},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32940056920051575},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.24420756101608276},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19521549344062805},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16809621453285217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13678842782974243},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.09647402167320251}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.9636017084121704},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.8749830722808838},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7585852146148682},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6741570830345154},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5925588607788086},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5217060446739197},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5199626684188843},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.4371767044067383},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32940056920051575},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.24420756101608276},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19521549344062805},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16809621453285217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13678842782974243},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.09647402167320251},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2009.5355831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1881765175","https://openalex.org/W2088256110","https://openalex.org/W2120263045"],"related_works":["https://openalex.org/W2543101158","https://openalex.org/W1569638199","https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2161928627","https://openalex.org/W4388482952","https://openalex.org/W2786113878","https://openalex.org/W2727867943","https://openalex.org/W3015562293","https://openalex.org/W4400860681"],"abstract_inverted_index":{"Debugging":[0],"electrical":[1,46],"errors":[2],"is":[3],"the":[4,9,29,32],"most":[5],"challenging":[6],"problem":[7],"during":[8],"post-silicon":[10],"validation":[11],"process.":[12],"We":[13],"propose":[14],"an":[15],"automated":[16],"trace":[17,37],"signal":[18],"selection":[19],"methodology":[20],"to":[21,44],"facilitate":[22],"this":[23],"task,":[24],"in":[25],"which,":[26],"by":[27],"analyzing":[28],"layout":[30],"of":[31],"circuit":[33],"and":[34],"carefully":[35],"selecting":[36],"signals,":[38],"designers":[39],"are":[40],"with":[41],"high":[42],"probability":[43],"identify":[45],"errors.":[47]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}