{"id":"https://openalex.org/W2146677944","doi":"https://doi.org/10.1109/test.2009.5355814","title":"A novel multisite testing techniques by using frequency synthesizer","display_name":"A novel multisite testing techniques by using frequency synthesizer","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2146677944","doi":"https://doi.org/10.1109/test.2009.5355814","mag":"2146677944"},"language":"en","primary_location":{"id":"doi:10.1109/test.2009.5355814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064702698","display_name":"Boyon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Boyon Kim","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071518596","display_name":"Il-Chan Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Il-Chan Park","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044493527","display_name":"Giseob Song","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Giseob Song","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062792049","display_name":"Wooseong Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wooseong Choi","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070292042","display_name":"Byeong-Yun Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byeong-Yun Kim","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047850938","display_name":"Kyu-Taek Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyutaek Lee","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109945247","display_name":"Chi-Young Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chi-Young Choi","raw_affiliation_strings":["Samsung Electronics Company Limited, Gyeonggi, South Korea","Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company Limited, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co. LTD, Giheung-Gu, Gyeonggi-Do 446-711, S. Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1617718,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/frequency-synthesizer","display_name":"Frequency synthesizer","score":0.6412481665611267},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.6399681568145752},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.6310104727745056},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5303434133529663},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4768346846103668},{"id":"https://openalex.org/keywords/intermediate-frequency","display_name":"Intermediate frequency","score":0.4749310612678528},{"id":"https://openalex.org/keywords/frequency-conversion","display_name":"Frequency conversion","score":0.46629849076271057},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4526498019695282},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.42481741309165955},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2722448408603668},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.25745031237602234},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.20474612712860107},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.13209083676338196},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.12945789098739624}],"concepts":[{"id":"https://openalex.org/C182099602","wikidata":"https://www.wikidata.org/wiki/Q2660678","display_name":"Frequency synthesizer","level":4,"score":0.6412481665611267},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.6399681568145752},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.6310104727745056},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5303434133529663},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4768346846103668},{"id":"https://openalex.org/C8480308","wikidata":"https://www.wikidata.org/wiki/Q244948","display_name":"Intermediate frequency","level":3,"score":0.4749310612678528},{"id":"https://openalex.org/C2984985831","wikidata":"https://www.wikidata.org/wiki/Q5502860","display_name":"Frequency conversion","level":2,"score":0.46629849076271057},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4526498019695282},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.42481741309165955},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2722448408603668},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.25745031237602234},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20474612712860107},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.13209083676338196},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.12945789098739624}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2009.5355814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W10462991","https://openalex.org/W1495124085","https://openalex.org/W2084128131"],"related_works":["https://openalex.org/W2004217881","https://openalex.org/W2893851193","https://openalex.org/W4247074066","https://openalex.org/W1971191054","https://openalex.org/W1959962014","https://openalex.org/W3036321999","https://openalex.org/W4285156153","https://openalex.org/W1587437321","https://openalex.org/W4253176004","https://openalex.org/W2369462247"],"abstract_inverted_index":{"Same":[0],"output":[1],"frequencies":[2,15],"at":[3,17,26],"each":[4],"DUT":[5],"of":[6,35],"the":[7],"testing":[8],"circuit":[9],"are":[10],"multiplied":[11],"by":[12],"different":[13,21],"LO":[14],"signals":[16],"mixers":[18],"stages,":[19],"which":[20],"frequency-translated":[22],"spectrums":[23],"were":[24],"captured":[25],"capture":[27],"port":[28],"simultaneously":[29],"for":[30],"achieving":[31],"fully":[32],"parallel":[33],"test":[34],"RF":[36],"device.":[37]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}