{"id":"https://openalex.org/W2130054356","doi":"https://doi.org/10.1109/test.2009.5355721","title":"BIST scheme for RF VCOs allowing the self-correction of the cut","display_name":"BIST scheme for RF VCOs allowing the self-correction of the cut","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2130054356","doi":"https://doi.org/10.1109/test.2009.5355721","mag":"2130054356"},"language":"en","primary_location":{"id":"doi:10.1109/test.2009.5355721","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355721","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055084189","display_name":"Luca Testa","orcid":"https://orcid.org/0000-0003-4687-3686"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"L. Testa","raw_affiliation_strings":["STMicroelectronics, Crolles, France","IMS Lab - Bordeaux - France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"IMS Lab - Bordeaux - France","institution_ids":["https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110758665","display_name":"H. Lapuyade","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"H. Lapuyade","raw_affiliation_strings":["IMS Laboratory, Bordeaux, France","IMS Lab - Bordeaux - France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Bordeaux, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS Lab - Bordeaux - France","institution_ids":["https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068662659","display_name":"Yann Deval","orcid":"https://orcid.org/0000-0002-7358-8904"},"institutions":[{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Y. Deval","raw_affiliation_strings":["IMS Laboratory, Bordeaux, France","IMS Lab - Bordeaux - France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Bordeaux, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS Lab - Bordeaux - France","institution_ids":["https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105309526","display_name":"O. Mazouffre","orcid":null},"institutions":[{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"O. Mazouffre","raw_affiliation_strings":["IMS Laboratory, Bordeaux, France","IMS Lab - Bordeaux - France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Bordeaux, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS Lab - Bordeaux - France","institution_ids":["https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108530768","display_name":"J.L. Carbonero","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"J.L. Carbonero","raw_affiliation_strings":["STMicroelectronics, Crolles, France","[STMicroelectronics Crolles France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"[STMicroelectronics Crolles France]","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057940221","display_name":"J.B. B\u00e9gueret","orcid":"https://orcid.org/0000-0003-3245-4640"},"institutions":[{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.B. Begueret","raw_affiliation_strings":["IMS Laboratory, Bordeaux, France","IMS Lab - Bordeaux - France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMS Laboratory, Bordeaux, France","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"IMS Lab - Bordeaux - France","institution_ids":["https://openalex.org/I4210160189"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15184005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.9265416860580444},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.7336065769195557},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5848362445831299},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5743618607521057},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5487261414527893},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5272713303565979},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.521683931350708},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5037311911582947},{"id":"https://openalex.org/keywords/wimax","display_name":"WiMAX","score":0.47479715943336487},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4597473740577698},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.43831369280815125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34257692098617554},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13146322965621948},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.09178787469863892}],"concepts":[{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.9265416860580444},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.7336065769195557},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5848362445831299},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5743618607521057},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5487261414527893},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5272713303565979},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.521683931350708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5037311911582947},{"id":"https://openalex.org/C113950482","wikidata":"https://www.wikidata.org/wiki/Q133973","display_name":"WiMAX","level":3,"score":0.47479715943336487},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4597473740577698},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43831369280815125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34257692098617554},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13146322965621948},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.09178787469863892},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2009.5355721","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355721","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00413770v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00413770","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Test Conference 2009, Nov 2009, Austin, United States. pp.123-127","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W590630260","https://openalex.org/W1941310251","https://openalex.org/W2021160270","https://openalex.org/W2048451083","https://openalex.org/W2089290029","https://openalex.org/W2121133433","https://openalex.org/W2125996333","https://openalex.org/W2129979971","https://openalex.org/W2133541778","https://openalex.org/W2138604574","https://openalex.org/W2144126638","https://openalex.org/W2151949659","https://openalex.org/W2154630689","https://openalex.org/W2624596548","https://openalex.org/W6617460053","https://openalex.org/W6738883661"],"related_works":["https://openalex.org/W2070109416","https://openalex.org/W1582448060","https://openalex.org/W1523213765","https://openalex.org/W2040399070","https://openalex.org/W2388316590","https://openalex.org/W4388486464","https://openalex.org/W2902200568","https://openalex.org/W2380576078","https://openalex.org/W2261105975","https://openalex.org/W3157583314"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,19,45,50,68],"implement":[3],"a":[4,10,70],"built-in":[5],"self-test":[6],"(BIST)":[7],"strategy":[8],"for":[9,30],"radio":[11],"frequency":[12],"(RF)":[13],"LC-voltage":[14],"controlled":[15],"oscillator":[16],"(VCO)":[17],"devoted":[18],"WiMax":[20],"applications,":[21],"an":[22],"exhaustive":[23],"study":[24],"of":[25,39,78],"the":[26,40,47,53,61,76,79,87],"fault":[27,54],"coverage":[28],"achievable":[29],"this":[31],"block":[32],"is":[33,43,55,58,84],"carried":[34],"out.":[35],"The":[36,81],"peak-to-peak":[37],"value":[38],"output":[41],"voltage":[42],"shown":[44,59],"be":[46,64],"best":[48],"quantity":[49],"monitor.":[51],"Once":[52],"detected,":[56],"it":[57],"that":[60],"BIST":[62],"can":[63],"exploited":[65],"as":[66],"well":[67],"trigger":[69],"feedback":[71],"allowing,":[72],"in":[73],"some":[74],"cases,":[75],"self-correction":[77],"VCO.":[80],"complete":[82],"system":[83],"designed":[85],"using":[86],"STM":[88],"CMOS":[89],"65":[90],"nm":[91],"process.":[92]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}