{"id":"https://openalex.org/W2157971538","doi":"https://doi.org/10.1109/test.2009.5355625","title":"Built-in EVM measurement for OFDM transceivers using all-digital DFT","display_name":"Built-in EVM measurement for OFDM transceivers using all-digital DFT","publication_year":2009,"publication_date":"2009-11-01","ids":{"openalex":"https://openalex.org/W2157971538","doi":"https://doi.org/10.1109/test.2009.5355625","mag":"2157971538"},"language":"en","primary_location":{"id":"doi:10.1109/test.2009.5355625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108524932","display_name":"Ender Y\u0131lmaz","orcid":"https://orcid.org/0009-0004-0254-5845"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ender Yilmaz","raw_affiliation_strings":["Electrical Engineering Department, Arizona State University, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062953417","display_name":"Afsaneh Nassery","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Afsaneh Nassery","raw_affiliation_strings":["Electrical Engineering Department, Arizona State University, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Electrical Engineering Department, Arizona State University, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Arizona State University, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112208588","display_name":"Erkan Acar","orcid":"https://orcid.org/0000-0002-9377-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Erkan Acar","raw_affiliation_strings":["Duke University, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5108524932"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.2991,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65694434,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7157881259918213},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.6933573484420776},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.681979775428772},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.6788130402565002},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6269069910049438},{"id":"https://openalex.org/keywords/orthogonal-frequency-division-multiplexing","display_name":"Orthogonal frequency-division multiplexing","score":0.6040602326393127},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.5582028031349182},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5459585785865784},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.47162294387817383},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4343160390853882},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43224290013313293},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.18521913886070251},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16283050179481506},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14095869660377502},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.13089606165885925},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.10789257287979126}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7157881259918213},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.6933573484420776},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.681979775428772},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.6788130402565002},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6269069910049438},{"id":"https://openalex.org/C40409654","wikidata":"https://www.wikidata.org/wiki/Q375889","display_name":"Orthogonal frequency-division multiplexing","level":3,"score":0.6040602326393127},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.5582028031349182},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5459585785865784},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.47162294387817383},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4343160390853882},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43224290013313293},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.18521913886070251},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16283050179481506},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14095869660377502},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.13089606165885925},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.10789257287979126},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2009.5355625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2009.5355625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1547794342","https://openalex.org/W2020094255","https://openalex.org/W2032402518","https://openalex.org/W2053952762","https://openalex.org/W2113451234","https://openalex.org/W2114644186","https://openalex.org/W2117526979","https://openalex.org/W2121692978","https://openalex.org/W2125986093","https://openalex.org/W2126591244","https://openalex.org/W2134640476","https://openalex.org/W2145676256","https://openalex.org/W2170727411","https://openalex.org/W2249451669","https://openalex.org/W2485002209","https://openalex.org/W2539944574","https://openalex.org/W3140239071","https://openalex.org/W6655433886","https://openalex.org/W6676972993","https://openalex.org/W6680379417"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2377919138","https://openalex.org/W2378857091","https://openalex.org/W2999756192","https://openalex.org/W103652678","https://openalex.org/W4226090359","https://openalex.org/W2059697060","https://openalex.org/W936373746","https://openalex.org/W2975817033","https://openalex.org/W1658882345"],"abstract_inverted_index":{"In":[0,35],"this":[1],"paper,":[2],"we":[3,46],"present":[4,69],"a":[5],"technique":[6,19,73,93],"to":[7,37,74,88,95],"enable":[8],"accurate":[9],"built-in":[10],"measurement":[11,18],"of":[12,62,109],"EVM":[13,40,76],"for":[14],"OFDM":[15],"transceivers.":[16],"This":[17],"only":[20],"relies":[21],"on":[22],"the":[23,52,60,91,107,110],"decoded":[24],"bit":[25,53],"pattern,":[26],"and":[27,103],"does":[28],"not":[29],"require":[30],"any":[31],"additional":[32],"test":[33,56],"equipment.":[34],"order":[36],"accurately":[38],"predict":[39],"without":[41],"using":[42,100],"analog":[43],"signal":[44],"analysis,":[45],"intentionally":[47],"code":[48],"more":[49],"symbols":[50],"into":[51],"pattern":[54],"in":[55,65],"mode,":[57],"which":[58],"enables":[59],"decoding":[61],"IQ":[63],"signals":[64],"finer":[66],"granularity.":[67],"We":[68,82],"an":[70,85],"innovative":[71],"DFT":[72,92],"measure":[75],"on-chip":[77],"with":[78],"very":[79],"little":[80],"overhead.":[81],"also":[83],"provide":[84],"analytical":[86],"framework":[87],"determine":[89],"how":[90],"needs":[94],"be":[96],"implemented.":[97],"Experimental":[98],"results":[99],"MATLAB":[101],"simulations":[102],"hardware":[104],"measurements":[105],"confirm":[106],"accuracy":[108],"proposed":[111],"technique.":[112]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}