{"id":"https://openalex.org/W2082872888","doi":"https://doi.org/10.1109/test.2008.4700694","title":"Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains","display_name":"Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2082872888","doi":"https://doi.org/10.1109/test.2008.4700694","mag":"2082872888"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700694","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700694","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100394414","display_name":"Jing Ye","orcid":"https://orcid.org/0000-0002-8023-5090"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jing Ye","raw_affiliation_strings":["Chinese Academy of Sciences, Beijing, China","Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100455740","display_name":"Fei Wang","orcid":"https://orcid.org/0000-0001-7379-2975"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Beijing, China","Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061080406","display_name":"Yu Hu","orcid":"https://orcid.org/0000-0002-4184-0909"},"institutions":[{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Hu","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Computer System and Architecture, CAS, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100394414"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11683357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"54","issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7988105416297913},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6396380066871643},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6329169273376465},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5670808553695679},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5381188988685608},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5077065229415894},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4612198770046234},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.336078017950058},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.20067638158798218},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.15518534183502197},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1445280909538269}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7988105416297913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6396380066871643},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6329169273376465},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5670808553695679},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5381188988685608},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5077065229415894},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4612198770046234},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.336078017950058},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.20067638158798218},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.15518534183502197},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1445280909538269},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2008.4700694","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700694","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.708.9169","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.708.9169","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.carch.ac.cn/%7Erdrg/files/Ye_ITC2008.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W2620506035","https://openalex.org/W2168810991","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2130974462","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W201174846","https://openalex.org/W2028665553"],"abstract_inverted_index":{"A":[0],"deterministic":[1],"diagnosis":[2,43],"method":[3],"for":[4],"multiple":[5,22,30],"timing":[6,23,31],"faults":[7,24,47],"in":[8],"scan":[9],"chains":[10],"is":[11,48],"proposed.":[12],"Compared":[13],"to":[14],"prior":[15],"work,":[16],"our":[17],"approach":[18],"can":[19],"diagnose":[20],"mask-effect":[21],"as":[25,27],"well":[26],"conventional":[28],"mixed":[29],"faults.":[32],"Experimental":[33],"results":[34],"on":[35],"ISCAS'89":[36],"benchmark":[37],"circuits":[38],"demonstrate":[39],"that":[40],"the":[41],"average":[42],"resolution":[44],"of":[45],"two":[46],"less":[49],"than":[50],"3.":[51]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}