{"id":"https://openalex.org/W1968891175","doi":"https://doi.org/10.1109/test.2008.4700656","title":"Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model","display_name":"Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W1968891175","doi":"https://doi.org/10.1109/test.2008.4700656","mag":"1968891175"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101573181","display_name":"Scott Davidson","orcid":"https://orcid.org/0000-0002-9390-6084"},"institutions":[{"id":"https://openalex.org/I1342911587","display_name":"Oracle (United States)","ror":"https://ror.org/006c77m33","country_code":"US","type":"company","lineage":["https://openalex.org/I1342911587"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Davidson","raw_affiliation_strings":["Sun Microsystems, Inc., Sunnyvale, CA, USA","Sun Microsyst. Inc., Sunnyvale, CA"],"affiliations":[{"raw_affiliation_string":"Sun Microsystems, Inc., Sunnyvale, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Sun Microsyst. Inc., Sunnyvale, CA","institution_ids":["https://openalex.org/I1342911587"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101573181"],"corresponding_institution_ids":["https://openalex.org/I1342911587"],"apc_list":null,"apc_paid":null,"fwci":2.0797,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.87535058,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9803000092506409,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.7359414100646973},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.696898877620697},{"id":"https://openalex.org/keywords/return-on-investment","display_name":"Return on investment","score":0.6917017698287964},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6001226902008057},{"id":"https://openalex.org/keywords/hierarchical-database-model","display_name":"Hierarchical database model","score":0.5613329410552979},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5503815412521362},{"id":"https://openalex.org/keywords/investment","display_name":"Investment (military)","score":0.4472898244857788},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.43053102493286133},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.32768407464027405},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3238829970359802},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3233039379119873},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3201289176940918},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1349812150001526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12241959571838379},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08204242587089539}],"concepts":[{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.7359414100646973},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.696898877620697},{"id":"https://openalex.org/C169549615","wikidata":"https://www.wikidata.org/wiki/Q939134","display_name":"Return on investment","level":3,"score":0.6917017698287964},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6001226902008057},{"id":"https://openalex.org/C144986985","wikidata":"https://www.wikidata.org/wiki/Q871236","display_name":"Hierarchical database model","level":2,"score":0.5613329410552979},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5503815412521362},{"id":"https://openalex.org/C27548731","wikidata":"https://www.wikidata.org/wiki/Q88272","display_name":"Investment (military)","level":3,"score":0.4472898244857788},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.43053102493286133},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.32768407464027405},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3238829970359802},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3233039379119873},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3201289176940918},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1349812150001526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12241959571838379},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08204242587089539},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700656","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700656","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1544260021","https://openalex.org/W1593490557","https://openalex.org/W1767301357","https://openalex.org/W1988192422","https://openalex.org/W2042082709","https://openalex.org/W2055360722","https://openalex.org/W2097399140","https://openalex.org/W2098087729","https://openalex.org/W2106920698","https://openalex.org/W2123443166","https://openalex.org/W2130587097","https://openalex.org/W2149135625","https://openalex.org/W2165561301"],"related_works":["https://openalex.org/W2046317627","https://openalex.org/W2384551111","https://openalex.org/W2391832805","https://openalex.org/W2247209792","https://openalex.org/W2377553480","https://openalex.org/W3202284637","https://openalex.org/W4205495435","https://openalex.org/W2373126823","https://openalex.org/W2530816244","https://openalex.org/W2004581672"],"abstract_inverted_index":{"How":[0],"can":[1,60],"we":[2],"justify":[3],"system":[4],"level":[5],"DFT?":[6],"We":[7,46],"must":[8],"show":[9],"that":[10],"it":[11],"has":[12],"a":[13,42,48],"positive":[14],"return":[15],"on":[16,41],"investment":[17],"(ROI).":[18],"Existing":[19],"test":[20],"ROI":[21,52],"models":[22],"are":[23,38],"manufacturing":[24],"centric,":[25],"do":[26],"not":[27],"account":[28],"for":[29],"the":[30,33],"disaggregation":[31],"of":[32],"product":[34],"realization":[35],"process,":[36],"and":[37,59],"often":[39],"focused":[40],"specific":[43],"DFT":[44],"method.":[45],"propose":[47],"new,":[49],"top-down,":[50],"hierarchical":[51],"model,":[53],"which":[54],"starts":[55],"with":[56],"potential":[57],"benefits":[58],"handle":[61],"entire":[62],"systems":[63],"more":[64],"effectively":[65],"than":[66],"current":[67],"models.":[68]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}