{"id":"https://openalex.org/W2090934243","doi":"https://doi.org/10.1109/test.2008.4700649","title":"Jitter and Signal Integrity Verification for Synchronous and Asynchronous I/Os at Multiple to 10 GHz/Gbps","display_name":"Jitter and Signal Integrity Verification for Synchronous and Asynchronous I/Os at Multiple to 10 GHz/Gbps","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2090934243","doi":"https://doi.org/10.1109/test.2008.4700649","mag":"2090934243"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025632238","display_name":"M.P. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I22433950","display_name":"Altera (United States)","ror":"https://ror.org/017b7j426","country_code":"US","type":"company","lineage":["https://openalex.org/I22433950"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M.P. Li","raw_affiliation_strings":["Altera Corporation, San Jose, CA, USA","Altera, San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Altera Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I22433950"]},{"raw_affiliation_string":"Altera, San Jose, CA","institution_ids":["https://openalex.org/I22433950"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5025632238"],"corresponding_institution_ids":["https://openalex.org/I22433950"],"apc_list":null,"apc_paid":null,"fwci":0.6659,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72754033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9763256311416626},{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.8611570596694946},{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.8100773692131042},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6821995973587036},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5666174292564392},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.4679158329963684},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.44194960594177246},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18422725796699524},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.155900239944458}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9763256311416626},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.8611570596694946},{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.8100773692131042},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6821995973587036},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5666174292564392},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.4679158329963684},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.44194960594177246},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18422725796699524},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.155900239944458},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700649","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700649","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4300000071525574}],"awards":[],"funders":[{"id":"https://openalex.org/F4320336713","display_name":"Central Power Research Institute","ror":"https://ror.org/00d1evr30"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1658809881","https://openalex.org/W2049836881","https://openalex.org/W2067961444","https://openalex.org/W2139633080","https://openalex.org/W2479464197"],"related_works":["https://openalex.org/W1972598373","https://openalex.org/W2364019159","https://openalex.org/W1489049788","https://openalex.org/W2243648136","https://openalex.org/W4387485749","https://openalex.org/W2045561949","https://openalex.org/W2372709865","https://openalex.org/W2017275349","https://openalex.org/W2378013451","https://openalex.org/W268271086"],"abstract_inverted_index":{"Emerging":[0],"jitter":[1,6,10,25],"spectroscopy":[2],"concept":[3],"and":[4,26,30,35,39,57],"new":[5],"merit":[7],"of":[8],"pulse-width":[9],"(PWJ)":[11],"when":[12],"data":[13],"rate":[14],"approaches":[15],"10":[16],"Gbps":[17],"are":[18,41],"first":[19],"discussed":[20],"in":[21],"this":[22],"paper.":[23],"Then":[24],"signaling":[27],"verification":[28],"requirements":[29],"methods":[31],"for":[32,47],"both":[33],"synchronous":[34],"asynchronous":[36],"I/O":[37],"links":[38],"subsystems":[40],"covered.":[42],"Built-in":[43],"oscilloscope":[44],"(BIO)":[45],"technology":[46],"receiver":[48],"testing":[49],"also":[50],"is":[51],"highlighted,":[52],"along":[53],"with":[54],"its":[55],"capabilities":[56],"impacts.":[58]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}