{"id":"https://openalex.org/W2165323118","doi":"https://doi.org/10.1109/test.2008.4700639","title":"A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing","display_name":"A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2165323118","doi":"https://doi.org/10.1109/test.2008.4700639","mag":"2165323118"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700639","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T.J. Yamaguchi","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112246056","display_name":"M. Kawabata","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Kawabata","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112265787","display_name":"M. Soma","orcid":null},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Soma","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000723708","display_name":"M. Ishida","orcid":"https://orcid.org/0000-0003-1388-1284"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Ishida","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062163570","display_name":"K. Sawami","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Sawami","raw_affiliation_strings":["Advantest Corporation, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Corporation, Fukuoka, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089608780","display_name":"K. Uekusa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Uekusa","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4233,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81092236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.9860156774520874},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9257445335388184},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.4413209855556488},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4406138062477112},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.43873047828674316},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37904030084609985},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15612360835075378},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15084287524223328},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.08446407318115234},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.07337930798530579},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.060422420501708984}],"concepts":[{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.9860156774520874},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9257445335388184},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.4413209855556488},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4406138062477112},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.43873047828674316},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37904030084609985},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15612360835075378},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15084287524223328},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.08446407318115234},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.07337930798530579},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.060422420501708984}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700639","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700639","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1505760695","https://openalex.org/W1516460422","https://openalex.org/W1592506358","https://openalex.org/W1862042040","https://openalex.org/W2098935279","https://openalex.org/W2121520316","https://openalex.org/W2129182275","https://openalex.org/W2134179788","https://openalex.org/W2139618226","https://openalex.org/W2140007240","https://openalex.org/W2140814349","https://openalex.org/W2157930696","https://openalex.org/W2161283733","https://openalex.org/W2161746181","https://openalex.org/W2163890919","https://openalex.org/W2787894033","https://openalex.org/W2983035300","https://openalex.org/W3148449225","https://openalex.org/W4214744378"],"related_works":["https://openalex.org/W2135927294","https://openalex.org/W2121182846","https://openalex.org/W2036729721","https://openalex.org/W2615706834","https://openalex.org/W2883940393","https://openalex.org/W2999389756","https://openalex.org/W2100212673","https://openalex.org/W2922436484","https://openalex.org/W4230478510","https://openalex.org/W4238553875"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,34],"new":[4],"method":[5],"for":[6],"measuring":[7],"aperture":[8,28],"jitter":[9],"on":[10],"an":[11,39,49],"ADC":[12],"output.":[13],"It":[14],"measures":[15],"both":[16],"the":[17,22,56],"average":[18],"ENOB":[19,24,41],"loss":[20,25],"and":[21],"worst-case":[23],"due":[26],"to":[27,38],"jitter.":[29],"Because":[30],"it":[31,43],"adds":[32],"only":[33],"negligible":[35],"computation":[36],"time":[37],"existing":[40],"test,":[42],"can":[44],"also":[45],"be":[46],"used":[47],"in":[48],"HV":[50],"production":[51],"environment":[52],"without":[53],"significantly":[54],"increasing":[55],"overall":[57],"test":[58],"time.":[59]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}