{"id":"https://openalex.org/W2126591244","doi":"https://doi.org/10.1109/test.2008.4700603","title":"EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms","display_name":"EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2126591244","doi":"https://doi.org/10.1109/test.2008.4700603","mag":"2126591244"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700603","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700603","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021081942","display_name":"Vishwanath Natarajan","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"V. Natarajan","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology Atlanta, GA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017180010","display_name":"Hyun Choi","orcid":"https://orcid.org/0000-0002-6963-3004"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Choi","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology Atlanta, GA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085075089","display_name":"D. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Lee","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology Atlanta, GA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110146025","display_name":"R. Senguttuvan","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Senguttuvan","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology Atlanta, GA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology Atlanta, GA"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology Atlanta, GA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5021081942"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":1.3318,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.82216024,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"34","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/orthogonal-frequency-division-multiplexing","display_name":"Orthogonal frequency-division multiplexing","score":0.6869699954986572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6332481503486633},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5646801590919495},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5471566915512085},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5124824047088623},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.49718430638313293},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4836607873439789},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4809000492095947},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.4776676595211029},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.45276322960853577},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4255220293998718},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34795504808425903},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2625320851802826},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1545361578464508},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12008178234100342}],"concepts":[{"id":"https://openalex.org/C40409654","wikidata":"https://www.wikidata.org/wiki/Q375889","display_name":"Orthogonal frequency-division multiplexing","level":3,"score":0.6869699954986572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6332481503486633},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5646801590919495},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5471566915512085},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5124824047088623},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.49718430638313293},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4836607873439789},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4809000492095947},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.4776676595211029},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.45276322960853577},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4255220293998718},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34795504808425903},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2625320851802826},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1545361578464508},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12008178234100342},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700603","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700603","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5099999904632568,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1527989572","https://openalex.org/W1600376976","https://openalex.org/W1964648750","https://openalex.org/W2020094255","https://openalex.org/W2044611655","https://openalex.org/W2095701786","https://openalex.org/W2102201073","https://openalex.org/W2106661578","https://openalex.org/W2108397269","https://openalex.org/W2113451234","https://openalex.org/W2116080338","https://openalex.org/W2125986093","https://openalex.org/W2145612150","https://openalex.org/W2161922577","https://openalex.org/W3140239071","https://openalex.org/W6655433886","https://openalex.org/W6681308809"],"related_works":["https://openalex.org/W2783437851","https://openalex.org/W4249165909","https://openalex.org/W1672137312","https://openalex.org/W1650483958","https://openalex.org/W1823550417","https://openalex.org/W2147186021","https://openalex.org/W2323432503","https://openalex.org/W4321843682","https://openalex.org/W2151541251","https://openalex.org/W2132453830"],"abstract_inverted_index":{"In":[0,40],"production":[1],"testing":[2],"of":[3,7,29,38,49,71],"wireless":[4],"systems,":[5],"measurement":[6],"EVM":[8,43,105],"(a":[9],"critical":[10],"spec":[11],"that":[12,31],"is":[13,44,101,115],"directly":[14],"related":[15],"to":[16,25,33,85,103],"bit":[17],"error":[18],"rate)":[19],"incurs":[20],"significant":[21],"test":[22,113,121],"time":[23,114],"due":[24],"the":[26,50,72,75],"large":[27],"numbers":[28],"symbols":[30],"need":[32],"be":[34],"transmitted":[35],"for":[36],"reasons":[37],"accuracy.":[39,122],"our":[41],"approach,":[42],"modeled":[45],"as":[46],"a":[47,68,90],"function":[48],"system":[51],"static":[52,76],"non-idealities":[53,61],"(IQ":[54],"mismatch,":[55],"gain,":[56],"IIP3":[57],"parameters)":[58],"and":[59,94],"dynamic":[60],"(system":[62],"noise,":[63],"VCO":[64],"phase":[65],"noise).":[66],"Using":[67],"selected":[69],"subset":[70],"OFDM":[73],"tones,":[74],"parameters":[77],"are":[78,82],"calculated":[79],"first.":[80],"These":[81],"then":[83],"used":[84,102],"facilitate":[86],"noise":[87,95],"estimation":[88],"using":[89,106],"back-end":[91],"constellation":[92],"compensation":[93],"amplification":[96],"procedure.":[97],"The":[98],"data":[99],"generated":[100],"predict":[104],"machine":[107],"learning":[108],"methods.":[109],"Significant":[110],"reduction":[111],"in":[112,120],"achieved":[116],"with":[117],"little":[118],"loss":[119]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}