{"id":"https://openalex.org/W2006438370","doi":"https://doi.org/10.1109/test.2008.4700592","title":"Architecture for Testing Multi-Voltage Domain SOC","display_name":"Architecture for Testing Multi-Voltage Domain SOC","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2006438370","doi":"https://doi.org/10.1109/test.2008.4700592","mag":"2006438370"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700592","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700592","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043448818","display_name":"L. Souef","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"L. Souef","raw_affiliation_strings":["ST NXP Wireless Semiconductors Sophia, La Valbonne, France","ST NXP Wireless Semicond. Sophia, Valbonne"],"affiliations":[{"raw_affiliation_string":"ST NXP Wireless Semiconductors Sophia, La Valbonne, France","institution_ids":["https://openalex.org/I4210123704"]},{"raw_affiliation_string":"ST NXP Wireless Semicond. Sophia, Valbonne","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081671642","display_name":"C. Eychenne","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Eychenne","raw_affiliation_strings":["ST NXP Wireless Semiconductors Sophia, La Valbonne, France","ST NXP Wireless Semicond. Sophia, Valbonne"],"affiliations":[{"raw_affiliation_string":"ST NXP Wireless Semiconductors Sophia, La Valbonne, France","institution_ids":["https://openalex.org/I4210123704"]},{"raw_affiliation_string":"ST NXP Wireless Semicond. Sophia, Valbonne","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030544060","display_name":"E. Alie","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"E. Alie","raw_affiliation_strings":["ST NXP Wireless Semiconductors Sophia, La Valbonne, France","ST NXP Wireless Semicond. Sophia, Valbonne"],"affiliations":[{"raw_affiliation_string":"ST NXP Wireless Semiconductors Sophia, La Valbonne, France","institution_ids":["https://openalex.org/I4210123704"]},{"raw_affiliation_string":"ST NXP Wireless Semicond. Sophia, Valbonne","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043448818"],"corresponding_institution_ids":["https://openalex.org/I4210123704"],"apc_list":null,"apc_paid":null,"fwci":1.3864,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.83117794,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7090883851051331},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6494390368461609},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.6382675766944885},{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.501035213470459},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4910004436969757},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.49054521322250366},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4112415611743927},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4109157919883728},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4009955823421478},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3710740804672241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23428615927696228},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21726906299591064},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14574187994003296}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7090883851051331},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6494390368461609},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.6382675766944885},{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.501035213470459},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4910004436969757},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.49054521322250366},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4112415611743927},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4109157919883728},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4009955823421478},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3710740804672241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23428615927696228},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21726906299591064},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14574187994003296},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700592","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700592","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8600000143051147,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2029263260","https://openalex.org/W2068731843","https://openalex.org/W2069493778","https://openalex.org/W2119691242","https://openalex.org/W2122643352","https://openalex.org/W2152776339","https://openalex.org/W2155288938"],"related_works":["https://openalex.org/W2368585244","https://openalex.org/W2347707557","https://openalex.org/W2187574435","https://openalex.org/W51919102","https://openalex.org/W2108140302","https://openalex.org/W1527836777","https://openalex.org/W2105657695","https://openalex.org/W2099176192","https://openalex.org/W1976242652","https://openalex.org/W2000140246"],"abstract_inverted_index":{"In":[0],"portable":[1],"applications":[2],"power":[3,55,80],"consumption":[4],"is":[5,36,40,52,73],"a":[6,42,89],"key":[7,24],"parameter":[8],"to":[9,53,62,75],"commercial":[10],"success.":[11],"Mobile":[12],"phone":[13],"standby":[14],"time,":[15],"talk":[16],"time":[17,22],"and":[18,77,99],"MP3":[19],"player":[20],"play":[21],"are":[23,68],"customer":[25],"parameters.":[26],"With":[27],"ever":[28],"decreasing":[29],"technology":[30],"nodes,":[31],"this":[32],"static":[33],"leakage":[34],"current":[35],"becoming":[37,41],"predominant.":[38],"It":[39],"real":[43],"issue":[44],"for":[45],"standalone":[46],"devices.":[47],"One":[48],"of":[49],"the":[50,58,65,83,94,100],"solutions":[51,98],"embed":[54],"switches":[56,81],"in":[57,60],"device":[59],"order":[61],"switch":[63],"off":[64],"blocks":[66],"that":[67],"not":[69],"used.":[70],"The":[71],"challenge":[72],"then":[74],"test":[76,104],"validate":[78],"those":[79],"on":[82,103],"production":[84],"line.":[85],"This":[86],"paper":[87],"shows":[88],"practical":[90],"case":[91],"study,":[92],"detailing":[93],"implemented":[95],"DFT":[96],"architecture":[97],"measurements":[101],"achieved":[102],"systems.":[105]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}