{"id":"https://openalex.org/W2020600727","doi":"https://doi.org/10.1109/test.2008.4700572","title":"A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs","display_name":"A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs","publication_year":2008,"publication_date":"2008-10-01","ids":{"openalex":"https://openalex.org/W2020600727","doi":"https://doi.org/10.1109/test.2008.4700572","mag":"2020600727"},"language":"en","primary_location":{"id":"doi:10.1109/test.2008.4700572","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700572","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061006452","display_name":"Vivek Chickermane","orcid":"https://orcid.org/0000-0003-1232-470X"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"V. Chickermane","raw_affiliation_strings":["Front-End Design Group, Cadence Design Systems, Inc., USA","Front-End Design Group, Cadence Design Systems, USA. vivekc@cadence.com"],"affiliations":[{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, Inc., USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, USA. vivekc@cadence.com","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055627723","display_name":"Patrick Gallagher","orcid":"https://orcid.org/0000-0001-8428-2591"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Gallagher","raw_affiliation_strings":["Front-End Design Group, Cadence Design Systems, Inc., USA","Front-End Design Group, Cadence Design Systems, USA. patrickg@cadence.com"],"affiliations":[{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, Inc., USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, USA. patrickg@cadence.com","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057923372","display_name":"Jeremy Sage","orcid":"https://orcid.org/0000-0001-8180-0525"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Sage","raw_affiliation_strings":["Front-End Design Group, Cadence Design Systems, Inc., USA","Front-End Design Group, Cadence Design Systems, USA. sagejm@cadence.com"],"affiliations":[{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, Inc., USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, USA. sagejm@cadence.com","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023573950","display_name":"Peng Yuan","orcid":"https://orcid.org/0000-0003-4405-1830"},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Yuan","raw_affiliation_strings":["Front-End Design Group, Cadence Design Systems, Inc., USA","Front-End Design Group, Cadence Design Systems, USA. paulyuan@cadence.com"],"affiliations":[{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, Inc., USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, USA. paulyuan@cadence.com","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016355921","display_name":"Krishna Chakravadhanula","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Chakravadhanula","raw_affiliation_strings":["Front-End Design Group, Cadence Design Systems, Inc., USA","Front-End Design Group, Cadence Design Systems, USA. ckrishna@cadence.com"],"affiliations":[{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, Inc., USA","institution_ids":["https://openalex.org/I66217453"]},{"raw_affiliation_string":"Front-End Design Group, Cadence Design Systems, USA. ckrishna@cadence.com","institution_ids":["https://openalex.org/I66217453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5061006452"],"corresponding_institution_ids":["https://openalex.org/I66217453"],"apc_list":null,"apc_paid":null,"fwci":4.1593,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.94211592,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.719980001449585},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6440423727035522},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6314564943313599},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5854858756065369},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5196372270584106},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5060707926750183},{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.4859422445297241},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4810240864753723},{"id":"https://openalex.org/keywords/switched-mode-power-supply-applications","display_name":"Switched-mode power supply applications","score":0.4218760132789612},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3588354289531708},{"id":"https://openalex.org/keywords/switched-mode-power-supply","display_name":"Switched-mode power supply","score":0.35449549555778503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30819714069366455},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21235275268554688},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.17239788174629211},{"id":"https://openalex.org/keywords/constant-power-circuit","display_name":"Constant power circuit","score":0.12636074423789978}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.719980001449585},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6440423727035522},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6314564943313599},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5854858756065369},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5196372270584106},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5060707926750183},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.4859422445297241},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4810240864753723},{"id":"https://openalex.org/C79899660","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply applications","level":5,"score":0.4218760132789612},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3588354289531708},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.35449549555778503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30819714069366455},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21235275268554688},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.17239788174629211},{"id":"https://openalex.org/C29586797","wikidata":"https://www.wikidata.org/wiki/Q5163663","display_name":"Constant power circuit","level":4,"score":0.12636074423789978},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2008.4700572","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2008.4700572","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1539035513","https://openalex.org/W1557977552","https://openalex.org/W2063855448","https://openalex.org/W2105913179","https://openalex.org/W2119691242","https://openalex.org/W2136680550","https://openalex.org/W2137427575","https://openalex.org/W2146893269","https://openalex.org/W2150448461","https://openalex.org/W2158611920","https://openalex.org/W2166163625","https://openalex.org/W2169839635","https://openalex.org/W6680497249"],"related_works":["https://openalex.org/W2157212570","https://openalex.org/W2543176856","https://openalex.org/W2386849760","https://openalex.org/W2371073454","https://openalex.org/W2359850098","https://openalex.org/W2740815748","https://openalex.org/W2764440971","https://openalex.org/W1897203488","https://openalex.org/W2616892825","https://openalex.org/W2624668974"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,11,30,53],"challenges":[4],"of":[5,33],"testing":[6],"low-power":[7],"designs":[8],"that":[9],"use":[10],"commonly":[12],"used":[13],"multi-supply":[14],"multi-voltage":[15],"(MSMV)":[16],"and":[17,51,55,68],"power":[18,44],"shut-off":[19],"(PSO)":[20],"design":[21,36],"methodology.":[22,63],"We":[23,64],"describe":[24],"a":[25,60],"novel":[26],"solution":[27],"to":[28,41,46,58],"address":[29],"manufacturing":[31],"test":[32,49,62],"an":[34],"MSMV/PSO":[35],"by":[37],"using":[38],"power-mode":[39],"specifications":[40],"map":[42],"multiple":[43],"modes":[45,50],"their":[47],"target":[48],"enhancing":[52],"DFT":[54],"ATPG":[56],"methodology":[57],"enable":[59],"comprehensive":[61],"provide":[65],"experimental":[66],"results":[67],"future":[69],"directions":[70],"for":[71],"power-aware":[72],"test.":[73]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}