{"id":"https://openalex.org/W2163094833","doi":"https://doi.org/10.1109/test.2007.4437666","title":"GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies","display_name":"GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2163094833","doi":"https://doi.org/10.1109/test.2007.4437666","mag":"2163094833"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437666","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039513293","display_name":"M. Nicolaidis","orcid":"https://orcid.org/0000-0003-1091-9339"},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Michael Nicolaidis","raw_affiliation_strings":["TIMA Laboratory, IRoC Technologies SA, Grenoble, France","Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, IRoC Technologies SA, Grenoble, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5039513293"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":null,"apc_paid":null,"fwci":4.3079,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.9433186,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5703738927841187},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5082570910453796},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.18046334385871887}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5703738927841187},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5082570910453796},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.18046334385871887}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2007.4437666","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437666","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00226406v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00226406","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International TEST Conference (ITC'07), Oct 2007, Santa Clara, Ca., United States","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W1575757112","https://openalex.org/W1976634368","https://openalex.org/W1982290595","https://openalex.org/W1985545797","https://openalex.org/W2004751569","https://openalex.org/W2041727850","https://openalex.org/W2043318181","https://openalex.org/W2064759901","https://openalex.org/W2085583524","https://openalex.org/W2097596884","https://openalex.org/W2098143668","https://openalex.org/W2113626924","https://openalex.org/W2121052741","https://openalex.org/W2121395914","https://openalex.org/W2123009614","https://openalex.org/W2126810113","https://openalex.org/W2128748528","https://openalex.org/W2133079932","https://openalex.org/W2151870556","https://openalex.org/W2152652532","https://openalex.org/W2158574200","https://openalex.org/W2162465831","https://openalex.org/W2168300107","https://openalex.org/W2789221923","https://openalex.org/W4243835011","https://openalex.org/W6634170775"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655","https://openalex.org/W2359140296"],"abstract_inverted_index":{"Silicon-based":[0],"CMOS":[1,35],"technologies":[2,36],"are":[3,59],"fast":[4],"approaching":[5,10],"their":[6],"ultimate":[7],"limits.":[8],"By":[9],"these":[11,49,51],"limits,":[12,50],"power":[13,66],"dissipation,":[14,67],"fabrication":[15],"yield,":[16],"and":[17,42,69],"reliability":[18,79],"worsen":[19],"steadily":[20],"making":[21],"further":[22,31],"nanometric":[23],"scaling":[24,32],"increasingly":[25],"difficult.":[26],"These":[27],"problems":[28,52],"would":[29],"stop":[30],"of":[33,65,76],"silicon-based":[34],"at":[37],"channel":[38],"lengths":[39],"between":[40],"10":[41],"20":[43],"nm.":[44],"But":[45],"even":[46],"before":[47],"reaching":[48],"could":[53],"become":[54],"show-stoppers":[55],"unless":[56],"new":[57,85],"techniques":[58],"introduced":[60],"to":[61,93],"maintain":[62],"acceptable":[63],"levels":[64],"yield":[68],"reliability.":[70],"The":[71],"paper":[72],"describes":[73],"the":[74,100],"principles":[75],"GRAAL":[77],"(global":[78],"architecture":[80,88],"approach":[81],"for":[82,89,98],"logic),":[83],"a":[84,95],"fault":[86],"tolerant":[87],"logic":[90],"designs,":[91],"aimed":[92],"provide":[94],"global":[96],"solution":[97],"mitigating":[99],"above":[101],"mentioned":[102],"problems.":[103]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}