{"id":"https://openalex.org/W2161883091","doi":"https://doi.org/10.1109/test.2007.4437659","title":"Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions","display_name":"Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2161883091","doi":"https://doi.org/10.1109/test.2007.4437659","mag":"2161883091"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437659","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039442844","display_name":"Swarup Bhunia","orcid":"https://orcid.org/0000-0001-6082-6961"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Swarup Bhunia","raw_affiliation_strings":["Department of EECS, Spain"],"affiliations":[{"raw_affiliation_string":"Department of EECS, Spain","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031161187","display_name":"Kaushik Roy","orcid":"https://orcid.org/0009-0002-3375-2877"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kaushik Roy","raw_affiliation_strings":["Department of EECS, Spain"],"affiliations":[{"raw_affiliation_string":"Department of EECS, Spain","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5039442844"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.077,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.80611636,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6572070121765137},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.6402939558029175},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5808030366897583},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5378280282020569},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5238311886787415},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5011632442474365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49781131744384766},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4883136451244354},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.48152145743370056},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.42798614501953125},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.4152563512325287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2998170256614685},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.20630037784576416},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13832780718803406}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6572070121765137},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.6402939558029175},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5808030366897583},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5378280282020569},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5238311886787415},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5011632442474365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49781131744384766},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4883136451244354},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.48152145743370056},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.42798614501953125},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.4152563512325287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2998170256614685},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.20630037784576416},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13832780718803406},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2007.4437659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437659","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.717.2917","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.717.2917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://engr.case.edu/bhunia_swarup/papers/IC/IC9.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1593040151","https://openalex.org/W1970285553","https://openalex.org/W2008926433","https://openalex.org/W2022590186","https://openalex.org/W2035894108","https://openalex.org/W2058427998","https://openalex.org/W2104208957","https://openalex.org/W2104677471","https://openalex.org/W2111670167","https://openalex.org/W2116295078","https://openalex.org/W2116577718","https://openalex.org/W2117648153","https://openalex.org/W2122846829","https://openalex.org/W2123009614","https://openalex.org/W2123021960","https://openalex.org/W2125157415","https://openalex.org/W2126564504","https://openalex.org/W2131424655","https://openalex.org/W2131862714","https://openalex.org/W2134292769","https://openalex.org/W2134958999","https://openalex.org/W2136103183","https://openalex.org/W2146018705","https://openalex.org/W2149342513","https://openalex.org/W2150526221","https://openalex.org/W2151998436","https://openalex.org/W2156716091","https://openalex.org/W2158705165","https://openalex.org/W2159361123","https://openalex.org/W2160892073","https://openalex.org/W2161329778","https://openalex.org/W2161859753","https://openalex.org/W2166777727","https://openalex.org/W2168101540","https://openalex.org/W3150786143","https://openalex.org/W4236432903","https://openalex.org/W4236674018","https://openalex.org/W4250899749","https://openalex.org/W4253385164","https://openalex.org/W4254323093","https://openalex.org/W6652676705","https://openalex.org/W6678664461","https://openalex.org/W6678675210","https://openalex.org/W6681979597","https://openalex.org/W6682594276","https://openalex.org/W6683424394","https://openalex.org/W6683521617","https://openalex.org/W7111183471"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W2132255345"],"abstract_inverted_index":{"In":[0,133],"the":[1,33,38,75],"nanometer":[2],"technology":[3],"regime,":[4],"power":[5,24,30,79,165],"dissipation":[6],"and":[7,43,53,70,80,83,91,111,123,129,143,151],"process":[8],"parameter":[9],"variations":[10,36,47],"have":[11,64,94],"emerged":[12],"as":[13],"major":[14,141],"design":[15,62,145],"considerations.":[16],"These":[17],"problems":[18],"continue":[19],"to":[20,56,73,120,158],"grow":[21],"with":[22,78],"leakage":[23],"becoming":[25],"a":[26,118],"dominant":[27],"form":[28],"of":[29,140,155],"consumption.":[31],"On":[32],"other":[34],"hand,":[35],"in":[37,48,58],"device":[39],"parameters,":[40],"both":[41,68],"systematic":[42],"random,":[44],"translate":[45],"into":[46],"circuit":[49],"parameters":[50],"like":[51],"delay":[52,101],"leakage,":[54],"leading":[55],"loss":[57],"parametric":[59,109],"yield.":[60],"Numerous":[61],"techniques":[63],"been":[65],"investigated":[66],"for":[67,97,127],"logic":[69],"memory":[71],"circuits":[72],"address":[74],"growing":[76],"issues":[77,150],"variations.":[81,132],"Low-power":[82],"process-tolerant":[84],"designs,":[85],"however,":[86],"impose":[87],"new":[88],"test":[89,98,122,149],"challenges":[90],"may":[92],"even":[93,112],"conflicting":[95],"requirements":[96],"-":[99],"affecting":[100],"fault":[102],"coverage,":[103],"I":[104],"<sub":[105],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[106],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDQ</sub>":[107],"testability,":[108],"yield,":[110,124],"stuck-at":[113],"tests.":[114],"Hence,":[115],"there":[116],"is":[117],"need":[119],"consider":[121],"while":[125,162],"designing":[126],"low-power":[128,142],"robustness":[130],"under":[131],"this":[134],"paper,":[135],"we":[136],"provide":[137],"an":[138],"overview":[139],"variation-tolerant":[144],"techniques;":[146],"discuss":[147],"related":[148],"focus":[152],"on":[153],"effectiveness":[154],"self-calibration/self-repair":[156],"solutions":[157],"maintain":[159],"high":[160],"yield":[161],"achieving":[163],"low":[164],"dissipation.":[166]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}