{"id":"https://openalex.org/W2138284668","doi":"https://doi.org/10.1109/test.2007.4437634","title":"California scan architecture for high quality and low power testing","display_name":"California scan architecture for high quality and low power testing","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2138284668","doi":"https://doi.org/10.1109/test.2007.4437634","mag":"2138284668"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437634","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437634","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075192063","display_name":"Kyoung Youn Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kyoung Youn Cho","raw_affiliation_strings":["Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Subhasish Mitra","raw_affiliation_strings":["Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054077540","display_name":"E.J. McCluskey","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward J. McCluskey","raw_affiliation_strings":["Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Stanford Univ., Stanford, CA#TAB#","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5075192063"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":3.5009,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.92651421,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.6846901178359985},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5971665382385254},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5458638072013855},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42505067586898804},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37798070907592773},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18284350633621216},{"id":"https://openalex.org/keywords/history","display_name":"History","score":0.10728693008422852},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.059361934661865234}],"concepts":[{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.6846901178359985},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5971665382385254},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5458638072013855},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42505067586898804},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37798070907592773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18284350633621216},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.10728693008422852},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.059361934661865234},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2007.4437634","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437634","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.120.1157","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.120.1157","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://crc.stanford.edu/crc_papers/kycho_csa.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W163565842","https://openalex.org/W1491971472","https://openalex.org/W1528223898","https://openalex.org/W1557475698","https://openalex.org/W1557977552","https://openalex.org/W1604154703","https://openalex.org/W1690611602","https://openalex.org/W1902443706","https://openalex.org/W2004437077","https://openalex.org/W2066974842","https://openalex.org/W2102556246","https://openalex.org/W2103935412","https://openalex.org/W2108103162","https://openalex.org/W2118744758","https://openalex.org/W2122643352","https://openalex.org/W2124618076","https://openalex.org/W2126641963","https://openalex.org/W2127745713","https://openalex.org/W2133640956","https://openalex.org/W2136534898","https://openalex.org/W2137098997","https://openalex.org/W2139234345","https://openalex.org/W2143154265","https://openalex.org/W2149211345","https://openalex.org/W2153705063","https://openalex.org/W2160621850","https://openalex.org/W2171908682","https://openalex.org/W2888824071","https://openalex.org/W6651354974","https://openalex.org/W6675373693","https://openalex.org/W6680053043"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"scan":[4,60,64],"architecture-California":[5],"scan-that":[6],"achieves":[7],"high":[8],"quality":[9],"and":[10],"low":[11],"power":[12],"testing":[13],"by":[14,37],"modifying":[15],"test":[16,20,34],"patterns":[17,35,45,66,71],"in":[18,32],"the":[19,30,33,52,59,63,77],"application":[21],"process.":[22],"The":[23],"architecture":[24],"is":[25],"feasible":[26],"because":[27],"most":[28],"of":[29],"bits":[31,49],"generated":[36],"ATPG":[38],"tools":[39],"are":[40,67,74],"don\u2019t-care":[41,48],"bits.":[42],"Scan":[43],"shift-in":[44,61,65],"have":[46],"their":[47],"assigned":[50],"using":[51],"repeat-fill":[53],"technique,":[54],"reducing":[55],"switching":[56],"activity":[57],"during":[58],"operation;":[62],"altered":[68],"to":[69,76],"toggle-fill":[70],"when":[72],"they":[73],"applied":[75],"combinational":[78],"logic,":[79],"improving":[80],"defect.":[81]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}