{"id":"https://openalex.org/W2125014350","doi":"https://doi.org/10.1109/test.2007.4437632","title":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing","display_name":"A novel scheme to reduce power supply noise for high-quality at-speed scan testing","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2125014350","doi":"https://doi.org/10.1109/test.2007.4437632","mag":"2125014350"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437632","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://kyutech.repo.nii.ac.jp/records/6377","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan","Kyushu Institute of Technology Iizuka"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Kyushu Institute of Technology Iizuka","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079877073","display_name":"Kohei Miyase","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kohei Miyase","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seiji Kajihara","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103487107","display_name":"Tatsuya Suzuki","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuya Suzuki","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113798957","display_name":"Yuta Yamato","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Yamato","raw_affiliation_strings":["Kyushu Institute of Technology, Iizuka, Japan"],"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology, Iizuka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["L.I.R.M.M, Montpellier, France","LIRMM, 161 rue Ada, 34392 Montpellier cedex 05, France"],"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, 161 rue Ada, 34392 Montpellier cedex 05, France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025270674","display_name":"Yuji Ohsumi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuji Ohsumi","raw_affiliation_strings":["Hibikino R&D Center, DNP Company Limited, Kitakyushu, Japan"],"affiliations":[{"raw_affiliation_string":"Hibikino R&D Center, DNP Company Limited, Kitakyushu, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109249989","display_name":"Laung\u2010Terng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laung-Terng Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, CA, USA","SynTest Technologies, Inc., 505 S. Pastoria Ave., Sunnyvale, CA 94086, USA"],"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]},{"raw_affiliation_string":"SynTest Technologies, Inc., 505 S. Pastoria Ave., Sunnyvale, CA 94086, USA","institution_ids":["https://openalex.org/I4210107885"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5084697545"],"corresponding_institution_ids":["https://openalex.org/I207014233"],"apc_list":null,"apc_paid":null,"fwci":9.2296,"has_fulltext":true,"cited_by_count":78,"citation_normalized_percentile":{"value":0.98076739,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8225846290588379},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6803537011146545},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6710993051528931},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6554915308952332},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6133034825325012},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5965001583099365},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5655434131622314},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4752098023891449},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4525255262851715},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4446149468421936},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.441643625497818},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4166707992553711},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40840280055999756},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3826858401298523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27169209718704224},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20216000080108643},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.0945272147655487}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8225846290588379},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6803537011146545},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6710993051528931},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6554915308952332},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6133034825325012},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5965001583099365},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5655434131622314},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4752098023891449},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4525255262851715},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4446149468421936},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.441643625497818},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4166707992553711},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40840280055999756},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3826858401298523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27169209718704224},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20216000080108643},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0945272147655487},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/test.2007.4437632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437632","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349198","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6377","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"journal article"},{"id":"pmh:oai:HAL:lirmm-00195682v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00195682","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ITC 2007 - IEEE International Test Conference, Oct 2007, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2007.4437632⟩","raw_type":"Conference papers"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:00006377","is_oa":false,"landing_page_url":"http://hdl.handle.net/10228/00007587","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"AM"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349198","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6377","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"journal article"},"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1496730449","https://openalex.org/W1557977552","https://openalex.org/W1568407911","https://openalex.org/W1575729896","https://openalex.org/W1788608581","https://openalex.org/W1843801354","https://openalex.org/W1849928240","https://openalex.org/W1900996732","https://openalex.org/W1914799182","https://openalex.org/W1966348745","https://openalex.org/W2000179366","https://openalex.org/W2054283397","https://openalex.org/W2084000806","https://openalex.org/W2100925694","https://openalex.org/W2110232289","https://openalex.org/W2119691242","https://openalex.org/W2120349980","https://openalex.org/W2127888903","https://openalex.org/W2128426877","https://openalex.org/W2136680550","https://openalex.org/W2140939511","https://openalex.org/W2144898259","https://openalex.org/W2152042493","https://openalex.org/W2154695555","https://openalex.org/W2155202144","https://openalex.org/W2162547872","https://openalex.org/W2165516518","https://openalex.org/W2168670003","https://openalex.org/W3146045665","https://openalex.org/W3147331103","https://openalex.org/W4229941905","https://openalex.org/W6638963392","https://openalex.org/W6671659936","https://openalex.org/W6675222231","https://openalex.org/W6679258099","https://openalex.org/W6680497249","https://openalex.org/W6682745589","https://openalex.org/W6683598130","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W2021253405","https://openalex.org/W2323083271","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2408214455","https://openalex.org/W2118133071","https://openalex.org/W2128148266"],"abstract_inverted_index":{"High-quality":[0],"at-speed":[1],"scan":[2],"testing,":[3],"characterized":[4],"by":[5,36,82],"high":[6,14,37],"small-delay-defect":[7],"detecting":[8],"capability,":[9],"is":[10,24,102],"indispensable":[11],"to":[12,26,30,122],"achieve":[13],"delay":[15,73,79,132],"test":[16,58,74,80,133,135],"quality":[17,81],"for":[18,89,107],"DSM":[19],"circuits.":[20],"However,":[21],"such":[22],"testing":[23],"susceptible":[25],"yield":[27],"loss":[28],"due":[29],"excessive":[31],"power":[32,125],"supply":[33,126],"noise":[34],"caused":[35],"launch-induced":[38,109],"switching":[39,110],"activity.":[40,111],"This":[41,112],"paper":[42],"addresses":[43],"this":[44],"serious":[45],"problem":[46],"with":[47],"a":[48,57,70],"novel":[49],"and":[50,92,105,140],"practical":[51],"post-ATPG":[52],"X-filling":[53,95],"scheme,":[54],"featuring":[55],"(1)":[56],"relaxation":[59],"method,":[60,96],"called":[61,97],"path":[62],"keeping":[63,83],"X-identification,":[64],"that":[65,101],"finds":[66],"don't-care":[67],"bits":[68],"from":[69],"fully-specified":[71],"transition":[72],"set":[75],"while":[76],"preserving":[77],"its":[78],"the":[84],"longest":[85],"paths":[86],"originally":[87],"sensitized":[88],"fault":[90],"detection,":[91],"(2)":[93],"an":[94],"justification-probability-based":[98],"fill":[99],"(JP-fill),":[100],"both":[103],"effective":[104],"scalable":[106],"reducing":[108],"scheme":[113],"can":[114],"be":[115],"easily":[116],"implemented":[117],"into":[118],"any":[119,129],"ATPG":[120],"flow":[121],"effectively":[123],"reduce":[124],"noise,":[127],"without":[128],"impact":[130],"on":[131],"quality,":[134],"data":[136],"volume,":[137],"area":[138],"overhead,":[139],"circuit":[141],"timing.":[142]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":4}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}