{"id":"https://openalex.org/W2128134926","doi":"https://doi.org/10.1109/test.2007.4437570","title":"New methods for receiver internal jitter measurement","display_name":"New methods for receiver internal jitter measurement","publication_year":2007,"publication_date":"2007-01-01","ids":{"openalex":"https://openalex.org/W2128134926","doi":"https://doi.org/10.1109/test.2007.4437570","mag":"2128134926"},"language":"en","primary_location":{"id":"doi:10.1109/test.2007.4437570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437570","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013283475","display_name":"Mike P. Li","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mike P. Li","raw_affiliation_strings":["Wavecrest Corporation, San Jose, CA, USA","Wavecrest Corp., San Jose, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wavecrest Corporation, San Jose, CA, USA","institution_ids":[]},{"raw_affiliation_string":"Wavecrest Corp., San Jose, CA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100634411","display_name":"Jinhua Chen","orcid":"https://orcid.org/0000-0003-4801-3233"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jinhua Chen","raw_affiliation_strings":["EMC Corporation, Hopkinton, MA, USA","EMC Corporation, 176 South Street, Hopkinton, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EMC Corporation, Hopkinton, MA, USA","institution_ids":[]},{"raw_affiliation_string":"EMC Corporation, 176 South Street, Hopkinton, MA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7961,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.86026281,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9765751957893372},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6290854811668396},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.48543936014175415},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.4658642113208771},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4239910840988159},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3579435348510742},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2128935158252716},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14315760135650635},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13203030824661255},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.06007269024848938}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9765751957893372},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6290854811668396},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.48543936014175415},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.4658642113208771},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4239910840988159},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3579435348510742},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2128935158252716},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14315760135650635},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13203030824661255},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.06007269024848938},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2007.4437570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2007.4437570","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1503474925","https://openalex.org/W1544623790","https://openalex.org/W1580873078","https://openalex.org/W1730451159","https://openalex.org/W1785068227","https://openalex.org/W1870817321","https://openalex.org/W1933111953","https://openalex.org/W2096484673","https://openalex.org/W2119768837","https://openalex.org/W2121182846","https://openalex.org/W2124283149","https://openalex.org/W2126574816","https://openalex.org/W2130590045","https://openalex.org/W2135729931","https://openalex.org/W2147586450","https://openalex.org/W2160236891","https://openalex.org/W2161207291","https://openalex.org/W2162364319","https://openalex.org/W2490904451"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W3095633856","https://openalex.org/W2343144621"],"abstract_inverted_index":{"We":[0,67],"have":[1,47,55,68],"developed":[2],"three":[3],"receiver":[4,32,42],"internal":[5,33],"deterministic":[6],"jitter":[7,11,27],"(DJ)":[8],"and":[9,35,44,52,58],"random":[10],"(RJ)":[12],"measurement":[13],"methods":[14,63],"through":[15],"external":[16],"DJ":[17,34,43],"stressing,":[18,20],"RJ":[19,36,45],"or":[21],"sampling":[22],"time":[23,80],"shifting.":[24],"High":[25],"throughput":[26],"tolerance":[28],"tests":[29],"utilizing":[30],"the":[31,59,62,90],"are":[37],"presented.":[38],"Analytical":[39],"formulas":[40],"for":[41,61],"estimation":[46],"been":[48,56,65],"developed.":[49],"Relevant":[50],"simulations":[51],"laboratory":[53],"experiments":[54],"conducted":[57],"validity":[60],"has":[64],"verified.":[66],"also":[69],"shown":[70],"that":[71],"a":[72,85],"6":[73],"orders":[74],"of":[75],"magnitude":[76],"reduction":[77],"in":[78],"test":[79],"can":[81],"be":[82],"achieved":[83],"with":[84,89],"good":[86],"statistical":[87],"confidence":[88],"proposed":[91],"methods.":[92]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}