{"id":"https://openalex.org/W2114176791","doi":"https://doi.org/10.1109/test.2006.297628","title":"Testing of Precision DACs Using Low-Resolution ADCs with Dithering","display_name":"Testing of Precision DACs Using Low-Resolution ADCs with Dithering","publication_year":2006,"publication_date":"2006-10-01","ids":{"openalex":"https://openalex.org/W2114176791","doi":"https://doi.org/10.1109/test.2006.297628","mag":"2114176791"},"language":"en","primary_location":{"id":"doi:10.1109/test.2006.297628","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297628","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112171934","display_name":"Le Jin","orcid":"https://orcid.org/0009-0000-9622-1526"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Le Jin","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108509426","display_name":"Hosam Haggag","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hosam Haggag","raw_affiliation_strings":["National Semiconductor Corporation, Santa Clara, CA, USA","National Semiconductor Corporation, Santa Clara, CA 95052"],"affiliations":[{"raw_affiliation_string":"National Semiconductor Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"National Semiconductor Corporation, Santa Clara, CA 95052","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108357375","display_name":"R.L. Geiger","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randall Geiger","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"[Department of Electrical and Computer Engineering, Iowa State University, Ames, IA 50011]","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5112171934"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":2.7874,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.90361191,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.8909018635749817},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.7441693544387817},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6831018328666687},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5856899619102478},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4743541479110718},{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.4531037509441376},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19525563716888428},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.13764944672584534},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.1324036717414856},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.0765952467918396}],"concepts":[{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.8909018635749817},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.7441693544387817},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6831018328666687},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5856899619102478},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4743541479110718},{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.4531037509441376},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19525563716888428},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.13764944672584534},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.1324036717414856},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.0765952467918396}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2006.297628","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2006.297628","pdf_url":null,"source":{"id":"https://openalex.org/S4210209697","display_name":"Proceedings/Proceedings - International Test Conference","issn_l":"1089-3539","issn":["1089-3539","2378-2250"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2072739057","https://openalex.org/W2144615663","https://openalex.org/W2145780891","https://openalex.org/W2153223218","https://openalex.org/W2160322785","https://openalex.org/W2176122793"],"related_works":["https://openalex.org/W2359588884","https://openalex.org/W2082107524","https://openalex.org/W4390187725","https://openalex.org/W2953726986","https://openalex.org/W2619813440","https://openalex.org/W2997838140","https://openalex.org/W2811080238","https://openalex.org/W1737812324","https://openalex.org/W2101363100","https://openalex.org/W2760143382"],"abstract_inverted_index":{"The":[0],"bottleneck":[1],"of":[2,14,35,101,117,145],"DAC":[3,91],"testing":[4,13,34,49,92,149],"is":[5,21,27,56,63,71],"the":[6,74,87,98,139,143,146],"fast":[7],"and":[8,25,67,89,114,133],"accurate":[9],"measurement":[10],"devices.":[11],"Production":[12],"high-resolution":[15,50,150],"DACs":[16,37,104,151],"with":[17,58,126],"gigahertz":[18],"clock":[19],"rates":[20],"a":[22,45,82],"challenging":[23],"problem,":[24],"there":[26],"no":[28],"widely":[29],"adopted":[30],"approach":[31,47],"for":[32,48],"on-chip":[33,90],"precision":[36],"in":[38,138,148],"an":[39],"SoC":[40],"system.":[41],"This":[42,79],"work":[43],"presents":[44],"new":[46],"DACs.":[51],"High":[52],"speed":[53],"data":[54,76],"acquisition":[55],"achieved":[57],"flash":[59],"ADCs;":[60],"sufficient":[61],"resolution":[62],"provided":[64],"by":[65,73],"dithering;":[66],"high":[68],"test":[69],"accuracy":[70],"guaranteed":[72],"proposed":[75],"processing":[77],"algorithm.":[78],"method":[80],"provides":[81],"potential":[83],"solution":[84],"to":[85,108],"both":[86],"production":[88],"problems.":[93],"Simulation":[94],"results":[95,136],"show":[96],"that":[97],"static":[99],"linearity":[100],"14":[102],"bit":[103],"can":[105,123],"be":[106,124],"tested":[107,125],"better":[109],"than":[110,119],"1":[111,127],"LSB":[112],"accuracy,":[113,129],"dynamic":[115],"performance":[116,144],"more":[118],"85":[120],"dB":[121,128],"SFDR":[122],"using":[130,152],"6-bit":[131,153],"ADCs":[132,154],"dithering.":[134],"Experimental":[135],"included":[137],"paper":[140],"also":[141],"affirm":[142],"algorithm":[147]},"counts_by_year":[{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}