{"id":"https://openalex.org/W2121932636","doi":"https://doi.org/10.1109/test.2005.1584096","title":"How are we going to test socs on a board? the users viewpoint","display_name":"How are we going to test socs on a board? the users viewpoint","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2121932636","doi":"https://doi.org/10.1109/test.2005.1584096","mag":"2121932636"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101780634","display_name":"Gunnar Carlsson","orcid":"https://orcid.org/0000-0002-0591-5475"},"institutions":[{"id":"https://openalex.org/I1306339040","display_name":"Ericsson (Sweden)","ror":"https://ror.org/05a7rhx54","country_code":"SE","type":"company","lineage":["https://openalex.org/I1306339040"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"G. Carlsson","raw_affiliation_strings":["Ericsson, Stockholm, Sweden","Ericsson, Stockholm"],"affiliations":[{"raw_affiliation_string":"Ericsson, Stockholm, Sweden","institution_ids":["https://openalex.org/I1306339040"]},{"raw_affiliation_string":"Ericsson, Stockholm","institution_ids":["https://openalex.org/I1306339040"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101780634"],"corresponding_institution_ids":["https://openalex.org/I1306339040"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14585319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1263","last_page":"1263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7463997602462769},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7161136865615845},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6814088225364685},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6416348218917847},{"id":"https://openalex.org/keywords/perspective","display_name":"Perspective (graphical)","score":0.5584121346473694},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5062310099601746},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.49778056144714355},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.46529993414878845},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4139920771121979},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3761904239654541},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2573097348213196},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2488158941268921},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22911080718040466},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08688661456108093}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7463997602462769},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7161136865615845},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6814088225364685},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6416348218917847},{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.5584121346473694},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5062310099601746},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.49778056144714355},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.46529993414878845},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4139920771121979},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3761904239654541},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2573097348213196},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2488158941268921},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22911080718040466},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08688661456108093},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1584096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1978339999","https://openalex.org/W2068239131","https://openalex.org/W2502691491","https://openalex.org/W2360400548","https://openalex.org/W3142211975","https://openalex.org/W2384601745","https://openalex.org/W2537171119","https://openalex.org/W1879443270","https://openalex.org/W2018912978","https://openalex.org/W2367495590"],"abstract_inverted_index":{"This":[0],"article":[1],"provides":[2],"an":[3],"overview":[4],"on":[5,7],"SoC's":[6],"board":[8],"testing.":[9],"It":[10],"discusses":[11],"the":[12],"topic":[13],"of":[14],"life":[15],"cycle":[16],"perspective,":[17],"efficient":[18],"test":[19,23,30],"required,":[20],"re-use":[21],"challenges,":[22],"access":[24],"and":[25,34,36],"control,":[26],"SoC":[27],"DFT":[28,32],"architecture,":[29],"sequencing,":[31],"support,":[33],"debug":[35],"diagnosis":[37],"support":[38]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}