{"id":"https://openalex.org/W2098373491","doi":"https://doi.org/10.1109/test.2005.1584091","title":"An advanced optical diagnostic technique of IBM z990 eserver microprocessor","display_name":"An advanced optical diagnostic technique of IBM z990 eserver microprocessor","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2098373491","doi":"https://doi.org/10.1109/test.2005.1584091","mag":"2098373491"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584091","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584091","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080343787","display_name":"Peilin Song","orcid":"https://orcid.org/0000-0003-4793-3230"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Peilin Song","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043549704","display_name":"Franco Stellari","orcid":"https://orcid.org/0000-0002-1510-6882"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Stellari","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065452690","display_name":"Bill Huott","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Huott","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082687228","display_name":"O.C. Wagner","orcid":"https://orcid.org/0009-0003-7967-7785"},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Wagner","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110193257","display_name":"Uma Srinivasan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"U. Srinivasan","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111598082","display_name":"Y.H. Chan","orcid":"https://orcid.org/0009-0004-4911-4233"},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuen Chan","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083195558","display_name":"Richard Rizzolo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Rizzolo","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023011542","display_name":"Hye-Jin Nam","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.J. Nam","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109862358","display_name":"J.P. Eckhardt","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Eckhardt","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030724834","display_name":"T. G. McNamara","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. McNamara","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077742796","display_name":"Ching-Lung Tong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ching-Lung Tong","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088957863","display_name":"Alan J. Weger","orcid":"https://orcid.org/0000-0001-8557-9573"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Weger","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111368336","display_name":"M. McManus","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091433","display_name":"Poughkeepsie Public Library District","ror":"https://ror.org/001vaag74","country_code":"US","type":"archive","lineage":["https://openalex.org/I4210091433"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. McManus","raw_affiliation_strings":["IBM Server and Technology Group, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Server and Technology Group, Poughkeepsie, NY, USA","institution_ids":["https://openalex.org/I4210091433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5080343787"],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":0.3761,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.66212907,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"c 17","issue":null,"first_page":"1227","last_page":"1235"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.6828681230545044},{"id":"https://openalex.org/keywords/turnaround-time","display_name":"Turnaround time","score":0.6614909768104553},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6266894936561584},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5595332980155945},{"id":"https://openalex.org/keywords/picosecond","display_name":"Picosecond","score":0.5055460929870605},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.44628071784973145},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.42547959089279175},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37607988715171814},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.372233510017395},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34674519300460815},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2846657335758209},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.20111608505249023},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.17414334416389465},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.16471818089485168},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1447199285030365},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13789698481559753},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11203926801681519}],"concepts":[{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.6828681230545044},{"id":"https://openalex.org/C176553487","wikidata":"https://www.wikidata.org/wiki/Q7855819","display_name":"Turnaround time","level":2,"score":0.6614909768104553},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6266894936561584},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5595332980155945},{"id":"https://openalex.org/C55005982","wikidata":"https://www.wikidata.org/wiki/Q3902709","display_name":"Picosecond","level":3,"score":0.5055460929870605},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.44628071784973145},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.42547959089279175},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37607988715171814},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.372233510017395},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34674519300460815},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2846657335758209},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.20111608505249023},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17414334416389465},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16471818089485168},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1447199285030365},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13789698481559753},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11203926801681519},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1584091","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584091","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W197391467","https://openalex.org/W1554885925","https://openalex.org/W1835662651","https://openalex.org/W2021463588","https://openalex.org/W2037589385","https://openalex.org/W2044741679","https://openalex.org/W2045210162","https://openalex.org/W2050497189","https://openalex.org/W2057759815","https://openalex.org/W2074193689","https://openalex.org/W2076228782","https://openalex.org/W2084840978","https://openalex.org/W2107944635","https://openalex.org/W2110731889","https://openalex.org/W2114764949","https://openalex.org/W2120148078","https://openalex.org/W2123072391","https://openalex.org/W2134174349","https://openalex.org/W2137767913","https://openalex.org/W2139664386","https://openalex.org/W2153985887","https://openalex.org/W2155038322","https://openalex.org/W2157200201","https://openalex.org/W2398864122","https://openalex.org/W3109328898","https://openalex.org/W3114947303","https://openalex.org/W4233557740","https://openalex.org/W4302458519","https://openalex.org/W6661841123","https://openalex.org/W6677106919","https://openalex.org/W6786299019","https://openalex.org/W6787605885"],"related_works":["https://openalex.org/W1992029172","https://openalex.org/W2605582854","https://openalex.org/W3126131865","https://openalex.org/W4309344469","https://openalex.org/W2909143164","https://openalex.org/W2131830066","https://openalex.org/W2291191244","https://openalex.org/W2993954431","https://openalex.org/W2044344400","https://openalex.org/W4253186488"],"abstract_inverted_index":{"In":[0],"this":[1,127],"paper,":[2],"we":[3],"describe":[4],"an":[5],"advanced":[6],"optical":[7],"diagnostic":[8,26,31,67,104],"technique":[9,128],"used":[10,120],"for":[11,106],"diagnosing":[12],"the":[13,34,60,66,93,109,123],"IBM":[14],"z990":[15],"eServer":[16],"microprocessor":[17],"(Slegel":[18],"et":[19],"al.,":[20],"2004).":[21],"Time-to-market":[22],"pressure":[23],"demands":[24],"quick":[25],"turnaround":[27],"time":[28],"and":[29,42,53,87],"high":[30,94],"resolution":[32],"while":[33],"ever":[35],"increasing":[36],"design":[37],"complexity,":[38],"density,":[39],"cycle":[40],"time,":[41],"shrinking":[43],"technologies":[44],"dramatically":[45],"add":[46],"difficulties":[47],"to":[48,63,75,121],"diagnostics.":[49],"Although":[50],"design-for-test":[51],"(DFT)":[52],"design-for-diagnostics":[54],"(DFD)":[55],"features":[56],"are":[57],"implemented":[58],"in":[59],"latest":[61],"microprocessors":[62],"help":[64],"easing":[65],"efforts,":[68],"they":[69],"may":[70],"still":[71],"not":[72],"be":[73,119],"sufficient":[74],"diagnose":[76],"certain":[77],"fails.":[78],"The":[79],"well-known":[80],"picosecond":[81],"imaging":[82],"circuit":[83],"analysis":[84],"(PICA)":[85],"(Kash":[86],"Tsang,":[88],"1997)":[89],"tool,":[90],"equipped":[91],"with":[92],"quantum":[95],"efficiency":[96],"superconducting":[97],"single-photon":[98],"detector":[99],"(SSPD,)":[100],"shows":[101],"a":[102,113],"unique":[103,124],"capability":[105],"optically":[107],"probing":[108],"internal":[110],"nodes":[111],"of":[112,126],"chip.":[114],"Several":[115],"hard-to-diagnose":[116],"examples":[117],"will":[118],"demonstrate":[122],"capabilities":[125]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}