{"id":"https://openalex.org/W2125605633","doi":"https://doi.org/10.1109/test.2005.1584087","title":"A test point selection method for data cconverters using rademacher functions and wavelet transforms","display_name":"A test point selection method for data cconverters using rademacher functions and wavelet transforms","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2125605633","doi":"https://doi.org/10.1109/test.2005.1584087","mag":"2125605633"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584087","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584087","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078164892","display_name":"C. Carter","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Carter","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024557589","display_name":"Simon S. Ang","orcid":"https://orcid.org/0000-0002-6125-8086"},"institutions":[{"id":"https://openalex.org/I78715868","display_name":"University of Arkansas at Fayetteville","ror":"https://ror.org/05jbt9m15","country_code":"US","type":"education","lineage":["https://openalex.org/I78715868"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Ang","raw_affiliation_strings":["University of Arkansas, Fayetteville, AR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Arkansas, Fayetteville, AR, USA","institution_ids":["https://openalex.org/I78715868"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"43","issue":null,"first_page":"1192","last_page":"1201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9835000038146973,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9828000068664551,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.8290396928787231},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6029874682426453},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5973345041275024},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5838499665260315},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.5541641712188721},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.5446301698684692},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.44920670986175537},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.44629815220832825},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.43794816732406616},{"id":"https://openalex.org/keywords/fixed-point-arithmetic","display_name":"Fixed-point arithmetic","score":0.43279391527175903},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4200047552585602},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29658204317092896},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2917903661727905},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.28897297382354736},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.12916874885559082},{"id":"https://openalex.org/keywords/floating-point","display_name":"Floating point","score":0.12838777899742126},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0976000726222992}],"concepts":[{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.8290396928787231},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6029874682426453},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5973345041275024},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5838499665260315},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.5541641712188721},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.5446301698684692},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.44920670986175537},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.44629815220832825},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.43794816732406616},{"id":"https://openalex.org/C163973906","wikidata":"https://www.wikidata.org/wiki/Q649900","display_name":"Fixed-point arithmetic","level":3,"score":0.43279391527175903},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4200047552585602},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29658204317092896},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2917903661727905},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.28897297382354736},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.12916874885559082},{"id":"https://openalex.org/C84211073","wikidata":"https://www.wikidata.org/wiki/Q117879","display_name":"Floating point","level":2,"score":0.12838777899742126},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0976000726222992},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1584087","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584087","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W574370508","https://openalex.org/W2136522424","https://openalex.org/W2158174394"],"related_works":["https://openalex.org/W2158491338","https://openalex.org/W2807901368","https://openalex.org/W2133733652","https://openalex.org/W2072658171","https://openalex.org/W2606392311","https://openalex.org/W2320042380","https://openalex.org/W4385956668","https://openalex.org/W2900895161","https://openalex.org/W4380838366","https://openalex.org/W2354856110"],"abstract_inverted_index":{"A":[0],"new":[1],"test":[2,17,23],"method":[3,24],"of":[4,15],"linearity":[5,34],"errors":[6],"for":[7,37],"data":[8,39],"converters":[9],"is":[10],"presented.":[11],"Based":[12],"in":[13],"principle":[14],"the":[16,38],"point":[18],"selection":[19],"(NIST)":[20],"method,":[21],"this":[22],"combines":[25],"Rademacher":[26],"functions":[27],"and":[28,47,53],"wavelet":[29],"transforms":[30],"to":[31,55],"create":[32],"a":[33,48],"error":[35],"model":[36],"converter.":[40],"Test":[41],"results":[42],"from":[43],"an":[44],"analog-to-digital":[45],"converter":[46,50],"digital-to-analog":[49],"are":[51],"presented":[52],"compared":[54],"other":[56],"reported":[57],"methods.":[58]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}