{"id":"https://openalex.org/W2099376852","doi":"https://doi.org/10.1109/test.2005.1584085","title":"Analysis of pseudo-interleaving AWG","display_name":"Analysis of pseudo-interleaving AWG","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2099376852","doi":"https://doi.org/10.1109/test.2005.1584085","mag":"2099376852"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023026002","display_name":"Hideo Okawara","orcid":null},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]},{"id":"https://openalex.org/I4210111303","display_name":"Agilent Technologies (Japan)","ror":"https://ror.org/01xtpxr95","country_code":"JP","type":"company","lineage":["https://openalex.org/I138285227","https://openalex.org/I4210111303"]}],"countries":["JP","US"],"is_corresponding":true,"raw_author_name":"H. Okawara","raw_affiliation_strings":["Agilent Technologies International Japan Limited, Tokyo, Japan","Agilent Technol. Int. Japan Ltd., Tokyo"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies International Japan Limited, Tokyo, Japan","institution_ids":["https://openalex.org/I4210111303"]},{"raw_affiliation_string":"Agilent Technol. Int. Japan Ltd., Tokyo","institution_ids":["https://openalex.org/I138285227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5023026002"],"corresponding_institution_ids":["https://openalex.org/I138285227","https://openalex.org/I4210111303"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.14821816,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1174","last_page":"1181"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.9850674271583557},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7273415327072144},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7061073184013367},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5064002275466919},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46384838223457336},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42940133810043335},{"id":"https://openalex.org/keywords/signal-generator","display_name":"Signal generator","score":0.41561833024024963},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35777854919433594},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14565151929855347},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12584513425827026},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.1181277334690094},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.07939973473548889}],"concepts":[{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.9850674271583557},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7273415327072144},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7061073184013367},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5064002275466919},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46384838223457336},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42940133810043335},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.41561833024024963},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35777854919433594},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14565151929855347},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12584513425827026},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.1181277334690094},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.07939973473548889},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1584085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3128433826","https://openalex.org/W2168529281","https://openalex.org/W978543704","https://openalex.org/W2378673986","https://openalex.org/W2371180536","https://openalex.org/W2387706796","https://openalex.org/W2391206061","https://openalex.org/W2385502811","https://openalex.org/W2978914987","https://openalex.org/W2027674118"],"abstract_inverted_index":{"Testing":[0],"of":[1,39,69,73,114,124,137,182],"a":[2,27,42,78,89,101,106,112,120,125,143],"read":[3,23],"channel":[4],"for":[5,22,190],"hard":[6],"disk":[7],"drives":[8],"(HDD)":[9],"requires":[10],"an":[11],"extremely":[12],"high-speed":[13,79,126],"arbitrary":[14],"waveform":[15],"generator":[16],"(AWG)":[17],"to":[18,31,46,61,87,142],"emulate":[19],"Lorentzian":[20,192],"waveforms":[21,193],"functional":[24],"tests.":[25],"If":[26],"sampling":[28,65],"rate":[29,38,55,66],"required":[30],"the":[32,35,40,53,70,138,154,158,175],"AWG":[33,76],"exceeds":[34],"maximum":[36],"available":[37],"instrument,":[41],"possible":[43],"solution":[44,103],"is":[45,77,84,105,111],"use":[47],"two":[48,149],"AWG's":[49,150],"together":[50],"running":[51],"at":[52],"same":[54,155],"synchronously":[56],"and":[57,134,186],"generating":[58,191],"signal":[59,116],"alternately":[60,167],"make":[62],"their":[63],"equivalent":[64],"doubled.":[67],"One":[68],"key":[71],"components":[72],"such":[74],"interleaving":[75,108,140,160,177],"analog":[80],"selector.":[81,127],"However":[82],"it":[83],"not":[85],"easy":[86],"find":[88],"good":[90],"selector":[91],"in":[92,148,180],"ultra":[93],"high":[94],"frequency":[95],"range.":[96],"An":[97],"application":[98],"note":[99],"proposes":[100],"practical":[102],"that":[104,174],"pseudo":[107,139,176],"AWG.":[109,161,170],"It":[110],"variation":[113],"traditional":[115],"combining":[117],"method":[118,156],"using":[119],"power":[121],"combiner":[122],"instead":[123],"This":[128],"paper":[129],"describes":[130],"about":[131],"performance":[132],"analysis":[133],"experimental":[135],"results":[136,172],"compared":[141],"true":[144,159],"interleaving.":[145],"Data":[146],"stored":[147],"are":[151,164],"created":[152],"with":[153],"as":[157],"The":[162,171],"data":[163],"simply":[165],"distributed":[166],"into":[168],"each":[169],"show":[173],"works":[178],"well":[179],"spite":[181],"its":[183],"simple":[184],"structure":[185],"can":[187],"be":[188],"useful":[189]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}