{"id":"https://openalex.org/W2123785008","doi":"https://doi.org/10.1109/test.2005.1584081","title":"A novel test methodology based on error-rate to support error-tolerance","display_name":"A novel test methodology based on error-rate to support error-tolerance","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2123785008","doi":"https://doi.org/10.1109/test.2005.1584081","mag":"2123785008"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102884817","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-6242-7697"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111192060","display_name":"M.A. Breuer","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.A. Breuer","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5079657769"],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":5.8535,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.96610529,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1136","last_page":"1144"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.7574472427368164},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6981915831565857},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.6354159712791443},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6238993406295776},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.605967104434967},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5234629511833191},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4934057295322418},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4830799400806427},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.48111194372177124},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45494532585144043},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4314318895339966},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4255003333091736},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42133253812789917},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4164350628852844},{"id":"https://openalex.org/keywords/upper-and-lower-bounds","display_name":"Upper and lower bounds","score":0.4143363833427429},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22004705667495728},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.17426514625549316},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14592507481575012},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13875406980514526},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1337936520576477},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09377366304397583}],"concepts":[{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.7574472427368164},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6981915831565857},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.6354159712791443},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6238993406295776},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.605967104434967},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5234629511833191},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4934057295322418},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4830799400806427},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.48111194372177124},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45494532585144043},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4314318895339966},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4255003333091736},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42133253812789917},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4164350628852844},{"id":"https://openalex.org/C77553402","wikidata":"https://www.wikidata.org/wiki/Q13222579","display_name":"Upper and lower bounds","level":2,"score":0.4143363833427429},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22004705667495728},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.17426514625549316},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14592507481575012},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13875406980514526},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1337936520576477},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09377366304397583},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1584081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1583465493","https://openalex.org/W1595368737","https://openalex.org/W1957023732","https://openalex.org/W2097325076","https://openalex.org/W2099971661"],"related_works":["https://openalex.org/W79904784","https://openalex.org/W2129713538","https://openalex.org/W2145230572","https://openalex.org/W4301628046","https://openalex.org/W2047903206","https://openalex.org/W2951627661","https://openalex.org/W2165974325","https://openalex.org/W2170587542","https://openalex.org/W2055589924","https://openalex.org/W2408214455"],"abstract_inverted_index":{"As":[0],"the":[1,9,36,77,101,134,157,165,179,183,199,220],"advance":[2],"of":[3,38,80,103,111,144,164,167,169,182,185,208],"VLSI":[4],"technology":[5],"approaches":[6],"physical":[7],"limitations,":[8],"yield":[10,79,193,229,245],"associated":[11,136],"with":[12,137,149],"high":[13],"performance":[14],"system-on-chip":[15],"(SOC)":[16],"designs":[17],"continue":[18],"to":[19,23,74,99,132,141,151,187,222],"decline.":[20],"Conventional":[21],"methodologies":[22],"address":[24],"this":[25,45,89],"problem,":[26],"such":[27,107],"as":[28,57,108],"fault-tolerance":[29],"and":[30,114,119,140,172,192],"defect-tolerance,":[31],"may":[32],"become":[33],"inadequate.":[34],"Recently,":[35],"concept":[37,184],"error-tolerance":[39,72,186],"has":[40],"drawn":[41],"much":[42],"attention.":[43],"Under":[44],"new":[46],"concept,":[47],"some":[48,63,81,250],"defective":[49],"chips":[50,82],"(or":[51],"systems)":[52],"can":[53,203,246],"still":[54],"be":[55,223,247],"labeled":[56],"acceptable,":[58],"i.e.,":[59,211],"marketable,":[60],"even":[61],"if":[62],"outputted":[64],"results":[65,161,196],"are":[66,123,130,147],"erroneous.":[67],"The":[68,225],"motivation":[69],"for":[70,249],"employing":[71],"is":[73],"significantly":[75],"increase":[76,226],"effective":[78,228,244],"when":[83],"used":[84],"in":[85,227,243],"certain":[86],"applications.":[87,251],"In":[88],"paper,":[90],"we":[91],"propose":[92],"a":[93,138,152,174,206,240],"novel":[94],"error-rate":[95,135],"based":[96],"test":[97,189,201],"methodology":[98,202],"support":[100],"notion":[102],"error-tolerance.":[104],"Several":[105],"definitions,":[106],"various":[109],"measures":[110,129],"yields,":[112],"individual-fault":[113],"system":[115,158],"error-rates,":[116],"defect":[117,121],"level":[118],"unacceptable":[120],"levels":[122],"clarified":[124],"or":[125],"redefined.":[126],"Analytically":[127],"derived":[128],"formulated":[131],"estimate":[133],"fault,":[139],"generate":[142],"lists":[143],"faults":[145,212],"that":[146,177,198,213,239],"acceptable":[148,209],"respect":[150],"specified":[153],"upper":[154],"bound":[155],"on":[156,231],"error-rate.":[159],"These":[160],"include":[162],"consideration":[163],"degree":[166],"confidence":[168],"an":[170],"estimate,":[171],"provide":[173],"theoretic":[175],"basis":[176],"enables":[178],"practical":[180],"application":[181],"both":[188],"set":[190,207],"reduction":[191],"improvement.":[194],"Experimental":[195],"show":[197,238],"proposed":[200],"easily":[204],"identify":[205],"faults,":[210],"might":[214],"occur":[215],"but":[216],"need":[217],"not":[218],"cause":[219],"part":[221],"discarded.":[224],"depends":[230],"requirements":[232],"imposed":[233],"by":[234],"end":[235],"users.":[236],"We":[237],"significant":[241],"improvement":[242],"achieved":[248]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}