{"id":"https://openalex.org/W2149095036","doi":"https://doi.org/10.1109/test.2005.1584070","title":"Transient fault characterization in dynamic noisy environments","display_name":"Transient fault characterization in dynamic noisy environments","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2149095036","doi":"https://doi.org/10.1109/test.2005.1584070","mag":"2149095036"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"I. Polian","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101995490","display_name":"John P. Hayes","orcid":"https://orcid.org/0000-0002-4747-492X"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]},{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"J.P. Hayes","raw_affiliation_strings":["Advanced Computer Architecture Laboratory, University of Michigan, Ann Arbor, MI, USA","Albert Ludwig University, Freiburg im Breisgau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computer Architecture Laboratory, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054064879","display_name":"Sandip Kundu","orcid":"https://orcid.org/0000-0001-8221-3824"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]},{"id":"https://openalex.org/I24603500","display_name":"University of Massachusetts Amherst","ror":"https://ror.org/0072zz521","country_code":"US","type":"education","lineage":["https://openalex.org/I24603500"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"S. Kundu","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany","Department of ECE, University of Massachusetts, Amherst, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Department of ECE, University of Massachusetts, Amherst, MA, USA","institution_ids":["https://openalex.org/I24603500"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Becker","raw_affiliation_strings":["Albert Ludwig University, Freiburg im Breisgau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwig University, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2788","issue":null,"first_page":"1039","last_page":"1048"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8612332344055176},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.8402152061462402},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7791546583175659},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6850036382675171},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5988937616348267},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5182856917381287},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.43572190403938293},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.43540117144584656},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36594027280807495},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.30024945735931396},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27998173236846924},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1251099407672882},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09741479158401489},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08833301067352295}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8612332344055176},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.8402152061462402},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7791546583175659},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6850036382675171},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5988937616348267},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5182856917381287},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.43572190403938293},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.43540117144584656},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36594027280807495},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.30024945735931396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27998173236846924},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1251099407672882},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09741479158401489},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08833301067352295},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2005.1584070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.84.815","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.84.815","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://ira.informatik.uni-freiburg.de/~polian/Papers/itc05.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320308269","display_name":"Alexander von Humboldt-Stiftung","ror":"https://ror.org/012kf4317"},{"id":"https://openalex.org/F4320321421","display_name":"Albert-Ludwigs-Universit\u00e4t Freiburg","ror":"https://ror.org/0245cg223"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1482321356","https://openalex.org/W1514256057","https://openalex.org/W1540573577","https://openalex.org/W1566296806","https://openalex.org/W1579674527","https://openalex.org/W1581761235","https://openalex.org/W1631356911","https://openalex.org/W1767750912","https://openalex.org/W1957023732","https://openalex.org/W1976431848","https://openalex.org/W1985238821","https://openalex.org/W2023856022","https://openalex.org/W2069270260","https://openalex.org/W2069615369","https://openalex.org/W2099083279","https://openalex.org/W2100568847","https://openalex.org/W2104122494","https://openalex.org/W2116097016","https://openalex.org/W2121395914","https://openalex.org/W2126833106","https://openalex.org/W2138111642","https://openalex.org/W2138308719","https://openalex.org/W2141068710","https://openalex.org/W2148008037","https://openalex.org/W2149394641","https://openalex.org/W2155603569","https://openalex.org/W2157685173","https://openalex.org/W2169213530","https://openalex.org/W2171908682","https://openalex.org/W2543097326","https://openalex.org/W2764347725","https://openalex.org/W3149772516","https://openalex.org/W4232345699","https://openalex.org/W4236133696","https://openalex.org/W6628790287","https://openalex.org/W6630687852","https://openalex.org/W6667807231","https://openalex.org/W6683062853"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2016851290","https://openalex.org/W2001630809","https://openalex.org/W2014796125","https://openalex.org/W4239924455","https://openalex.org/W2131408766","https://openalex.org/W1577327694","https://openalex.org/W2669128877","https://openalex.org/W1985471711","https://openalex.org/W2377879397"],"abstract_inverted_index":{"Technology":[0],"trends":[1],"are":[2,17,25,101],"increasing":[3],"the":[4,50,81,109,118],"frequency":[5],"of":[6,52,58,83,117],"serious":[7],"transient":[8,54,88,105],"(soft)":[9],"faults":[10,42],"in":[11,28,56,70],"digital":[12],"systems.":[13],"For":[14],"example,":[15],"ICs":[16],"becoming":[18],"more":[19],"susceptible":[20],"to":[21],"cosmic":[22],"radiation,":[23],"and":[24,43,64,93,108],"being":[26],"embedded":[27],"applications":[29],"with":[30],"dynamic":[31],"noisy":[32],"environments.":[33],"We":[34,47,66],"propose":[35],"a":[36,53],"generic":[37],"framework":[38],"for":[39,87,95,112],"representing":[40],"such":[41],"characterizing":[44],"them":[45],"on-line.":[46],"formally":[48],"define":[49],"impact":[51,107],"fault":[55,68,89,106,115],"terms":[57],"three":[59],"basic":[60],"parameters:":[61],"frequency,":[62],"observability":[63],"severity.":[65],"distinguish":[67],"modes":[69,116],"systems":[71],"whose":[72],"noise":[73],"environment":[74],"changes":[75],"dynamically.":[76],"Based":[77],"on":[78],"these":[79],"ideas,":[80],"problem":[82],"designing":[84],"on-line":[85],"architectures":[86],"characterization":[90],"is":[91],"formulated":[92],"analyzed":[94],"several":[96],"optimization":[97],"goals.":[98],"Finally,":[99],"experiments":[100],"described":[102],"that":[103],"determine":[104],"corresponding":[110],"tests":[111],"various":[113],"simulated":[114],"ISCAS-89":[119],"benchmark":[120],"circuits.":[121]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}