{"id":"https://openalex.org/W2165516518","doi":"https://doi.org/10.1109/test.2005.1584068","title":"Low-capture-power test generation for scan-based at-speed testing","display_name":"Low-capture-power test generation for scan-based at-speed testing","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2165516518","doi":"https://doi.org/10.1109/test.2005.1584068","mag":"2165516518"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://kyutech.repo.nii.ac.jp/records/6389","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Department of CSE, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002134266","display_name":"Yoshiyuki Yamashita","orcid":"https://orcid.org/0000-0001-6583-1209"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Yamashita","raw_affiliation_strings":["Department of CSE, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088617763","display_name":"Shohei Morishima","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Morishima","raw_affiliation_strings":["Department of CSE, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109872072","display_name":"Seiji Kajihara","orcid":null},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Kajihara","raw_affiliation_strings":["Department of CSE, Kyushu Institute of Technology, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of CSE, Kyushu Institute of Technology, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109249989","display_name":"Laung\u2010Terng Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Laung-Terng Wang","raw_affiliation_strings":["SynTest Technologies, Inc., Sunnyvale, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SynTest Technologies, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218098","display_name":"Kewal K. Saluja","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.K. Saluja","raw_affiliation_strings":["Department of ECE, University of Wisconsin, Madison, Madison, WI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, University of Wisconsin, Madison, Madison, WI, USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112205805","display_name":"K. Kinoshita","orcid":null},"institutions":[{"id":"https://openalex.org/I11381156","display_name":"Osaka Gakuin University","ror":"https://ror.org/04a8t1e98","country_code":"JP","type":"education","lineage":["https://openalex.org/I11381156"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kinoshita","raw_affiliation_strings":["Faculty of Informatics, Osaka Gakuin University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Informatics, Osaka Gakuin University, Suita, Japan","institution_ids":["https://openalex.org/I11381156"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":16.5057,"has_fulltext":false,"cited_by_count":127,"citation_normalized_percentile":{"value":0.99481233,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1019","last_page":"1028"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8868640661239624},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7823586463928223},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6901140213012695},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5992918610572815},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5777638554573059},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5385585427284241},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.5318863987922668},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.48786354064941406},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4737181067466736},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4653860628604889},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.463023841381073},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.37757742404937744},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.289529025554657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25684618949890137},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1707436442375183}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8868640661239624},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7823586463928223},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6901140213012695},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5992918610572815},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5777638554573059},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5385585427284241},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.5318863987922668},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.48786354064941406},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4737181067466736},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4653860628604889},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.463023841381073},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.37757742404937744},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.289529025554657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25684618949890137},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1707436442375183},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/test.2005.1584068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349210","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6389","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Conference on Test, 2005","raw_type":"journal article"},{"id":"pmh:oai:kyutech.repo.nii.ac.jp:00006389","is_oa":false,"landing_page_url":"http://hdl.handle.net/10228/00007599","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"AM"}],"best_oa_location":{"id":"pmh:oai:irdb.nii.ac.jp:01216:0004349210","is_oa":true,"landing_page_url":"https://kyutech.repo.nii.ac.jp/records/6389","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Conference on Test, 2005","raw_type":"journal article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1491971472","https://openalex.org/W1496730449","https://openalex.org/W1568407911","https://openalex.org/W1612128692","https://openalex.org/W1820769975","https://openalex.org/W1900996732","https://openalex.org/W1914799182","https://openalex.org/W1915857416","https://openalex.org/W1978040115","https://openalex.org/W2001352955","https://openalex.org/W2102127226","https://openalex.org/W2106303764","https://openalex.org/W2108103162","https://openalex.org/W2110232289","https://openalex.org/W2119691242","https://openalex.org/W2120246395","https://openalex.org/W2125734620","https://openalex.org/W2126641963","https://openalex.org/W2132829258","https://openalex.org/W2132881562","https://openalex.org/W2139234345","https://openalex.org/W2150448461","https://openalex.org/W2152321821","https://openalex.org/W2154606883","https://openalex.org/W2160621850","https://openalex.org/W2169839635","https://openalex.org/W2582644749","https://openalex.org/W2888824071","https://openalex.org/W4230433944","https://openalex.org/W4249564707","https://openalex.org/W4254056430","https://openalex.org/W6639759450","https://openalex.org/W6678945918"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W2789883751","https://openalex.org/W2543176856","https://openalex.org/W2075356617","https://openalex.org/W2408214455","https://openalex.org/W2019719714","https://openalex.org/W2364150359","https://openalex.org/W3088373974","https://openalex.org/W2156546262","https://openalex.org/W2624668974"],"abstract_inverted_index":{"Scan-based":[0],"at-speed":[1,123],"testing":[2,124],"is":[3,20,47],"a":[4,44,56,71],"key":[5],"technology":[6],"to":[7,34,66,97],"guarantee":[8],"timing-related":[9],"test":[10,45,72,94,130],"quality":[11],"in":[12,70,84],"the":[13,80,119,127],"deep":[14],"submicron":[15],"era.":[16],"However,":[17],"its":[18],"applicability":[19,120],"being":[21],"severely":[22],"challenged":[23],"since":[24],"significant":[25],"yield":[26,131],"loss":[27],"may":[28],"occur":[29],"from":[30],"circuit":[31,81],"malfunction":[32],"due":[33],"excessive":[35],"IR":[36],"drop":[37],"caused":[38],"by":[39,125],"high":[40],"power":[41,100],"dissipation":[42],"when":[43],"response":[46],"captured.":[48],"This":[49,77],"paper":[50],"addresses":[51],"this":[52,114],"critical":[53],"problem":[54],"with":[55,113],"novel":[57],"low-capture-power":[58],"X-filling":[59],"method":[60,78,116],"of":[61,121,129],"assigning":[62],"0's":[63],"and":[64,87],"1's":[65],"unspecified":[67],"(X)":[68],"bits":[69],"cube":[73],"obtained":[74],"during":[75],"ATPG.":[76],"reduces":[79],"switching":[82],"activity":[83],"capture":[85,99],"mode":[86],"can":[88],"be":[89],"easily":[90],"incorporated":[91],"into":[92],"any":[93,103],"generation":[95],"flow":[96],"achieve":[98],"reduction":[101],"without":[102],"area,":[104],"timing,":[105],"or":[106],"fault":[107],"coverage":[108],"impact.":[109],"Test":[110],"vectors":[111],"generated":[112],"practical":[115],"greatly":[117],"improve":[118],"scan-based":[122],"reducing":[126],"risk":[128],"loss.":[132]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}