{"id":"https://openalex.org/W2135743693","doi":"https://doi.org/10.1109/test.2005.1584042","title":"Remote boundary-scan system test control for the atca standard","display_name":"Remote boundary-scan system test control for the atca standard","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2135743693","doi":"https://doi.org/10.1109/test.2005.1584042","mag":"2135743693"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1584042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584042","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079406231","display_name":"David B\u00e4ckstr\u00f6m","orcid":null},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"D. Backstrom","raw_affiliation_strings":["Embedded Systems Laboratory, Link\u00f6ping Universitet, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Embedded Systems Laboratory, Link\u00f6ping Universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101780634","display_name":"Gunnar Carlsson","orcid":"https://orcid.org/0000-0002-0591-5475"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Carlsson","raw_affiliation_strings":["Digital Processing Platform, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Digital Processing Platform, Sweden","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005848285","display_name":"Erik Larsson","orcid":"https://orcid.org/0000-0001-6672-0279"},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"E. Larsson","raw_affiliation_strings":["Embedded Systems Laboratory, Link\u00f6ping Universitet, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Embedded Systems Laboratory, Link\u00f6ping Universitet, Sweden","institution_ids":["https://openalex.org/I102134673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4229,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.8195504,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"788","last_page":"797"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/backplane","display_name":"Backplane","score":0.9346180558204651},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.9129501581192017},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.6994605660438538},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6497166752815247},{"id":"https://openalex.org/keywords/protocol","display_name":"Protocol (science)","score":0.6372455358505249},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.539160966873169},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48665767908096313},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.43594491481781006},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4328177869319916},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4237288236618042},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.41035956144332886},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.23469945788383484},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20876464247703552},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1265236735343933},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.09200489521026611}],"concepts":[{"id":"https://openalex.org/C134256836","wikidata":"https://www.wikidata.org/wiki/Q545913","display_name":"Backplane","level":2,"score":0.9346180558204651},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.9129501581192017},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.6994605660438538},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6497166752815247},{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.6372455358505249},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.539160966873169},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48665767908096313},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.43594491481781006},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4328177869319916},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4237288236618042},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.41035956144332886},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.23469945788383484},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20876464247703552},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1265236735343933},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.09200489521026611},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2005.1584042","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1584042","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},{"id":"pmh:oai:lup.lub.lu.se:f4449773-4c17-4ecb-858c-69c3ae1e0d0e","is_oa":false,"landing_page_url":"https://lup.lub.lu.se/record/2341051","pdf_url":null,"source":{"id":"https://openalex.org/S4306400536","display_name":"Lund University Publications (Lund University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I187531555","host_organization_name":"Lund University","host_organization_lineage":["https://openalex.org/I187531555"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"contributiontobookanthology/conference"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1502837022","https://openalex.org/W1580093467","https://openalex.org/W1593181095","https://openalex.org/W1888065395","https://openalex.org/W2143547088","https://openalex.org/W4234645973","https://openalex.org/W4238468115","https://openalex.org/W6681110205"],"related_works":["https://openalex.org/W1748066428","https://openalex.org/W2135743693","https://openalex.org/W2108518148","https://openalex.org/W2145891343","https://openalex.org/W2110406241","https://openalex.org/W2161963576","https://openalex.org/W2156162151","https://openalex.org/W2109999133","https://openalex.org/W2901272500","https://openalex.org/W2162797755"],"abstract_inverted_index":{"The":[0,23],"backplane":[1,14],"in":[2],"a":[3,7,83,92,120],"multi-board":[4],"system":[5],"has":[6],"limited":[8],"wiring":[9,16],"capability,":[10],"which":[11],"makes":[12],"additional":[13],"boundary-scan":[15,29,34,109],"to":[17,26,103],"link":[18],"the":[19,28,33,37,49,60,68,101,105,114],"boards":[20,31,102],"highly":[21],"costly.":[22],"problem":[24],"is":[25],"access":[27],"tested":[30],"with":[32,85],"controller":[35],"at":[36],"central":[38],"board.":[39],"In":[40],"this":[41],"paper":[42],"we":[43,56,117],"propose":[44],"an":[45],"approach":[46,116],"suitable":[47],"for":[48,75,96],"advanced":[50],"telecom":[51],"computing":[52],"architecture":[53],"standard":[54],"where":[55],"make":[57],"use":[58],"of":[59,77,108,113],"existing":[61],"I":[62],"<sup":[63],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[64],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[65],"C-bus":[66],"and":[67,87],"intelligent":[69],"platform":[70],"management":[71],"bus":[72],"(IPMB)":[73],"protocol":[74,84],"application":[76],"operational":[78],"tests.":[79,110],"We":[80],"have":[81,118],"defined":[82],"commands":[86],"responses":[88],"as":[89,91],"well":[90],"test":[93,98],"data":[94,99],"format":[95],"storing":[97],"on":[100],"support":[104],"remote":[106],"execution":[107],"For":[111],"validation":[112],"proposed":[115],"developed":[119],"demonstrator":[121]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}