{"id":"https://openalex.org/W2162570610","doi":"https://doi.org/10.1109/test.2005.1583998","title":"Diagnosis with convolutional compactors in presence of unknown states","display_name":"Diagnosis with convolutional compactors in presence of unknown states","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2162570610","doi":"https://doi.org/10.1109/test.2005.1583998","mag":"2162570610"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1583998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046691899","display_name":"Grzegorz Mrugalski","orcid":"https://orcid.org/0000-0001-9378-127X"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Mrugalski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004438248","display_name":"Artur Pogiel","orcid":"https://orcid.org/0000-0001-5271-1566"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"A. Pogiel","raw_affiliation_strings":["Pozna\u0144 University of Technology, Poznan, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pozna\u0144 University of Technology, Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Rajski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Tyszer","raw_affiliation_strings":["Pozna\u0144 University of Technology, Poznan, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pozna\u0144 University of Technology, Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"18","issue":null,"first_page":"395","last_page":"404"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9793999791145325,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6448997855186462},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5737327337265015},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5272428393363953}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6448997855186462},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5737327337265015},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5272428393363953},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1583998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583998","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W42070592","https://openalex.org/W1576951655","https://openalex.org/W1590110141","https://openalex.org/W1592824829","https://openalex.org/W1601643892","https://openalex.org/W1604385461","https://openalex.org/W1844723944","https://openalex.org/W2019631303","https://openalex.org/W2021463588","https://openalex.org/W2086496477","https://openalex.org/W2099894831","https://openalex.org/W2100891789","https://openalex.org/W2101170160","https://openalex.org/W2101900253","https://openalex.org/W2102163510","https://openalex.org/W2110731889","https://openalex.org/W2116598791","https://openalex.org/W2120483435","https://openalex.org/W2123072391","https://openalex.org/W2123182964","https://openalex.org/W2139664386","https://openalex.org/W2148647728","https://openalex.org/W2153336129","https://openalex.org/W2155038322","https://openalex.org/W2155086537","https://openalex.org/W2155829270","https://openalex.org/W2165030600","https://openalex.org/W2169280266","https://openalex.org/W2169823470","https://openalex.org/W2171837466","https://openalex.org/W2344062144","https://openalex.org/W4233616805","https://openalex.org/W4246650320","https://openalex.org/W6601674458"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"The":[0],"paper":[1],"presents":[2],"non-adaptive":[3],"fault":[4],"diagnosis":[5],"techniques":[6],"for":[7],"scan-based":[8],"designs.":[9],"These":[10],"schemes":[11],"guarantee":[12],"accurate":[13],"and":[14],"time-efficient":[15],"identification":[16],"of":[17,24,33],"failing":[18],"scan":[19],"cells":[20],"based":[21],"on":[22],"results":[23],"a":[25],"convolutional":[26],"test":[27],"response":[28],"compaction":[29],"in":[30],"the":[31],"presence":[32],"unknown":[34],"states":[35]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}