{"id":"https://openalex.org/W2095751068","doi":"https://doi.org/10.1109/test.2005.1583988","title":"Variance Reduction and Outliers: Statistical Analysis of Semiconductor Test Data","display_name":"Variance Reduction and Outliers: Statistical Analysis of Semiconductor Test Data","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2095751068","doi":"https://doi.org/10.1109/test.2005.1583988","mag":"2095751068"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1583988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001994622","display_name":"W.R. Daasch","orcid":null},"institutions":[{"id":"https://openalex.org/I126345244","display_name":"Portland State University","ror":"https://ror.org/00yn2fy02","country_code":"US","type":"education","lineage":["https://openalex.org/I126345244"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.R. Daasch","raw_affiliation_strings":["IC Design & Test Laboratory, Electrical and Computer Engineering, Portland State University, Portland, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IC Design & Test Laboratory, Electrical and Computer Engineering, Portland State University, Portland, OR, USA","institution_ids":["https://openalex.org/I126345244"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040957547","display_name":"R. Madge","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Madge","raw_affiliation_strings":["LSI Logic Corporation, Gresham, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LSI Logic Corporation, Gresham, OR, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":null,"first_page":"304","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.72847580909729},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.6245864629745483},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6033166646957397},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5537932515144348},{"id":"https://openalex.org/keywords/variance-reduction","display_name":"Variance reduction","score":0.5439898371696472},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.541562020778656},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5211648941040039},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.48929092288017273},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.45528823137283325},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.4148900508880615},{"id":"https://openalex.org/keywords/analysis-of-variance","display_name":"Analysis of variance","score":0.41058778762817383},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.32171863317489624},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.08368808031082153}],"concepts":[{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.72847580909729},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.6245864629745483},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6033166646957397},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5537932515144348},{"id":"https://openalex.org/C62644790","wikidata":"https://www.wikidata.org/wiki/Q3454689","display_name":"Variance reduction","level":3,"score":0.5439898371696472},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.541562020778656},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5211648941040039},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.48929092288017273},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.45528823137283325},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.4148900508880615},{"id":"https://openalex.org/C99476002","wikidata":"https://www.wikidata.org/wiki/Q42297","display_name":"Analysis of variance","level":2,"score":0.41058778762817383},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32171863317489624},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.08368808031082153},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1583988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1538850614","https://openalex.org/W1595285623","https://openalex.org/W1637395447","https://openalex.org/W1704018133","https://openalex.org/W1831804257","https://openalex.org/W1913711070","https://openalex.org/W2098171066","https://openalex.org/W2099807755","https://openalex.org/W2100108106","https://openalex.org/W2115908547","https://openalex.org/W2120440457","https://openalex.org/W2130404536","https://openalex.org/W2137926373","https://openalex.org/W2147198689","https://openalex.org/W2151244242","https://openalex.org/W2151328155","https://openalex.org/W2161197076","https://openalex.org/W2167138208","https://openalex.org/W2168209902","https://openalex.org/W2542635574"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2111181341","https://openalex.org/W2886060011","https://openalex.org/W2510582230","https://openalex.org/W2978674666","https://openalex.org/W2074430941","https://openalex.org/W363903320","https://openalex.org/W2113096305"],"abstract_inverted_index":{"This":[0],"is":[1,27,69,87,113],"the":[2,8,17,31,41,50,62,76,80,83,91,101,106,119],"first":[3],"of":[4,11,24,33,40,52,75,85,90,105,121],"three":[5],"papers":[6],"on":[7,49],"statistical":[9,43,67],"analysis":[10,44],"deep-submicron":[12],"semiconductor":[13],"test":[14,77],"data":[15,53],"for":[16,65],"ITC":[18],"2005":[19],"Lecture":[20],"Series.":[21],"The":[22],"subject":[23],"this":[25],"paper":[26],"variance":[28,34,60,120],"reduction":[29,35],"and":[30,97,103],"importance":[32],"in":[36,118,131],"outlier":[37,132],"screening.":[38],"Most":[39],"test-data":[42],"methods":[45],"discussed":[46],"are":[47],"based":[48],"concept":[51],"driven":[54],"model":[55],"building.":[56],"To":[57],"obtain":[58],"significant":[59,116],"reduction,":[61],"common":[63],"approach":[64],"these":[66],"models":[68],"to":[70],"evaluate":[71],"a":[72,110,128],"die-by-die":[73],"estimate":[74],"response,":[78],"under":[79],"assumption":[81],"that":[82,115],"die":[84],"interest":[86],"defect-free.":[88],"Models":[89],"wafer":[92],"spatial":[93],"patterns,":[94],"single":[95],"parameter":[96],"multi-parameter":[98],"regressions":[99],"demonstrate":[100],"variety":[102],"potential":[104],"concept.":[107],"Within":[108],"such":[109],"framework,":[111],"it":[112],"shown":[114],"reductions":[117],"parametric":[122],"distributions":[123],"can":[124],"be":[125],"obtained":[126],"with":[127],"corresponding":[129],"improvement":[130],"detection":[133]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}