{"id":"https://openalex.org/W2118542338","doi":"https://doi.org/10.1109/test.2005.1583956","title":"A structured approach for the systematic test of embedded automotive communication systems","display_name":"A structured approach for the systematic test of embedded automotive communication systems","publication_year":2006,"publication_date":"2006-02-06","ids":{"openalex":"https://openalex.org/W2118542338","doi":"https://doi.org/10.1109/test.2005.1583956","mag":"2118542338"},"language":"en","primary_location":{"id":"doi:10.1109/test.2005.1583956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073112793","display_name":"Eric Armengaud","orcid":"https://orcid.org/0000-0003-4958-7562"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"E. Armengaud","raw_affiliation_strings":["ECS Group E182-2, University of Technology, Vienna, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"ECS Group E182-2, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019322024","display_name":"F. Rothensteiner","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"F. Rothensteiner","raw_affiliation_strings":["ECS Group E182-2, University of Technology, Vienna, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"ECS Group E182-2, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006749662","display_name":"Andreas Steininger","orcid":"https://orcid.org/0000-0002-3847-1647"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"A. Steininger","raw_affiliation_strings":["ECS Group E182-2, University of Technology, Vienna, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"ECS Group E182-2, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021949251","display_name":"Roman Pallierer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Pallierer","raw_affiliation_strings":["DECOMSYS GmbH, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"DECOMSYS GmbH, Vienna, Austria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028034207","display_name":"Martin Horauer","orcid":"https://orcid.org/0000-0001-6835-0662"},"institutions":[{"id":"https://openalex.org/I121760703","display_name":"University of Applied Sciences Technikum Wien","ror":"https://ror.org/04jsx0x49","country_code":"AT","type":"education","lineage":["https://openalex.org/I121760703"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Horauer","raw_affiliation_strings":["University of Applied Science Technikum Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"University of Applied Science Technikum Wien, Vienna, Austria","institution_ids":["https://openalex.org/I121760703"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030208136","display_name":"Martin Zauner","orcid":null},"institutions":[{"id":"https://openalex.org/I121760703","display_name":"University of Applied Sciences Technikum Wien","ror":"https://ror.org/04jsx0x49","country_code":"AT","type":"education","lineage":["https://openalex.org/I121760703"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Zauner","raw_affiliation_strings":["University of Applied Science Technikum Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"University of Applied Science Technikum Wien, Vienna, Austria","institution_ids":["https://openalex.org/I121760703"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5073112793"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":3.9023,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.93560004,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8150475025177002},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.6307910680770874},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5638036727905273},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.5069766044616699},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.48479026556015015},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.47293949127197266},{"id":"https://openalex.org/keywords/communications-system","display_name":"Communications system","score":0.4728905260562897},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.46863508224487305},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.45777225494384766},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4204971194267273},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3540172874927521},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3465402126312256},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33943814039230347},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.18560805916786194},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.16054674983024597},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08927363157272339}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8150475025177002},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.6307910680770874},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5638036727905273},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.5069766044616699},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.48479026556015015},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47293949127197266},{"id":"https://openalex.org/C101765175","wikidata":"https://www.wikidata.org/wiki/Q577764","display_name":"Communications system","level":2,"score":0.4728905260562897},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.46863508224487305},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.45777225494384766},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4204971194267273},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3540172874927521},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3465402126312256},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33943814039230347},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.18560805916786194},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.16054674983024597},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08927363157272339},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2005.1583956","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2005.1583956","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Test, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1515082873","https://openalex.org/W1574923455","https://openalex.org/W1717406413","https://openalex.org/W1838389500","https://openalex.org/W1846991674","https://openalex.org/W1852884552","https://openalex.org/W1944992649","https://openalex.org/W2095689429","https://openalex.org/W2117172651","https://openalex.org/W2120860555","https://openalex.org/W2138381338","https://openalex.org/W2142689011","https://openalex.org/W2164055623","https://openalex.org/W6637649232","https://openalex.org/W6680653849"],"related_works":["https://openalex.org/W4382644535","https://openalex.org/W2132658806","https://openalex.org/W2758348730","https://openalex.org/W3210666397","https://openalex.org/W2350662357","https://openalex.org/W2160915513","https://openalex.org/W3036272329","https://openalex.org/W2378051443","https://openalex.org/W2769711664","https://openalex.org/W2885986920"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,11],"systematic":[3],"test":[4],"strategy":[5],"for":[6],"the":[7],"communication":[8],"subsystem":[9],"of":[10,28],"distributed":[12],"automotive":[13],"system.":[14],"Key":[15],"points":[16],"are":[17],"(1)":[18],"system":[19],"decomposition":[20],"into":[21],"layers":[22],"and":[23,25,31],"services":[24],"(2)":[26],"integration":[27],"fault":[29],"injection":[30],"monitoring":[32],"within":[33],"this":[34],"framework":[35]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}