{"id":"https://openalex.org/W2126306168","doi":"https://doi.org/10.1109/test.2004.1387448","title":"Global failure localization: we have to, but on what and how?","display_name":"Global failure localization: we have to, but on what and how?","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2126306168","doi":"https://doi.org/10.1109/test.2004.1387448","mag":"2126306168"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108459063","display_name":"Edward I. Cole","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]},{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"E.I. Cole","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, USA","Sandia National Lab, Albuquerque, NM (USA)"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, USA","institution_ids":["https://openalex.org/I4210104735"]},{"raw_affiliation_string":"Sandia National Lab, Albuquerque, NM (USA)","institution_ids":["https://openalex.org/I192454743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5108459063"],"corresponding_institution_ids":["https://openalex.org/I192454743","https://openalex.org/I4210104735"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.18932388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1440","last_page":"1440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5593608021736145},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.5526075959205627},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4873114824295044},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.41834157705307007},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.4109843671321869},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3057030141353607},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19070753455162048},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.16879791021347046},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10542187094688416}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5593608021736145},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.5526075959205627},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4873114824295044},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.41834157705307007},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.4109843671321869},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3057030141353607},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19070753455162048},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.16879791021347046},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10542187094688416},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1580824002","https://openalex.org/W4234217119"],"related_works":["https://openalex.org/W2075768550","https://openalex.org/W3022218857","https://openalex.org/W2369178846","https://openalex.org/W2370289839","https://openalex.org/W2082716031","https://openalex.org/W2933494595","https://openalex.org/W4313347705","https://openalex.org/W1568049691","https://openalex.org/W1590096425","https://openalex.org/W2581850242"],"abstract_inverted_index":{"Failure":[0],"analysis":[1],"(FA)":[2],"is":[3],"important":[4],"in":[5,27],"knowing":[6],"exactly":[7],"what's":[8],"wrong":[9],"with":[10,78],"the":[11,28],"ICs":[12],"and":[13,30,41,58,70,75],"what":[14],"customers":[15],"demand":[16],"to":[17,24,32,38,88],"know":[18],"why.":[19],"This":[20],"work":[21],"discusses":[22],"how":[23,85],"do":[25],"FA":[26,56,71],"future,":[29],"where":[31],"perform":[33],"this":[34,82],"analysis.":[35],"The":[36],"need":[37],"examine":[39],"transistors":[40],"interconnects":[42],"from":[43],"an":[44],"IC's":[45],"backside":[46],"has":[47],"enabled":[48],"a":[49],"natural":[50],"extension":[51],"of":[52,60,66],"front":[53],"side":[54],"optical":[55],"techniques":[57],"development":[59],"new":[61,79],"tools":[62],"provide":[63],"improved":[64],"detection":[65],"diffusion":[67],"defects.":[68],"Diagnosis":[69],"must":[72],"be":[73],"considered":[74],"developed":[76],"concurrently":[77],"technologies.":[80],"And":[81],"really":[83],"answers":[84],"we'll":[86],"get":[87],"future":[89],"FA.":[90]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}