{"id":"https://openalex.org/W1582844663","doi":"https://doi.org/10.1109/test.2004.1387442","title":"Loopback or not? (loopback testing)","display_name":"Loopback or not? (loopback testing)","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W1582844663","doi":"https://doi.org/10.1109/test.2004.1387442","mag":"1582844663"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387442","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"T.J. Yamaguchi","raw_affiliation_strings":["Advantest Laboratories Limited, Sendai, Miyagi, Japan","Advantest Lab. Ltd., Miyagi, Japan"],"affiliations":[{"raw_affiliation_string":"Advantest Laboratories Limited, Sendai, Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Lab. Ltd., Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5010763159"],"corresponding_institution_ids":["https://openalex.org/I4210103901"],"apc_list":null,"apc_paid":null,"fwci":0.7734,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.72661565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1434","last_page":"1434"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9204844236373901},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6689005494117737},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.5450232028961182},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5042182207107544},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5031847357749939},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3568609058856964},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1926334798336029},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09530803561210632}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9204844236373901},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6689005494117737},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.5450232028961182},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5042182207107544},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5031847357749939},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3568609058856964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1926334798336029},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09530803561210632},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387442","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W1933111953"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2058044441"],"abstract_inverted_index":{"For":[0,38],"the":[1,15,28,54,64],"verification":[2],"of":[3,57],"high-speed":[4],"serial":[5],"I/O":[6],"devices,":[7],"a":[8,33,41,50],"new":[9],"architecture,":[10],"which":[11],"is":[12,47,60],"different":[13],"from":[14,32],"conventional":[16,65],"ET":[17],"sampling":[18],"method,":[19],"must":[20],"be":[21],"developed":[22],"to":[23,48,52],"measure":[24],"ultra-wideband":[25],"jitter":[26,55],"in":[27,40],"bit":[29],"stream":[30],"transmitted":[31],"multi-Gb/s":[34],"physical":[35],"layer":[36],"IC.":[37],"testing":[39],"high-volume":[42],"test":[43,53],"environment,":[44],"our":[45],"challenge":[46],"find":[49],"way":[51],"tolerance":[56],"Rx":[58],"that":[59],"more":[61],"effective":[62],"than":[63],"loopback":[66],"test.":[67]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}