{"id":"https://openalex.org/W2110864076","doi":"https://doi.org/10.1109/test.2004.1387441","title":"Is \"design to production\" the ultimate answer for jitter, noise, and BER challenges for multi GB/s ICs?","display_name":"Is \"design to production\" the ultimate answer for jitter, noise, and BER challenges for multi GB/s ICs?","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2110864076","doi":"https://doi.org/10.1109/test.2004.1387441","mag":"2110864076"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387441","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067563929","display_name":"M. Li","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"M. Li","raw_affiliation_strings":["Wavecrest, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Wavecrest, San Jose, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5067563929"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17346939,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1433","last_page":"1433"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9650999903678894,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9614788293838501},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6623600125312805},{"id":"https://openalex.org/keywords/argument","display_name":"Argument (complex analysis)","score":0.6526903510093689},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5428628325462341},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5279729962348938},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4544811546802521},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3526468873023987},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3263028860092163},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30283790826797485},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.24473527073860168},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16634291410446167},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.07319781184196472}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9614788293838501},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6623600125312805},{"id":"https://openalex.org/C98184364","wikidata":"https://www.wikidata.org/wiki/Q1780131","display_name":"Argument (complex analysis)","level":2,"score":0.6526903510093689},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5428628325462341},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5279729962348938},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4544811546802521},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3526468873023987},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3263028860092163},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30283790826797485},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.24473527073860168},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16634291410446167},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.07319781184196472},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387441","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387441","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2058044441"],"abstract_inverted_index":{"In":[0],"ITC":[1],"2003,":[2],"a":[3],"panel":[4,46,70],"entitled":[5],"\"Multi-GB/s":[6],"IC":[7,20],"Test":[8],"Challenges":[9],"and":[10,25,28,32,37,62,64,84,107,131],"Solutions\"":[11],"was":[12,40,71],"successfully":[13],"conducted":[14],"with":[15],"the":[16,41,45,48,69,78,110,125],"panelists":[17],"came":[18],"from":[19],"manufacture,":[21],"test":[22,51,96],"&":[23],"measurement,":[24],"ATE":[26],"industries":[27],"academies.":[29],"Outstanding":[30],"questions":[31],"possible":[33,121],"solutions":[34],"were":[35],"discussed":[36],"debated.":[38],"It":[39],"general":[42],"view":[43],"of":[44,80,114],"that":[47,118],"most":[49],"important":[50],"requirements":[52],"for":[53],"multiple":[54],"Gb/s":[55],"ICs":[56],"are":[57,66],"timing":[58],"jitter,":[59,82],"amplitude":[60],"noise,":[61],"BER":[63,85],"they":[65],"interrelated.":[67],"However,":[68],"divided":[72],"by":[73],"two":[74],"distinct":[75],"views":[76],"on":[77,105],"issue":[79],"whether":[81],"noise":[83],"(JNB)":[86],"should":[87],"be":[88],"tested":[89],"in":[90,97,112,128],"production.":[91],"The":[92],"argument":[93,111],"against":[94],"JNB":[95,126],"high":[98],"volume":[99],"manufacture":[100],"(HVM)":[101],"is":[102,117],"primary":[103],"based":[104],"costs":[106],"economics;":[108],"while":[109],"favor":[113],"HVM":[115],"jitter":[116],"it":[119],"not":[120],"to":[122,134],"completely":[123],"bound":[124],"problem":[127],"design":[129],"characterization":[130],"verification":[132],"due":[133],"its":[135],"statistical":[136],"nature.":[137]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}