{"id":"https://openalex.org/W1574375087","doi":"https://doi.org/10.1109/test.2004.1387433","title":"To test or to inspect, what is the coverage?","display_name":"To test or to inspect, what is the coverage?","publication_year":2005,"publication_date":"2005-03-07","ids":{"openalex":"https://openalex.org/W1574375087","doi":"https://doi.org/10.1109/test.2004.1387433","mag":"1574375087"},"language":"en","primary_location":{"id":"doi:10.1109/test.2004.1387433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061548998","display_name":"Rob Jukna","orcid":null},"institutions":[{"id":"https://openalex.org/I859629181","display_name":"Jabil (United States)","ror":"https://ror.org/02snjxm78","country_code":"US","type":"company","lineage":["https://openalex.org/I859629181"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R. Jukna","raw_affiliation_strings":["Advanced Manufacturing Technology, Jabil Circuit Inc","Jabil Circuit Inc.- Advanced Manufacturing Technology#TAB#"],"affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Technology, Jabil Circuit Inc","institution_ids":[]},{"raw_affiliation_string":"Jabil Circuit Inc.- Advanced Manufacturing Technology#TAB#","institution_ids":["https://openalex.org/I859629181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5061548998"],"corresponding_institution_ids":["https://openalex.org/I859629181"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06728316,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1425","last_page":"1425"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9793999791145325,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7804601192474365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.608150064945221},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5912570357322693},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5790677666664124},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.5028695464134216},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.5007739067077637},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4867362976074219},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.44341376423835754},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.44122952222824097},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3115234076976776},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15811669826507568},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.14253166317939758},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09802919626235962},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0856185257434845},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.06529214978218079}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7804601192474365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.608150064945221},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5912570357322693},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5790677666664124},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.5028695464134216},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.5007739067077637},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4867362976074219},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.44341376423835754},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.44122952222824097},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3115234076976776},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15811669826507568},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.14253166317939758},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09802919626235962},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0856185257434845},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.06529214978218079},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2004.1387433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2004.1387433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conferce on Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2143294572","https://openalex.org/W1863819993","https://openalex.org/W128516171","https://openalex.org/W2535245920","https://openalex.org/W2144004661","https://openalex.org/W2614595036","https://openalex.org/W4250651147","https://openalex.org/W4231859554","https://openalex.org/W2057433396","https://openalex.org/W4252286421"],"abstract_inverted_index":{"As":[0],"a":[1,12,16,69],"test":[2,35,48,66,71,92],"engineering":[3],"community":[4],"we":[5,63,81,85],"have":[6,26,38],"been":[7,39],"fighting":[8],"to":[9,14,19,41],"standardize":[10],"on":[11],"method":[13],"provide":[15],"realistic":[17],"means":[18],"calculate":[20,65,87],"board":[21],"coverage":[22,67,89],"at":[23,53],"test.":[24],"We":[25],"made":[27],"progress":[28],"with":[29],"certain":[30],"equipment":[31,79],"types":[32],"like":[33],"in-circuit":[34],"(ICT),":[36],"but":[37,84],"unsuccessful":[40],"date":[42],"encompassing":[43],"the":[44,55,75,78],"full":[45,56],"spectrum":[46],"of":[47,77],"and":[49],"even":[50],"less":[51],"successful":[52],"accommodating":[54],"manufacturing":[57],"process.":[58],"Bottom":[59],"line":[60],"is":[61],"that":[62,80],"can":[64],"for":[68,90],"single":[70],"process":[72],"based":[73],"upon":[74],"capability":[76],"are":[82],"using,":[83],"can't":[86],"defect":[88],"all":[91],"processes.":[93]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}